US5674783A
Expired / Lapsed
US
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Method for improving the chemical-mechanical polish (CMP) uniformity of insulator layers
Assignee: Taiwan Semiconductor Manufacturing Co TSMC Ltd
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Filing: 1996-04-01
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Granted: 1997-10-07
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Expires: 2016-04-01
Abstract
Abstract A method for forming an insulator layer with enhanced uniformity when planarized through a Chemical-Mechanical Polish (CMP) planarizing process. There is first provided a semiconductor substrate having formed thereupon a patterned layer. The patterned layer has a volume density greater than the volume density of an insulator layer to be formed upon the patterned layer. The patterned layer also has a first region having a high areal density of the patterned layer and a second region having a low areal density of the patterned layer. The second region of the patterned layer is then masked. The first region of the patterned layer is then exposed to a first plasma which is capable of modifying the first region of the patterned layer such that the insulator layer will form less rapidly upon the first region of the patterned layer than upon the second region of the patterned layer. The second region of the semiconductor substrate is then unmasked and the insulator layer is formed upon the patterned layer. The insulator layer so formed being thicker over the second region than over the first region. As a first alternative the first region of the patterned layer may be masked and the second region of the patterned layer exposed to a second plasma which enhances the growth of the insulator layer. As a second alternative, both the first plasma and the second plasma may be employed through sequential masking steps.
Inventors
- 👤 Syun-Ming Jang
- 👤 Chen-Hua Douglas Yu
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 01:30
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/69; H10P14/692; H10P14/6921; H10P14/69215; H10P14/63; H10P14/6326; H10P14/6328; H10P14/6334; H10P14/6336; H10P14/65; H10P14/6516; H10P14/6529; H10P14/6532; H10P14/66; H10P14/662; H10P95/00; H10P95/06; H10P95/062
Claims Analysis
Total Claims: 28
Claim 1
Independent Claim
178 words
A method for forming an insulator layer with enhanced uniformity when planarized through a Chemical-Mechanical Polish (CMP) planarizing process comprising: providing a semiconductor substrate; forming upon the semiconductor substrate a patterned layer, the patterned layer having a volume density greater than the volume density of an insulator layer to be formed upon the patterned layer, the patterned layer also having a first region having a high areal patterning density of the patterned and a second region having a low areal patterning density of the patterned layer; masking the second region of the patterned layer; exposing then the first region of the patterned layer to a first plasma, the first plasma being capable of modifying the first region of the patterned layer such that the insulator layer will form less rapidly upon the first region of the patterned layer than upon the second region of the patterned layer; unmasking the second region of the patterned layer; and, forming upon the patterned layer the insulator layer, the insulator layer being thicker over the second region than over the first region.
Claim 2
Independent Claim
178 words
A method for forming an insulator layer with enhanced uniformity when planarized through a Chemical-Mechanical Polish (CMP) planarizing process comprising: providing a semiconductor substrate; forming upon the semiconductor substrate a patterned layer, the patterned layer having a volume density greater than the volume density of an insulator layer to be formed upon the patterned layer, the patterned layer also having a first region having a high areal patterning density of the patterned and a second region having a low areal patterning density of the patterned layer; masking the second region of the patterned layer; exposing then the first region of the patterned layer to a first plasma, the first plasma being capable of modifying the first region of the patterned layer such that the insulator layer will form less rapidly upon the first region of the patterned layer than upon the second region of the patterned layer; unmasking the second region of the patterned layer; and, forming upon the patterned layer the insulator layer, the insulator layer being thicker over the second region than over the first region.
Claim 3
Dependent Claim
14 words
The method of claim 1 wherein the patterned layer is a patterned conductor layer.
Claim 4
Dependent Claim
31 words
The method of claim 2 wherein the difference in areal density of the patterned conductor layer within the first region and within the second region is at least about 10 percent.
Claim 5
Dependent Claim
59 words
The method of claim 1 further comprising forming a second insulator layer conformally directly upon the patterned layer prior to exposing the patterned layer to the first plasma, the second insulator layer being formed from a silicon oxide deposited through a Plasma Enhanced Chemical Vapor Deposition (PECVD) method employing Tetra Ethyl Ortho Silicate (TEOS) as a silicon source material.
Claim 6
Dependent Claim
13 words
The method of claim 4 wherein the first plasma is an oxygen plasma.
Claim 7
Dependent Claim
55 words
The method of claim 1 further comprising forming a second insulator layer conformally directly upon the patterned layer prior to exposing the patterned layer to the first plasma, the second insulator layer being formed from a silicon oxide deposited through a Plasma Enhanced Chemical Vapor Deposition (PECVD) method employing silane as a silicon source material.
