Antireflective coating process

Claim 2

A process for reducing reflection from a substrate during imaging of a photoresist layer, said process comprising the steps of forming an antireflective, radiation-adsorbing coating over a substrate; applying a radiation-sensitive photoresist layer over said antireflective coating, said antireflective coating being capable of adsorbing activating radiation for said photoresist layer thus decreasing reflection of the same back into the photoresist layer; exposing said photoresist layer to activating radiation in an image pattern to form a latent image therein without formation of a developable latent image in the antireflective coating, developing said photoresist layer with a developer that is incapable of dissolving said antireflective coating to form a relief image in said photoresist layer, altering the dissolution properties of the antireflective coating; and dissolving said antireflective coating in a solvent therefor without appreciably dissolving the photoresist layer to bare the underlying substrate in an image pattern.

Claim 3

The process of claim 1 where the composite of the substrate, antireflective coating and photoresist layer are heated to elevated temperature during the step of altering the dissolution properties of the antireflective coating.

Claim 4

The process of claim 2 where the photoresist layer is one activated by exposure to deep ultraviolet irradiation and the antireflective coating is one that adsorbs deep ultraviolet irradiation.

Claim 5

The process of claim 2 where the photoresist layer is a positive-working photoresist.

Claim 6

The process of claim 2 where the photoresist layer is a negative-acting photoresist.

Claim 7

The process of claim 2 where the exposed photoresist layer containing a latent image is soluble in an aqueous base solution and the antireflective coating is insoluble in said aqueous base solution.

Claim 8

The process of claim 2 where the antireflective coating is altered to render the same soluble in an aqueous base solution.

Claim 9

The process of claim 7 where the antireflective coating is altered in its dissolution properties by heating said coating while exposing the same to radiation capable of causing chain scission of said coating.

Claim 10

The process of claim 8 where the antireflective coating and the photoresist layer are heated to a temperature capable of accelerating the rate of alteration of said antireflective coating and curing the photoresist layer to render said layer insoluble in developer for the antireflective coating.

Claim 11

The process of claim 9 where the temperature varies between 20° C. and that temperature that would insolubilize the photoresist layer in developer for the antireflective coating.

Claim 12

The process of claim 9 where the temperature varies between 100° C. and that temperature that would degrade the photoresist layer.

Claim 13

The process of claim 11 where the maximum temperature is 200° C.

Claim 14

The process of claim 8 where the antireflective coating is exposed to a wavelength of below 380 nm.

Claim 15

The process of claim 8 where the antireflective coating is exposed to a wavelength of from 190 nm to 230 nm.

Claim 16

A process for reducing reflection from an integrated circuit substrate during imaging of a photoresist layer, said process comprising the steps of forming a polysulfone coating capable of adsorbing deep ultraviolet radiation over an integrated circuit substrate; applying a deep ultraviolet radiation-sensitive photoresist layer over said polysulfone coating; exposing said photoresist layer to deep ultraviolet radiation in an image pattern to form a latent image therein without formation of a developable latent image in the polysulfone layer; developing said photoresist layer with an aqueous alkaline developer that is incapable of dissolving said polysulfone coating to form a relief image in said photoresist layer; altering the dissolution properties of the polysulfone coating and the photoresist layer by exposing the same to deep ultraviolet irradiation while heating the same to render the polysulfone coating base soluble and cure the photoresist layer to thereby decrease its base solubility; and dissolving said polysulfone coating in an aqueous alkaline developer solution to bare the underlying substrate in an image pattern.

Claim 17

A process for reducing reflection from an integrated circuit substrate during imaging of a photoresist layer, said process comprising the steps of forming a polysulfone coating capable of adsorbing deep ultraviolet radiation over an integrated circuit substrate; applying a deep ultraviolet radiation-sensitive photoresist layer over said polysulfone coating; exposing said photoresist layer to deep ultraviolet radiation in an image pattern to form a latent image therein without formation of a developable latent image in the polysulfone layer; developing said photoresist layer with an aqueous alkaline developer that is incapable of dissolving said polysulfone coating to form a relief image in said photoresist layer; altering the dissolution properties of the polysulfone coating and the photoresist layer by exposing the same to deep ultraviolet irradiation while heating the same to render the polysulfone coating base soluble and cure the photoresist layer to thereby decrease its base solubility; and dissolving said polysulfone coating in an aqueous alkaline developer solution to bare the underlying substrate in an image pattern.

Claim 18

The process of claim 15 where the photoresist layer is of a negative-working photoresist.

Claim 19

The process of claim 15 where the photoresist layer is of a positive-working photoresist.

Claim 20

The process of claim 17 where the positive-working photoresist is a chemically amplified or acid-hardened photoresist.

Claim 21

The process of claim 17 where the antireflective coating and photoresist layer are heated to a temperature of from 20° C. to that temperature that would degrade the photoresist layer without solubilizing the photoresist layer in developer for the antireflective coating.

Claim 22

The process of claim 19 where the temperature varies between 20° C. and 50° C. or from 100° C. to 200° C.

Claim 23

The process of claim 15 where the antireflective coating is exposed to a wavelength of below 380 nm.

Claim 24

The process of claim 15 where the antireflective coating is exposed to a wavelength of from 190 nm to 230 nm.