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US5656525A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of manufacturing high aspect-ratio field emitters for flat panel displays

Assignee: Transpacific IP Ltd
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Filing: 1994-12-12
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Granted: 1997-08-12
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Expires: 2014-12-12
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Abstract

Abstract A new method for forming an array of high aspect ratio field emitter for flat panel Field Emission Displays (FEDs) was accomplished. The method involves forming on an insulated substrate an array of parallel cathodes and then depositing a dielectric layer and forming a array of parallel gate electrodes essentially orthogonal to the array of cathode electrodes. Opening are then made in the upper gate electrodes and dielectric layer over the lower cathode electrodes. The field emitters with high aspect-ratios are then formed on the cathode by depositing an emitter material, such as molybdenum, in the opening while heating the substrate to high temperatures. The emitter material is removed elsewhere on the substrate by utilizing a release layer and thereby completing the gated field emitter. This high temperature method results in high aspect-ratio gated emitters that allow the inter-electrode dielectric layer to be increased and thereby improving the circuit performance.

Inventors

  • 👤 Ching-Yuan Lin
  • 👤 Peng Chao-Chi
  • 👤 Kyan-Lun Chang
  • 👤 Jermmy J. M. Wang

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 02:22
CPC Classifications
H; H01; H01J; H01J9/00; H01J9/02; H01J9/022; H01J9/025; Y; Y10; Y10S; Y10S438/00; Y10S438/942; Y10S438/948; Y10S438/951

