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US4232327A Expired / Lapsed US ⏱️ 0.0 years remaining

Extended drain self-aligned silicon gate MOSFET

Assignee: RCA Corp
•
Filing: 1978-11-13
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Granted: 1980-11-04
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Expires: 1998-11-13
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Abstract

Abstract A Metal-Oxide-Semiconductor-Field Effect Transistor (MOSFET) is described wherein a body of semiconductor material is provided with source, drain and channel regions. A gate structure is provided over the interstitial channel region of the semiconductor body between the drain and source regions, one edge of which is aligned with the source region. The remainder of the channel region, between the other edge of the gate structure and the adjacent edge of the drain region is provided with a drift region of a conductivity type that is opposite to that of the source and drain.

Inventors

  • 👤 Sheng T. Hsu

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 18:35
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/601; H10D30/603; H10D30/67; H10D30/6704; H10D30/6713; H10D30/6715; H10D30/6717; H10D30/6758; H10D30/6759

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 169 words
In an improved extended drain field effect transistor of the type including a body of semiconductor material in which spaced drain and source regions of a first conductivity type, with a given concentration of conductivity modifiers, are embedded at the surface of the body, the drain and source regions spaced a given distance one from the other to define the channel region, a first layer of insulating material disposed over the channel region, and a gate member disposed on the first insulating layer over the channel region, the improvement comprising: the portion of the channel region adjacent the source region having a second conductivity type opposite the first conductivity type; the remainder of the channel region, adjacent the drain region, forming a drift region of the first conductivity type with a lower concentration of conductivity modifiers therein than the drain and source regions; and the gate member is disposed solely over the channel region with the edges thereof in alignment with respective edges of the source and drift regions.
Claim 2
Dependent Claim 169 words
In an improved extended drain field effect transistor of the type including a body of semiconductor material in which spaced drain and source regions of a first conductivity type, with a given concentration of conductivity modifiers, are embedded at the surface of the body, the drain and source regions spaced a given distance one from the other to define the channel region, a first layer of insulating material disposed over the channel region, and a gate member disposed on the first insulating layer over the channel region, the improvement comprising: the portion of the channel region adjacent the source region having a second conductivity type opposite the first conductivity type; the remainder of the channel region, adjacent the drain region, forming a drift region of the first conductivity type with a lower concentration of conductivity modifiers therein than the drain and source regions; and the gate member is disposed solely over the channel region with the edges thereof in alignment with respective edges of the source and drift regions.
Claim 3
Dependent Claim 53 words
The improved field effect transistor of claim 1, wherein: the body of semiconductor material is an island of silicon formed on an insulative substrate with the drain, source, channel and drift regions colocated in the island; and the insulative substrate is selected from the group consisting of sapphire, spinel, and monocrystalline beryllium oxide.
Claim 4
Dependent Claim 46 words
The improved field effect transistor of claim 2, wherein: the body of semiconductor material is a doped region of the second conductivity type; and the drain, source, and drift regions are of opposite conductivity type formed within the body of semiconductor material, at the surface thereof.

References Cited (Backward Citations)

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US3296508A Cited
US3339128A Cited
US3484662A Cited
US3455020A Cited
US3434021A Cited
US3633078A Cited
US3988761A Cited
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US4193080A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1983-11-04 1984-05-05 1984-11-04 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1987-11-04 1988-05-05 1988-11-04 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1991-11-04 1992-05-05 1992-11-04 $7700.00 Window Closed / Lapsed

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