Method of manufacturing a semiconductor device

Claim 1

A method of manufacturing a semiconductor device comprising the steps of: forming a semiconductor layer on an insulating surface; forming a first insulating film on said semiconductor layer; forming a gate electrode on said first insulating film; forming a first anodic oxide film on side surfaces of said gate electrode by applying an electric current to said gate electrode in an electrolyte; etching said first insulating film in order to thin or remove said insulating film using said first anodic oxide film as a mask, thereby forming a gate insulating film; removing said first anodic oxide film after said etching; and introducing ions of an impurity of an N or P type conductivity into a portion of said semiconductor layer using said gate electrode and said gate insulating film as a mask, wherein said introducing is carried out with at least two different conditions having a higher acceleration voltage and a lower acceleration voltage.

Claim 2

A method of manufacturing a semiconductor device comprising the steps of: forming a semiconductor layer on an insulating surface; forming a first insulating film on said semiconductor layer; forming a gate electrode on said first insulating film; forming a first anodic oxide film on side surfaces of said gate electrode by applying an electric current to said gate electrode in an electrolyte; etching said first insulating film in order to thin or remove said insulating film using said first anodic oxide film as a mask, thereby forming a gate insulating film; removing said first anodic oxide film after said etching; and introducing ions of an impurity of an N or P type conductivity into a portion of said semiconductor layer using said gate electrode and said gate insulating film as a mask, wherein said introducing is carried out with at least two different conditions having a higher acceleration voltage and a lower acceleration voltage.

Claim 6

A method of manufacturing a semiconductor device comprising the steps of: forming a semiconductor layer on an insulating surface; forming an insulating film on an entire surface of said semiconductor layer; forming a gate electrode on said insulating film; patterning said insulating film into a gate insulating film in such a manner that said gate insulating film extends beyond side edges of said gate electrode but does not completely cover said semiconductor layer so that portions of said semiconductor layer are exposed; and introducing one conductivity type impurity ions into said semiconductor layer using said gate electrode and said gate insulating layer as a mask, wherein a condition of said introducing step is selected so that regions of said semiconductor layer located below extensions of said gate insulating film beyond said gate electrode are added with said impurity at a first concentration while exposed regions of said semiconductor layer are added with said impurity at a second concentration which is different from said first concentration, wherein said insulating film is patterned by using a mask which is an anodic oxide film formed on side surfaces of said gate electrode.

Claim 7

A method of manufacturing a semiconductor device comprising the steps of: forming a semiconductor layer on an insulating surface; forming an insulating film on an entire surface of said semiconductor layer; forming a gate electrode on said insulating film; patterning said insulating film into a gate insulating film in such a manner that said gate insulating film extends beyond side edges of said gate electrode but does not completely cover said semiconductor layer so that portions of said semiconductor layer are exposed; and introducing one conductivity type impurity ions into said semiconductor layer using said gate electrode and said gate insulating layer as a mask, wherein a condition of said introducing step is selected so that regions of said semiconductor layer located below extensions of said gate insulating film beyond said gate electrode are added with said impurity at a first concentration while exposed regions of said semiconductor layer are added with said impurity at a second concentration which is different from said first concentration, wherein said insulating film is patterned by using a mask which is an anodic oxide film formed on side surfaces of said gate electrode.