US5561072A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for producing shallow junction in surface region of semiconductor substrate using implantation of plasma ions
Assignee: NEC Electronics Corp
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Filing: 1994-11-21
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Granted: 1996-10-01
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Expires: 2014-11-21
Abstract
Abstract In a method for forming a shallow junction in a surface region of a semiconductor substrate of a first conductive type, first plasma ions of one of Si and Ge is implanted into the surface region of the semiconductor substrate in a vacuum, second plasma ions of one of impurities of a second conductive type is implanted into the surface region of the semiconductor substrate in a vacuum, and, after performing the above-described two implantation steps, the semiconductor substrate is heat treated in a specific condition selected from the same vacuum condition and an inert gas condition. The substrate can be heat-treated in the specific condition within 20 hours after the substrate is brought into the air from the vacuum where the implantation steps have been performed. The first plasma ion implantation is performed prior to the second plasma ion implantation. However, both of them can be performed simultaneously.
Inventors
- 👤 Shuichi Saito
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 13:35
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/021; H10D30/0223; H10P; H10P30/00; H10P30/20; H10P32/00; H10P32/10; H10P32/12; H10P32/1204
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
95 words
A method for forming a shallow junction in a surface region of a semiconductor substrate of a first conductive type, comprising steps of: performing implantation of plasma ions of one of Si or Ge into the surface region of said semiconductor substrate in a vacuum: performing implantation of plasma ions of one of impurities of a second conductive type into the surface region of said semiconductor substrate in a vacuum; heat treating, after performing the above-described two implantation steps, said semiconductor substrate in one condition selected from a vacuum condition and an inert gas condition.
Claim 2
Independent Claim
95 words
A method for forming a shallow junction in a surface region of a semiconductor substrate of a first conductive type, comprising steps of: performing implantation of plasma ions of one of Si or Ge into the surface region of said semiconductor substrate in a vacuum: performing implantation of plasma ions of one of impurities of a second conductive type into the surface region of said semiconductor substrate in a vacuum; heat treating, after performing the above-described two implantation steps, said semiconductor substrate in one condition selected from a vacuum condition and an inert gas condition.
Claim 3
Dependent Claim
37 words
A method as claimed in claim 1, wherein said substrate is heat-treated in said particular condition within 20 hours after said substrate is brought into the atmosphere from the vacuum where said implantation steps have been performed.
Claim 4
Dependent Claim
74 words
A method as claimed in claim 1, wherein said implantation of plasma ions of one of Si or Ge is performed by introducing a gas of SiH 4 , SiF 4 , GeH 4 , or GeF 4 into the vacuum, generating a plasma in an electric field to form ions of Si or Ge, and accelerating said Si or Ge ions to implant said ions into the surface region of said semiconductor substrate.
Claim 5
Dependent Claim
83 words
A method as claimed in claim 1, wherein said implantation of plasma ions of the impurity of a second conductive type is performed by introducing a gas of B 2 H 6 , BF 3 , PH 3 , PF 5 , or AsH 3 into the vacuum, generating a plasma in an electric field to form the impurity ions of P, B, or As, and accelerating said impurity ions to implant said impurity ions into the surface region of said semiconductor substrate.
Claim 6
Dependent Claim
33 words
A method as claimed in claim 1, wherein said implantation of plasma ions of one of Si or Ge is firstly performed, thereafter, said implantation of plasma ions of the impurity is performed.
Claim 7
Dependent Claim
31 words
A method as claimed in claim 1, wherein said implantation or plasma ions of one of Si or Ge and said implantation of plasma ions of the impurity are simultaneously performed.
Claim 8
Dependent Claim
18 words
A method as claimed in claim 4, wherein said electric field is approximately from 0.5 to 4 kilovolts.
Claim 9
Dependent Claim
18 words
A method as claimed in claim 3, wherein said electric field is approximately from 0.5 to 4 kilovolts.
Claim 10
Dependent Claim
33 words
A method as claimed in claim 1, wherein after said two implantation steps, said substrate is maintained in a vacuum or an inert gas until it is subjected to said heat treating step.
References Cited (Backward Citations)
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