Claim 8
Dependent Claim
23 words
The method of claim 6 wherein the first plasma is selected from the group of plasmas consisting of oxygen plasmas and nitrogen plasmas.
Claim 9
Dependent Claim
79 words
The method of claim 1 wherein: the first plasma is provided at a mixed radio frequency power having a first radio frequency power of from about 40 to about 60 watts at a first radio frequency of 13.56 MHz and a second radio frequency power of from about 420 to about 480 watts at a second radio frequency of 350 kHz; and the first plasma is provided for a time period of from about 50 to about 70 seconds.
Claim 10
Dependent Claim
21 words
The method of claim 1 wherein the insulator layer is an ozone assisted Chemical Vapor Deposited (CVD) silicon oxide insulator layer.
Claim 11
Dependent Claim
40 words
The method of claim 9 wherein the ozone assisted Chemical Vapor Deposited (CVD) silicon oxide insulator layer employs Tetra Ethyl Ortho Silicate (TEOS) as a silicon source material at an ozone:TEOS molar ratio of from about 12:1 to about 16:1.
Claim 12
Independent Claim
179 words
A method for forming an insulator layer with enhanced uniformity when planarized through a Chemical-Mechanical Polish (CMP) planarizing process comprising: providing a semiconductor substrate; forming upon the semiconductor substrate a patterned layer, the patterned layer having a volume density greater than the volume density of an insulator layer to be formed upon the patterned layer, the patterned layer also having a first region having a high areal patterning density of the patterned layer and a second region having a low areal patterning density of the patterned layer; masking the first region of the patterned layer; exposing then the second region of the patterned layer to a second plasma, the second plasma being capable of modifying the second region of the patterned layer such that the insulator layer will form more rapidly upon the second region of the patterned layer than upon the first region of the patterned layer; unmasking the first region of the patterned layer; and, forming upon the patterned layer the insulator layer, the insulator layer being thicker over the second region than over the first region.
Claim 13
Independent Claim
179 words
A method for forming an insulator layer with enhanced uniformity when planarized through a Chemical-Mechanical Polish (CMP) planarizing process comprising: providing a semiconductor substrate; forming upon the semiconductor substrate a patterned layer, the patterned layer having a volume density greater than the volume density of an insulator layer to be formed upon the patterned layer, the patterned layer also having a first region having a high areal patterning density of the patterned layer and a second region having a low areal patterning density of the patterned layer; masking the first region of the patterned layer; exposing then the second region of the patterned layer to a second plasma, the second plasma being capable of modifying the second region of the patterned layer such that the insulator layer will form more rapidly upon the second region of the patterned layer than upon the first region of the patterned layer; unmasking the first region of the patterned layer; and, forming upon the patterned layer the insulator layer, the insulator layer being thicker over the second region than over the first region.
Claim 14
Dependent Claim
14 words
The method of claim 11 wherein the patterned layer is a patterned conductor layer.
Claim 15
Dependent Claim
31 words
The method of claim 12 wherein the difference in areal density of the patterned conductor layer within the first region and within the second region is at least about 10 percent.
Claim 16
Dependent Claim
59 words
The method of claim 11 further comprising forming a second insulator layer conformally directly upon the patterned layer prior to exposing the patterned layer to the second plasma, the second insulator layer being formed from a silicon oxide deposited through a Plasma Enhanced Chemical Vapor Deposition (PECVD) method employing Tetra Ethyl Ortho Silicate (TEOS) as a silicon source material.
Claim 17
Dependent Claim
13 words
The method of claim 14 wherein the second plasma is a nitrogen plasma.
Claim 18
Dependent Claim
79 words
The method of claim 15 wherein: the nitrogen plasma is provided at a mixed radio frequency power having a first radio frequency power of from about 40 to about 60 watts at a first radio frequency of 13.56 MHz and a second radio frequency power of from about 420 to about 480 watts at a second radio frequency of 350 KHz; and the nitrogen plasma is provided for a time period of from about 50 to about 70 seconds.
Claim 19
Dependent Claim
21 words
The method of claim 11 wherein the insulator layer is an ozone assisted Chemical Vapor Deposited (CVD) silicon oxide insulator layer.
Claim 20
Dependent Claim
40 words
The method of claim 17 wherein the ozone assisted Chemical Vapor Deposited (CVD) silicon oxide insulator layer employs Tetra Ethyl Ortho Silicate (TEOS) as a silicon source material at an ozone:TEOS molar ratio of from about 12:1 to about 16:1.