Claims Analysis

Total Claims: 34
Claim 1
Independent Claim 379 words
A method for fabricating an array of gated field emitter structures having high aspect ratios on an insulating substrate comprising the steps of: providing an insulating substrate; depositing a first electrically conducting layer on said insulating substrate; patterning said first electrically conducting layer by photoresist masking and etching and thereby forming cathodes comprising of an array of parallel first conducting strips in a first direction on said substrate; depositing a blanket insulating layer on said first conducting strips and elsewhere on said substrate; depositing a second electrically conducting layer on said insulating layer; patterning said second electrically conducting layer by photoresist masking and etching and thereby forming a gate electrode comprising of an array of parallel second conducting strips in a second direction that cross over said array of parallel first conducting strips; forming openings in said second conducting strips to said insulating layer over portions of said first conducting strips by photoresist masking and etching; and etching said insulating layer in said openings to said first conducting strips and recessing the sidewalls of said insulating layer in said openings and under said second conducting strips; removing said photoresist mask; depositing a release layer at a shallow angle on said insulating substrate while rotating said substrate about an axis normal to said substrate surface, and thereby forming said release layer on said substrate surface and on sidewalls of said openings in said second conducting strips; heating said insulating substrate in an evacuated evaporation system prior to depositing a third conducting layer for the purpose of forming said electron field emitter structures having high aspect ratios; depositing a third conducting layer at normal incidence on said heated substrate surface, and thereby forming in said openings on said first conducting strips said array of high aspect ratio gated field emitter structures and said third conducting layer deposited elsewhere on said substrate and physically separated from said array of field emitter structures; etching said release layer and lifting off said third conducting layer elsewhere on said substrate, and thereby completing said array of high aspect ratio gate field emitter structures on said array of cathode electrodes, and furthermore having an array of gate electrodes with openings that are self-aligned, coplanar and in close proximity to the tips of said gated field emitters.
Claim 2
Independent Claim 379 words
A method for fabricating an array of gated field emitter structures having high aspect ratios on an insulating substrate comprising the steps of: providing an insulating substrate; depositing a first electrically conducting layer on said insulating substrate; patterning said first electrically conducting layer by photoresist masking and etching and thereby forming cathodes comprising of an array of parallel first conducting strips in a first direction on said substrate; depositing a blanket insulating layer on said first conducting strips and elsewhere on said substrate; depositing a second electrically conducting layer on said insulating layer; patterning said second electrically conducting layer by photoresist masking and etching and thereby forming a gate electrode comprising of an array of parallel second conducting strips in a second direction that cross over said array of parallel first conducting strips; forming openings in said second conducting strips to said insulating layer over portions of said first conducting strips by photoresist masking and etching; and etching said insulating layer in said openings to said first conducting strips and recessing the sidewalls of said insulating layer in said openings and under said second conducting strips; removing said photoresist mask; depositing a release layer at a shallow angle on said insulating substrate while rotating said substrate about an axis normal to said substrate surface, and thereby forming said release layer on said substrate surface and on sidewalls of said openings in said second conducting strips; heating said insulating substrate in an evacuated evaporation system prior to depositing a third conducting layer for the purpose of forming said electron field emitter structures having high aspect ratios; depositing a third conducting layer at normal incidence on said heated substrate surface, and thereby forming in said openings on said first conducting strips said array of high aspect ratio gated field emitter structures and said third conducting layer deposited elsewhere on said substrate and physically separated from said array of field emitter structures; etching said release layer and lifting off said third conducting layer elsewhere on said substrate, and thereby completing said array of high aspect ratio gate field emitter structures on said array of cathode electrodes, and furthermore having an array of gate electrodes with openings that are self-aligned, coplanar and in close proximity to the tips of said gated field emitters.
Claim 3
Dependent Claim 27 words
The method of claim 1, wherein said first electrically conducting layer is composed of molybdenum (Mo) and has a thickness of between about 2000 to 6000 Angstroms.
Claim 4
Dependent Claim 32 words
The method of claim 1, wherein said insulating layer is composed of silicon oxide (SiO2) and has a thickness that is equal to the height of said high aspect-ratio field emitter structure.
Claim 5
Dependent Claim 27 words
The method of claim 1, wherein said second electrically conducting layer is composed of molybdenum (Mo) and has a thickness of between about 2000 to 6000 Angstroms.
Claim 6
Dependent Claim 17 words
The method of claim 1, wherein said opening in said second conducting strips are circular in shape.
Claim 7
Dependent Claim 26 words
The method of claim 1, wherein said insulating layer in said openings is recessed under said second conducting strips by between about 0.3 to 1.5 micrometers.
Claim 8
Dependent Claim 33 words
The method of claim 1, wherein said release layer is composed of aluminum (Al) and is deposited at an angle of between about 10 to 50 Degrees with respect to said substrate surface.
Claim 9
Dependent Claim 19 words
The method of claim 7, wherein the thickness of said release layer is between about 3000 to 8000 Angstroms.
Claim 10
Dependent Claim 29 words
The method of claim 1, wherein said third conducting layer is deposited to thickness greater than the height of said insulating layer by between about 30 to 100 percent.
Claim 11
Dependent Claim 23 words
The method of claim 1, wherein the aspect-ratio (height to base width ratio) of said field emitters increases with temperature of said substrate.
Claim 12
Dependent Claim 28 words
The method of claim 10, wherein the aspect-ratio of said field emitters vary between about 1.4 to 3.0 for a substrate temperature between about 100° to 300° C.
Claim 13
Dependent Claim 33 words
The method of claim 10, wherein the base width of said field emitters are about equal to the diameter of said openings in said second conducting strips after deposition of said release layer.
Claim 14
Independent Claim 457 words
A method for fabricating an array of gated field emitter structures having high aspect ratios and pedestals on an insulating substrate comprising the steps of: providing an insulating substrate; depositing a first electrically conducting layer on said insulating substrate; patterning said first electrically conducting layer by photoresist masking and etching and thereby forming cathodes comprising of an array of parallel first conducting strips in a first direction on said substrate; depositing a blanket insulating layer on said first conducting strips and elsewhere on said substrate; depositing a second electrically conducting layer on said insulating layer; patterning said second electrically conducting layer by photoresist masking and etching and thereby forming a gate electrode comprising of an array of parallel second conducting strips in a second direction that cross over said array of parallel first conducting strips; forming openings in said second conducting strips to said insulating layer over portions of said first conducting strips by photoresist masking and etching; and etching said insulating layer in said openings to said first conducting strips and recessing the sidewalls of said insulating layer in said openings and under said second conducting strips; removing said photoresist mask; depositing a release