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US5610097A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for forming electrode on semiconductor

Assignee: National Institute of Advanced Industrial Science and Technology
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Filing: 1996-03-14
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Granted: 1997-03-11
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Expires: 2016-03-14
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Abstract

Abstract A method for forming electrodes on a semiconductor includes introducing at least one reactive oxidizing gas selected from the group consisting of ozone, atomic oxygen, nitrogen dioxide, oxygen ion and oxygen plasma to an oxide semiconductor surface and depositing electrode material on the oxide semiconductor surface without exposing the surface to the outside atmosphere.

Inventors

  • 👤 Takashi Shimizu

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 01:48
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/40; H10P14/412; Y; Y10; Y10S; Y10S148/00; Y10S148/139; Y10S148/14

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 52 words
A method for forming electrodes on a semiconductor, comprising introducing at least one reactive oxidizing gas selected from the group consisting of ozone, atomic oxygen, nitrogen dioxide, oxygen ion and oxygen plasma to an oxide semiconductor surface and depositing electrode material on the oxide semiconductor surface without atmospheric exposure of the surface.
Claim 2
Independent Claim 52 words
A method for forming electrodes on a semiconductor, comprising introducing at least one reactive oxidizing gas selected from the group consisting of ozone, atomic oxygen, nitrogen dioxide, oxygen ion and oxygen plasma to an oxide semiconductor surface and depositing electrode material on the oxide semiconductor surface without atmospheric exposure of the surface.
Claim 3
Dependent Claim 26 words
A method according to claim 1, further comprising contacting electrode material with the reactive oxidizing gas at a temperature of from room temperature to 500° C.

References Cited (Backward Citations)

EP0209196A2 Cited
EP0304073A2 Cited
US5006483A Cited
US5221638A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2000-03-10 2000-09-09 2001-03-11 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2004-03-10 2004-09-09 2005-03-11 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2008-03-10 2008-09-09 2009-03-11 $7700.00 Window Closed / Lapsed

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