US5691649A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Carrier having slide connectors for testing unpackaged semiconductor dice
Assignee: Micron Technology Inc
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Filing: 1996-01-12
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Granted: 1997-11-25
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Expires: 2016-01-12
Abstract
Abstract A carrier for testing an unpackaged semiconductor die is provided. The carrier comprises a base for holding the die, an interconnect for establishing a temporary electrical connection with the die, and a force applying mechanism for biasing the die and interconnect together. The base includes external contacts arranged as flat metal pads in a dense grid array and electrically connected to a pattern of contact pads. The carrier also includes a pair of slide connector members which provide an electrical path between the contact pads on the base and corresponding contact pads on the interconnect. The slide connector members can be formed of molded plastic or ceramic and include tine contacts that slidably engage the contact pads on the interconnect and base. The slide connector members permit the interconnect to be easily replaced for testing of different types of dice.
Inventors
- 👤 Warren M. Farnworth
- 👤 Salman Akram
- 👤 Mike Brooks
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 09:36
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/04; G01R1/0408; G01R1/0433; G01R1/0441; G01R1/0466; G01R1/0483; G01R31/00; G01R31/28; G01R31/2851; G01R31/2893; H; H05; H05K; H05K3/00; H05K3/40; H05K3/4007; H10; H10P; H10P72/00; H10P72/70; H10P72/74; H10P74/00; H10P74/23; H10W; H10W70/00; H10W70/60; H10W70/62; H10W70/65; H10W70/67; H10W70/68; H10W90/00; H10W90/701; H10W99/00; G01R3/00; G01R31/2855; G01R31/286; G01R31/2863; H05K2201/00; H05K2201/01; H05K2201/0104; H05K2201/0133; H05K2201/03; H05K2201/0332; H05K2201/0335; H05K2201/0347; H05K2201/0364; H05K2201/0367; H05K2201/0388; H05K2201/0394; H05K2201/09; H05K2201/09209; H05K2201/09372; H05K2201/09481; H05K2201/095; H05K2201/09563; H05K2203/00; H05K2203/03; H05K2203/0307; H05K2203/07; H05K2203/0703; H05K2203/0723; H05K3/0058; H05K3/0067; H05K3/42; H05K3/423; H10W70/654; H10W70/655; H10W70/681; H10W72/00; H10W72/071; H10W72/075; H10W72/07502; H10W72/07504; H10W72/07551; H10W72/50; H10W72/551; H10W72/552; H10W74/00; H10W90/20; H10W90/24; H10W90/721; H10W90/722
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
143 words
An apparatus for testing unpackaged semiconductor dice comprising: a base for retaining a semiconductor die; an array of external contacts formed on the base, said external contacts in electrical communication with a first set of contact pads on the base; an interconnect mountable to the base, said interconnect including contact members for electrically contacting contact locations on the die, said contact members in electrical communication with a second set of contact pads on the interconnect; a connector member attachable to the base said connector member comprising a plurality of tine contacts, each of said tine contacts including a first portion for electrically contacting a contact pad of the first set, and a second portion for electrically contacting a contact pad of the second set; and a second interconnect interchangeable with the interconnect for electrically contacting a second semiconductor die retained on the base.
Claim 2
Independent Claim
143 words
An apparatus for testing unpackaged semiconductor dice comprising: a base for retaining a semiconductor die; an array of external contacts formed on the base, said external contacts in electrical communication with a first set of contact pads on the base; an interconnect mountable to the base, said interconnect including contact members for electrically contacting contact locations on the die, said contact members in electrical communication with a second set of contact pads on the interconnect; a connector member attachable to the base said connector member comprising a plurality of tine contacts, each of said tine contacts including a first portion for electrically contacting a contact pad of the first set, and a second portion for electrically contacting a contact pad of the second set; and a second interconnect interchangeable with the interconnect for electrically contacting a second semiconductor die retained on the base.
Claim 3
Dependent Claim
25 words
The apparatus as claimed in claim 1 wherein the connector member comprises molded plastic and the tine contacts comprise metal wires embedded in the plastic.
Claim 4
Dependent Claim
27 words
The apparatus as claimed in claim 1 wherein the base includes a rail and the connector member includes a groove configured for mating engagement with the rail.
Claim 5
Dependent Claim
22 words
The apparatus as claimed in claim 1 wherein the first portion and the second portion of each tine contact comprise spring segments.
Claim 6
Dependent Claim
18 words
The apparatus as claimed in claim 1 wherein the array of external contacts comprises a dense grid array.