layer at a shallow angle on said insulating substrate while rotating said substrate about an axis normal to said substrate surface, and thereby forming said release layer on said substrate surface and on sidewalls of said openings in said second conducting strips; heating said insulating substrate in an evacuated evaporation system prior to depositing a first and second conducting pedestal layer and a third conducting layer for the purpose of forming said electron field emitter structures having high aspect ratios on said pedestal structure; depositing on said substrate said first conducting pedestal layer at normal incidence to said substrate surface; depositing on said substrate said second conducting pedestal layer at an angle to said substrate surface while rotating said substrate about an axis to said substrate surface; depositing a third conducting layer at normal incidence on said heated substrate surface, and thereby forming in said openings on said second conducting pedestal layer said array of high aspect ratio gated field emitter structures and said first and second pedestal and third conducting layer deposited elsewhere on said substrate are physically separated from said array of pedestals with field emitter structures thereon; etching said release layer and lifting off said first and second pedestal layer and said third conducting layer elsewhere on said substrate, and thereby completing said array of high aspect ratio gated field emitter structures having conducting pedestals on said array of cathode electrodes, and furthermore having an array of gate electrodes with openings that are self-aligned, coplanar and in close proximity to the tips of said high aspect-ratio gated field emitters.
Claim 15
Independent Claim 457 words
A method for fabricating an array of gated field emitter structures having high aspect ratios and pedestals on an insulating substrate comprising the steps of: providing an insulating substrate; depositing a first electrically conducting layer on said insulating substrate; patterning said first electrically conducting layer by photoresist masking and etching and thereby forming cathodes comprising of an array of parallel first conducting strips in a first direction on said substrate; depositing a blanket insulating layer on said first conducting strips and elsewhere on said substrate; depositing a second electrically conducting layer on said insulating layer; patterning said second electrically conducting layer by photoresist masking and etching and thereby forming a gate electrode comprising of an array of parallel second conducting strips in a second direction that cross over said array of parallel first conducting strips; forming openings in said second conducting strips to said insulating layer over portions of said first conducting strips by photoresist masking and etching; and etching said insulating layer in said openings to said first conducting strips and recessing the sidewalls of said insulating layer in said openings and under said second conducting strips; removing said photoresist mask; depositing a release layer at a shallow angle on said insulating substrate while rotating said substrate about an axis normal to said substrate surface, and thereby forming said release layer on said substrate surface and on sidewalls of said openings in said second conducting strips; heating said insulating substrate in an evacuated evaporation system prior to depositing a first and second conducting pedestal layer and a third conducting layer for the purpose of forming said electron field emitter structures having high aspect ratios on said pedestal structure; depositing on said substrate said first conducting pedestal layer at normal incidence to said substrate surface; depositing on said substrate said second conducting pedestal layer at an angle to said substrate surface while rotating said substrate about an axis to said substrate surface; depositing a third conducting layer at normal incidence on said heated substrate surface, and thereby forming in said openings on said second conducting pedestal layer said array of high aspect ratio gated field emitter structures and said first and second pedestal and third conducting layer deposited elsewhere on said substrate are physically separated from said array of pedestals with field emitter structures thereon; etching said release layer and lifting off said first and second pedestal layer and said third conducting layer elsewhere on said substrate, and thereby completing said array of high aspect ratio gated field emitter structures having conducting pedestals on said array of cathode electrodes, and furthermore having an array of gate electrodes with openings that are self-aligned, coplanar and in close proximity to the tips of said high aspect-ratio gated field emitters.
Claim 16
Dependent Claim 27 words
The method of claim 13, wherein said first electrically conducting layer is composed of molybdenum (Mo) and has a thickness of between about 2000 to 6000 Angstroms.
Claim 17
Dependent Claim 13 words
The method of claim 14, wherein said molybdenum is replaced by nickel (Ni).
Claim 18
Dependent Claim 38 words
The method of claim 13, wherein said insulating layer is composed of silicon oxide (SiO 2 ) and has a thickness that is equal to the height of said high aspect-ratio field emitter structure on said conducting pedestal.
Claim 19
Dependent Claim 27 words
The method of claim 13, wherein said second electrically conducting layer is composed of molybdenum (Mo) and has a thickness of between about 2000 to 6000 Angstroms.
Claim 20
Dependent Claim 13 words
The method of claim 17, wherein said molybdenum is replaced by nickel (Ni).
Claim 21
Dependent Claim 17 words
The method of claim 13, wherein said opening in said second conducting strips are circular in shape.
Claim 22
Dependent Claim 26 words
The method of claim 13, wherein said insulating layer in said openings is recessed under said second conducting strips by between about 0.3 to 1.5 micrometers.
Claim 23
Dependent Claim 33 words
The method of claim 13, wherein said release layer is composed of aluminium (Al) and is deposited at an angle of between about 10 to 50 Degrees with respect to said substrate surface.
Claim 24
Dependent Claim 19 words
The method of claim 21, wherein the thickness of said release layer is between about 3000 to 8000 Angstroms.
Claim 25
Dependent Claim 30 words
The method of claim 13, wherein said third conducting layer is deposited to a thickness greater than the height of said insulating layer by between about 30 to 100 percent.
Claim 26
Dependent Claim 23 words
The method of claim 13, wherein the aspect-ratio (height to base width ratio) of said field emitters increases with temperature of said substrate.
Claim 27
Dependent Claim 28 words
The method of claim 24, wherein the aspect-ratio of said field emitters vary between about 1.4 to 3.0 for a substrate temperature between about 100° to 300° C.
Claim 28
Dependent Claim 33 words
The method of claim 24, wherein the base width of said field emitters are about equal to the diameter of said openings in said second conducting strips after deposition of said release layer.
Claim 29
Dependent Claim 27 words
The method of claim 13, wherein said first conducting pedestal layer is composed of titanium (Ti) and has a thickness of between about 300 to 2000 Angstroms.
Claim 30
Dependent Claim 13 words
The method of claim 27, wherein the titanium is replaced by chromium (Cr).
Claim 31
Dependent Claim 12 words
The method of claim 27, wherein said titanium is replaced with aluminium.
Claim 32
Dependent Claim 44 words
The method of claim 13, wherein said second conducting pedestal layer is composed of molybdenum (Mo) and is deposited at an angle of between 10 to 30 Degrees with respect to the substrate surface having a thickness of between about 1000 to 5000 Angstroms.
Claim 33
Dependent Claim 13 words
The method of claim 30 wherein said molybdenum is replaced by tungsten (W).
Claim 34
Dependent Claim 18 words
The method of claim 30, wherein said molybdenum is replaced by a tungsten (W) and titanium (Ti) alloy.

References Cited (Backward Citations)

US5064396A Cited
US5075591A Cited
US5249340A Cited
US5451175A Cited
US5229331A Cited
US5342737A Cited
US5393647A Cited
US5480843A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2000-08-11 2001-02-10 2001-08-12 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2004-08-11 2005-02-10 2005-08-12 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2008-08-11 2009-02-10 2009-08-12 $7700.00 Window Closed / Lapsed

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