Claim 21
Independent Claim
251 words
A method for forming an insulator layer with enhanced uniformity when planarized through a Chemical-Mechanical Polish (CMP) planarizing process comprising: providing a semiconductor substrate; forming upon the semiconductor substrate a patterned layer, the patterned layer having a volume density greater than the volume density of an insulator layer to be formed upon the patterned layer, the patterned layer also having a first region having a high areal patterning density of the patterned layer and a second region having a low areal patterning density of the patterned layer; masking the second region of the patterned layer and exposing then the first region of the patterned layer to a first plasma, the first plasma being capable of modifying the first region of the patterned layer such that the insulator layer will form less rapidly upon the first region of the patterned layer than upon the second region of the patterned layer; unmasking the second region of the semiconductor substrate; masking the first region of the patterned layer and exposing then the second region of the patterned layer to a second plasma, the second plasma being capable of modifying the second region of the patterned layer such that the insulator layer will form more rapidly upon the second region of the patterned layer than upon the first region of the patterned layer; unmasking the first region of the semiconductor substrate; and, forming then upon the patterned layer the insulator layer, the insulator layer being thicker over the second region than over the first region.
Claim 22
Independent Claim
251 words
A method for forming an insulator layer with enhanced uniformity when planarized through a Chemical-Mechanical Polish (CMP) planarizing process comprising: providing a semiconductor substrate; forming upon the semiconductor substrate a patterned layer, the patterned layer having a volume density greater than the volume density of an insulator layer to be formed upon the patterned layer, the patterned layer also having a first region having a high areal patterning density of the patterned layer and a second region having a low areal patterning density of the patterned layer; masking the second region of the patterned layer and exposing then the first region of the patterned layer to a first plasma, the first plasma being capable of modifying the first region of the patterned layer such that the insulator layer will form less rapidly upon the first region of the patterned layer than upon the second region of the patterned layer; unmasking the second region of the semiconductor substrate; masking the first region of the patterned layer and exposing then the second region of the patterned layer to a second plasma, the second plasma being capable of modifying the second region of the patterned layer such that the insulator layer will form more rapidly upon the second region of the patterned layer than upon the first region of the patterned layer; unmasking the first region of the semiconductor substrate; and, forming then upon the patterned layer the insulator layer, the insulator layer being thicker over the second region than over the first region.
Claim 23
Dependent Claim
39 words
The method of claim 19 wherein the patterned layer is a patterned conductor layer, the patterned conductor layer having a difference in areal density within the first region and within the second region of at least about 10 percent.
Claim 24
Dependent Claim
63 words
The method of claim 19 further comprising forming a second insulator layer conformally directly upon the patterned layer prior to exposing the patterned layer to the first plasma and the second plasma, the second insulator layer being formed from a silicon oxide deposited through a Plasma Enhanced Chemical Vapor Deposition (PECVD) method employing Tetra Ethyl Ortho Silicate (TEOS) as a silicon source material.
Claim 25
Dependent Claim
21 words
The method of claim 21 wherein the first plasma is an oxygen plasma and the second plasma is a nitrogen plasma.
Claim 26
Dependent Claim
150 words
The method of claim 22 wherein: the oxygen plasma is provided at a mixed radio frequency power having a first radio frequency power of from about 40 to about 60 watts at a first radio frequency of 13.56 MHz and a second radio frequency power of from about 420 to about 480 watts at a second radio frequency of 350 kHz; the oxygen plasma is provided for a time period of from about 50 to about 70 seconds; the nitrogen plasma is provided at a mixed radio frequency having a first radio frequency power of from about 40 to about 60 watts at a first radio frequency of 13.56 Mhz and a second radio frequency power of from about 420 to about 480 watts at a second radio frequency of 350 kHz; and the nitrogen plasma is provided for a time period of from about 50 to about 70 seconds.
Claim 27
Dependent Claim
21 words
The method of claim 19 wherein the insulator layer is an ozone assisted Chemical Vapor Deposited (CVD) silicon oxide insulator layer.
Claim 28
Dependent Claim
40 words
The method of claim 24 wherein the ozone assisted Chemical Vapor Deposited (CVD) silicon oxide insulator layer employs Tetra Ethyl Ortho Silicate (TEOS) as a silicon source material at an ozone:TEOS molar ratio of from about 12:1 to about 16:1.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2000-10-06 | 2001-04-07 | 2001-10-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-10-06 | 2005-04-07 | 2005-10-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-10-06 | 2009-04-07 | 2009-10-07 | $7700.00 | Window Closed / Lapsed |