Claim 7
Independent Claim
189 words
An apparatus for testing unpackaged semiconductor dice comprising: a base; an array of external contacts formed on the base in electrical communication with a pattern of contact pads on the base; a first interconnect mountable to the base, said first interconnect comprising first contact members configured to electrically engage contact locations on a first die held on the base, said first interconnect further comprising a first set of contact pads in electrical communication with the first contact members; a second interconnect mountable to the base, said second interconnect comprising second contact members configured to electrically engage second contact locations on a second die held on the base, said second interconnect further comprising a second set of contact pads in electrical communication with the second contact members; a connector member attachable to the base, said connector member including a plurality of tine contacts configured to electrically contact the pattern of contact pads on the base, and to electrically contact the first set of contact pads on the first interconnect for testing the first die, or the second set of contact pads on the second interconnect for testing the second die.
Claim 8
Independent Claim
189 words
An apparatus for testing unpackaged semiconductor dice comprising: a base; an array of external contacts formed on the base in electrical communication with a pattern of contact pads on the base; a first interconnect mountable to the base, said first interconnect comprising first contact members configured to electrically engage contact locations on a first die held on the base, said first interconnect further comprising a first set of contact pads in electrical communication with the first contact members; a second interconnect mountable to the base, said second interconnect comprising second contact members configured to electrically engage second contact locations on a second die held on the base, said second interconnect further comprising a second set of contact pads in electrical communication with the second contact members; a connector member attachable to the base, said connector member including a plurality of tine contacts configured to electrically contact the pattern of contact pads on the base, and to electrically contact the first set of contact pads on the first interconnect for testing the first die, or the second set of contact pads on the second interconnect for testing the second die.
Claim 9
Dependent Claim
31 words
The apparatus as claimed in claim 6 wherein the base includes a rail and the connector member includes a molded body with a groove configured for mating engagement with the rail.
Claim 10
Dependent Claim
25 words
The apparatus as claimed in claim 6 wherein the connector member includes a molded body with internal traces in electrical communication with the tine contacts.
Claim 11
Dependent Claim
26 words
The apparatus as claimed in claim 6 wherein the tine contacts include spring segments configured to slide over the first and second sets of contact pads.
Claim 12
Dependent Claim
23 words
The apparatus as claimed in claim 6 wherein the connector member comprises a molded plastic body formed using a 3-D injecting molding process.
Claim 13
Independent Claim
221 words
An apparatus for testing unpackaged semiconductor dice comprising: a base; an array of external contacts formed on a surface of the base, said external contacts in electrical communication with a pattern of contact pads on the base; a first interconnect configured to mount to the base, said first interconnect comprising first contact members configured to electrically engage first contact locations on a first die retained on the base, said first contact members in electrical communication with a first pattern of contact pads on the interconnect; a second interconnect configured to mount to the base, said second interconnect comprising second contact members configured to electrically engage second contact locations on a second die retained on the base, said second contact members in electrical communication with a second pattern of contact pads on the interconnect; and a connector member for physically attaching the first or second interconnect to the base, said connector member comprising a molded plastic body attachable to the base, said connector member further comprising metal wires embedded within the molded plastic body, said metal wires configured to contact the pattern of contact pads on the base, and to contact the first pattern of contact pads on the first interconnect for testing the first die, or the second pattern of contact pads on the second interconnect for testing the second die.
Claim 14
Independent Claim
221 words
An apparatus for testing unpackaged semiconductor dice comprising: a base; an array of external contacts formed on a surface of the base, said external contacts in electrical communication with a pattern of contact pads on the base; a first interconnect configured to mount to the base, said first interconnect comprising first contact members configured to electrically engage first contact locations on a first die retained on the base, said first contact members in electrical communication with a first pattern of contact pads on the interconnect; a second interconnect configured to mount to the base, said second interconnect comprising second contact members configured to electrically engage second contact locations on a second die retained on the base, said second contact members in electrical communication with a second pattern of contact pads on the interconnect; and a connector member for physically attaching the first or second interconnect to the base, said connector member comprising a molded plastic body attachable to the base, said connector member further comprising metal wires embedded within the molded plastic body, said metal wires configured to contact the pattern of contact pads on the base, and to contact the first pattern of contact pads on the first interconnect for testing the first die, or the second pattern of contact pads on the second interconnect for testing the second die.
Claim 15
Dependent Claim
27 words
The apparatus as claimed in claim 11 wherein the base includes a rail and the connector member includes a groove configured for mating engagement with the rail.
Claim 16
Dependent Claim
18 words
The apparatus as claimed in claim 11 wherein the array of external contact comprises a dense grid array.
Claim 17
Dependent Claim
18 words
The apparatus as claimed in claim 11 wherein the connector member is formed using a 3-D molding process.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2000-11-24 | 2001-05-26 | 2001-11-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-11-24 | 2005-05-26 | 2005-11-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-11-24 | 2009-05-26 | 2009-11-25 | $7700.00 | Window Closed / Lapsed |