US5567653A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Process for aligning etch masks on an integrated circuit surface using electromagnetic energy
Assignee: International Business Machines Corp
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Filing: 1994-09-14
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Granted: 1996-10-22
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Expires: 2014-09-14
Abstract
Abstract Methods for alignment of stacked integrated circuit chips and the resultant three-dimensional semiconductor structures. A thickness control layer is deposited, as needed, on each integrated circuit chip. The thickness of the layer is determined by the thickness of the chip following a grind stage in the fabrication process. Complementary patterns are etched into the thickness control layer of each chip and into adjacent chips. Upon stacking the chips in a three dimensional structure, precise alignment is obtained for interconnect pads which are disposed on the edges of each integrated circuit chip. Dense bus and I/O networks can be thereby supported on a face of the resultant three-dimensional structure.
Inventors
- 👤 Claude L. Bertin
- 👤 John E. Cronin
- 👤 David J. Perlman
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 11:34
CPC Classifications
H; H10; H10W; H10W90/00; H10D; H10D62/00; H10D62/10; H10D62/117; H10W46/00; H10W72/00; H10W72/20; H10W72/241; H10W72/242; H10W72/834; H10W90/20; H10W90/284; Y; Y10; Y10S; Y10S438/00; Y10S438/928; Y10S438/975; Y10S438/977
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
158 words
A method for aligning a pattern formed on a first surface of an integrated circuit chip with a complementary pattern formed on a second surface of said integrated circuit chip, said first surface having devices therebelow, said method comprising the steps of: etching the pattern into said first surface according to a first mask aligned to said devices, said pattern having regions of different heights relative to said first surface; irradiating said first surface with penetrating electromagnetic energy, the penetrating electromagnetic energy being affected by said pattern or said devices Upon passage through said chip; aligning a second mask adjacent said second surface to said pattern including sensing said affected penetrating electromagnetic energy emanating from said second surface and aligning said second mask according to the sensed affected penetrating electromagnetic energy; and etching a complementary pattern into said second surface according to said second mask, said complementary pattern having regions of different heights relative to said second surface.
Claim 2
Independent Claim
158 words
A method for aligning a pattern formed on a first surface of an integrated circuit chip with a complementary pattern formed on a second surface of said integrated circuit chip, said first surface having devices therebelow, said method comprising the steps of: etching the pattern into said first surface according to a first mask aligned to said devices, said pattern having regions of different heights relative to said first surface; irradiating said first surface with penetrating electromagnetic energy, the penetrating electromagnetic energy being affected by said pattern or said devices Upon passage through said chip; aligning a second mask adjacent said second surface to said pattern including sensing said affected penetrating electromagnetic energy emanating from said second surface and aligning said second mask according to the sensed affected penetrating electromagnetic energy; and etching a complementary pattern into said second surface according to said second mask, said complementary pattern having regions of different heights relative to said second surface.
Claim 3
Dependent Claim
50 words
The method of claim 1, further comprising the step of repeating all said steps for each of a plurality of integrated circuit chips such that upon stacking said plurality of integrated circuit chips the patterns and complementary patterns of adjacent ones of said plurality of integrated circuit chips will interlock.
Claim 4
Dependent Claim
52 words
The method of claim 2, further comprising the step of providing electrically conducting pads on corresponding edges of selected ones of said plurality of integrated circuit chips such that upon stacking said plurality of integrated circuit chips said electrically conducting pads are aligned on a module face formed from said corresponding edges.
Claim 5
Dependent Claim
29 words
The method of claim 3, further comprising forming an electrical wiring network on said module face, said electrical wiring network electrically contacting selected ones of said electrically conducting pads.
Claim 6
Dependent Claim
49 words
The method of claim 1, further comprising the steps of: repeating all said steps for each of a plurality of integrated circuit chips; and stacking said plurality of integrated circuit chips such that the patterns and complementary patterns of adjacent ones of said plurality of integrated circuit chips interlock.
Claim 7
Dependent Claim
53 words
The method of claim 5, further comprising the step of providing electrically conducting pads on corresponding edges of at least two of said plurality of integrated circuit chips such that upon stacking said plurality of integrated circuit chips said electrically conducting pads are aligned on a module face formed from said corresponding edges.
Claim 8
Dependent Claim
33 words
The method of claim 6, further comprising the step of forming an electrical wiring network on said module face, said electrical wiring network electrically contacting at least two of said electrically conducting pads.
Claim 9
Dependent Claim
19 words
The method of claim 1, wherein said pattern is etched into a first layer disposed on said first surface.
Claim 10
Dependent Claim
14 words
The method of claim 8, wherein said first layer comprises a thickness control layer.
Claim 11
Dependent Claim
20 words
The method of claim 1, wherein said complementary pattern is etched into a second layer disposed on said second surface.
Claim 12
Dependent Claim
14 words
The method of claim 10, wherein said second layer comprises a thickness control layer.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-10-22 | 2000-04-22 | 2000-10-22 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-10-22 | 2004-04-22 | 2004-10-22 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-10-22 | 2008-04-22 | 2008-10-22 | $7700.00 | Window Closed / Lapsed |