Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
60 words
A microelectronic structure comprising: a conductive oxide layer comprising a first metal; a conductive perovskite-seed layer comprising said first metal overlying said conductive oxide layer; and a perovskite dielectric layer overlying said perovskite-seed layer, whereby the similar crystal structure of the perovskite-seed layer improves the crystal quality of the perovskite dielectric layer and minimizes the formation of non-perovskite crystal structures.
Claim 2
Dependent Claim
60 words
A microelectronic structure comprising: a conductive oxide layer comprising a first metal; a conductive perovskite-seed layer comprising said first metal overlying said conductive oxide layer; and a perovskite dielectric layer overlying said perovskite-seed layer, whereby the similar crystal structure of the perovskite-seed layer improves the crystal quality of the perovskite dielectric layer and minimizes the formation of non-perovskite crystal structures.
Claim 3
Dependent Claim
18 words
The structure of claim 1, wherein said first metal is ruthenium and said conductive oxide is ruthenium dioxide.
Claim 4
Dependent Claim
18 words
The structure of claim 1, wherein said first metal is iridium and said conductive oxide is iridium oxide.
Claim 5
Dependent Claim
12 words
The structure of claim 1, wherein said perovskite-seed layer is calcium ruthenate.
Claim 6
Dependent Claim
32 words
The structure of claim 1, wherein said perovskite-seed layer is selected from the group consisting of: SrRuO 3 , BaRuO 3 , CaIrO 3 , SrIrO 3 , and BaIrO 3 .
Claim 7
Dependent Claim
14 words
The structure of claim 1, wherein said perovskite dielectric layer is barium strontium titanate.
Claim 8
Dependent Claim
41 words
The structure of claim 1, wherein said perovskite dielectric layer is selected from the group consisting of: (Ba,Sr,Pb)(Ti,Zr)O 3 , (Pb,La)(Zr,Ti)O 3 , bismuth titanate, potassium tantalate, lead scandium tantalate, lead niobate, potassium niobate, lead zinc niobate, and lead magnesium niobate.
Claim 9
Dependent Claim
15 words
The structure of claim 1, further comprising an upper electrode overlying said perovskite dielectric layer.
Claim 10
Dependent Claim
12 words
The structure of claim 8, wherein said upper electrode is titanium nitride.
Claim 11
Dependent Claim
21 words
The structure of claim 1, further comprising said conductive oxide layer overlying a first metallic layer composed of said first metal.
Claim 12
Dependent Claim
21 words
The structure of claim 1, wherein said conductive oxide layer further comprises unoxidized and partially oxidized forms of said first metal.
Claim 13
Dependent Claim
38 words
A microelectronic capacitor structure comprising: a ruthenium dioxide layer; a calcium ruthenate layer overlying said ruthenium dioxide layer; a barium strontium titanate layer overlying said calcium ruthenate layer; and an upper electrode overlying said barium strontium titanate layer.
Claim 14
Dependent Claim
38 words
A microelectronic capacitor structure comprising: a ruthenium dioxide layer; a calcium ruthenate layer overlying said ruthenium dioxide layer; a barium strontium titanate layer overlying said calcium ruthenate layer; and an upper electrode overlying said barium strontium titanate layer.
Claim 15
Dependent Claim
38 words
A microelectronic capacitor structure comprising: an iridium oxide layer; a CaIrO 3 layer overlying said iridium oxide layer; a barium strontium titanate layer overlying said CaIrO 3 layer; and an upper electrode overlying said barium strontium titanate layer.
Claim 16
Dependent Claim
38 words
A microelectronic capacitor structure comprising: an iridium oxide layer; a CaIrO 3 layer overlying said iridium oxide layer; a barium strontium titanate layer overlying said CaIrO 3 layer; and an upper electrode overlying said barium strontium titanate layer.