Patent US5570035A successfully refreshed from Google Patents.
US5570035A
Expired / Lapsed
US
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Built-in self test indicator for an integrated circuit package
Assignee: United States Department of the Army
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Filing: 1995-01-31
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Granted: 1996-10-29
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Expires: 2015-01-31
Abstract
Abstract Apparatus for providing a direct indication of the failure of an electronicircuit including a built-in self test circuit which performs an initial test on the electronic circuit and having a visual indicator coupled thereto which becomes activated when the self test circuit senses a failure of the electronic circuit upon power being supplied thereto or during operation. The electronic circuit with the built-in test feature consists of an integrated circuit chip or a multi-chip module encapsulated in a package with the indicator means visible therethrough. The indicator consists either of a light emitting diode or fusible material which changes its appearance and becomes visible through the package upon being activated by the built-in self test circuit.
Inventors
- 👤 Michael A. Dukes
- 👤 Gerald T. Michael
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 20:06
CPC Classifications
G; G06; G06F; G06F11/00; G06F11/30; G06F11/32; G06F11/324; G06F11/325; G06F11/326; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2884; G06F11/321
Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
98 words
A built-in self test apparatus for providing a visible indication of a failure of an electronic circuit, comprising: an integrated circuit chip; a built-in self test circuit integrally formed within said integrated circuit chip, said built-in self test circuit performing an operational test on said integrated circuit chip; and visible indicator means coupled to said built-in self test circuit which becomes activated when said built-in self test circuit senses a failure of said intergrated circuit when power is supplied thereto, said visible indicator means being formed as an integral part of a packaging for said intergrated circuit chip.
Claim 2
Dependent Claim
98 words
A built-in self test apparatus for providing a visible indication of a failure of an electronic circuit, comprising: an integrated circuit chip; a built-in self test circuit integrally formed within said integrated circuit chip, said built-in self test circuit performing an operational test on said integrated circuit chip; and visible indicator means coupled to said built-in self test circuit which becomes activated when said built-in self test circuit senses a failure of said intergrated circuit when power is supplied thereto, said visible indicator means being formed as an integral part of a packaging for said intergrated circuit chip.
Claim 3
Dependent Claim
38 words
The apparatus as defined by claim 1 wherein said built-in self test circuit generates an electrical output signal upon sensing said failure and wherein said visible indicator means is responsive to and becomes activated by said output signal.
Claim 4
Dependent Claim
20 words
The apparatus as defined by claim 2 wherein said visible indicator means comprises a light emitting device producing visible emissions.
Claim 5
Dependent Claim
20 words
The apparatus as defined by claim 3 wherein said light emitting device comprises a light emitting diode producing visible emissions.
Claim 6
Dependent Claim
27 words
The apparatus as defined by claim 2 wherein said visible indicator means includes material which permanently changes appearance upon being activated in response to said output signal.
Claim 7
Dependent Claim
132 words
A built-in self test apparatus for providing a visible indication of a failure of an electronic circuit, comprising: an integrated circuit chip; a built-in self test circuit integrally formed within said integrated circuit chip, said built-in self test circuit performing an operational test on said integrated circuit chip and generating an electrical output signal upon sensing a failure of said integrated circuit chip; and visible indicator means, coupled to said built-in self test circuit and responsive to said electrical output signal, for indicating the failure of said integrated circuit chip when power is supplied thereto, said visible indicator means including fusible material which becomes activated and changes appearance in response to said electrical output signal, said fusible material being formed as an integral part of a packaging for said integrated circuit chip.
Claim 8
Dependent Claim
132 words
A built-in self test apparatus for providing a visible indication of a failure of an electronic circuit, comprising: an integrated circuit chip; a built-in self test circuit integrally formed within said integrated circuit chip, said built-in self test circuit performing an operational test on said integrated circuit chip and generating an electrical output signal upon sensing a failure of said integrated circuit chip; and visible indicator means, coupled to said built-in self test circuit and responsive to said electrical output signal, for indicating the failure of said integrated circuit chip when power is supplied thereto, said visible indicator means including fusible material which becomes activated and changes appearance in response to said electrical output signal, said fusible material being formed as an integral part of a packaging for said integrated circuit chip.
Claim 9
Dependent Claim
105 words
A built-in self test apparatus for providing a visible indication of a failure of an electronic circuit, comprising: a multi-intergrated circuit chip module having a plurality of intergrated circuit chips; a built-in self test circuit integrally formed within said multi-chip module, said built-in self test circuit performing an operational test on said integrated circuit chips; and visible indicator means coupled to said built-in self test circuit which becomes activated when said built-in self test circuit senses a failure of said intergrated circuit chips when power is supplied thereto, said visible indicator means being formed as an integral part of a packaging for said multi-chip module.
Claim 10
Dependent Claim
105 words
A built-in self test apparatus for providing a visible indication of a failure of an electronic circuit, comprising: a multi-intergrated circuit chip module having a plurality of intergrated circuit chips; a built-in self test circuit integrally formed within said multi-chip module, said built-in self test circuit performing an operational test on said integrated circuit chips; and visible indicator means coupled to said built-in self test circuit which becomes activated when said built-in self test circuit senses a failure of said intergrated circuit chips when power is supplied thereto, said visible indicator means being formed as an integral part of a packaging for said multi-chip module.
Claim 11
Dependent Claim
38 words
The apparatus as defined by claim 7 wherein said built-in self test circuit generates an electrical output signal upon sensing said failure and wherein said visible indicator means is responsive to and becomes activated by said output signal.
Claim 12
Dependent Claim
20 words
The apparatus as defined by claim 8 wherein said visible indicator means comprises a light emitting device producing visible emissions.
Claim 13
Dependent Claim
20 words
The apparatus as defined by claim 9 wherein said light emitting device comprises a light emitting diode producing visible emissions.
Claim 14
Dependent Claim
27 words
The apparatus as defined by claim 8 wherein said visible indicator means includes material which permanently changes appearance upon being activated in response to said output signal.
Claim 15
Dependent Claim
136 words
A built-in self test apparatus for providing a visible indication of a failure of an electronic circuit, comprising: a multi-chip module having a plurality of integrated circuit chips: a built-in self test circuit integrally formed within said multi-chip module, said built-in self test circuit performing an operational test on said integrated circuit chips and generating an electrical output signal upon sensing a failure of said integrated circuit chips; and visible indicator means, coupled to said built-in self test circuit and responsive to said electrical output signal, for indicating the failure of said integrated circuit chips when power is supplied thereto, said visible indicator means including fusible material which becomes activated and changes appearance in response to said electrical output signal said fusible material being formed as an integral part of a packaging for said multi-chip module.
Claim 16
Dependent Claim
136 words
A built-in self test apparatus for providing a visible indication of a failure of an electronic circuit, comprising: a multi-chip module having a plurality of integrated circuit chips: a built-in self test circuit integrally formed within said multi-chip module, said built-in self test circuit performing an operational test on said integrated circuit chips and generating an electrical output signal upon sensing a failure of said integrated circuit chips; and visible indicator means, coupled to said built-in self test circuit and responsive to said electrical output signal, for indicating the failure of said integrated circuit chips when power is supplied thereto, said visible indicator means including fusible material which becomes activated and changes appearance in response to said electrical output signal said fusible material being formed as an integral part of a packaging for said multi-chip module.
References Cited (Backward Citations)
US5270655A
Cited
US5268635A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-10-29 | 2000-04-29 | 2000-10-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-10-29 | 2004-04-29 | 2004-10-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-10-29 | 2008-04-29 | 2008-10-29 | $7700.00 | Window Closed / Lapsed |