Patent US5557209A successfully refreshed from Google Patents.
US5557209A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Identification of pin-open faults by capacitive coupling through the integrated circuit package
Assignee: Agilent Technologies Inc
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Filing: 1995-03-07
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Granted: 1996-09-17
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Expires: 2015-03-07
Abstract
Abstract Disclosed is a system that determines whether input and output pins of semiconductor components are present and properly soldered to a printed circuit board. The system uses an oscillator which supplies a signal, typically ten kilohertz (10 kHz) at 0.2 volts, to the pin under test. A conductive electrode is placed on top of the component package. The electrode is connected to a current measuring device. Another pin of the component is connected to the common signal return. Typically the other pin is chosen to be a power or ground pin of the component.
Inventors
- 👤 David T. Crook
- 👤 Kevin W. Keirn
- 👤 Ugur Cilingiroglu
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 17:12
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/302; G01R31/312; G01R31/50; G01R31/66; G01R31/70; G01R31/71
Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
155 words
A system for measuring the integrity of an electrical contact between a first electrical connection pin of an electrical component and a trace of a circuit assembly, said system comprising: (a) signal supplying means, comprising an output and a common signal return, for supplying an electrical signal via said output to said trace of the circuit assembly; (b) an electrical connection between a second connection pin of said electrical component and said common signal return of said signal supplying means; (c) a conductive electrode comprising a surface adapted to be placed in a fixed position in proximity to a surface of said first pin; and (d) measuring means, operatively coupled to said conductive electrode, for measuring a parameter indicative of a capacitance associated with connection of said first pin to said circuit assembly, said capacitance being indicative of the integrity of the electrical connection between said first pin and said trace of said circuit assembly.
Claim 2
Independent Claim
155 words
A system for measuring the integrity of an electrical contact between a first electrical connection pin of an electrical component and a trace of a circuit assembly, said system comprising: (a) signal supplying means, comprising an output and a common signal return, for supplying an electrical signal via said output to said trace of the circuit assembly; (b) an electrical connection between a second connection pin of said electrical component and said common signal return of said signal supplying means; (c) a conductive electrode comprising a surface adapted to be placed in a fixed position in proximity to a surface of said first pin; and (d) measuring means, operatively coupled to said conductive electrode, for measuring a parameter indicative of a capacitance associated with connection of said first pin to said circuit assembly, said capacitance being indicative of the integrity of the electrical connection between said first pin and said trace of said circuit assembly.
Claim 3
Dependent Claim
23 words
The system of claim 1, further comprising error indicating means for indicating an error condition whenever said parameter is not within predetermined limits.
Claim 4
Dependent Claim
25 words
The system of claim 1, further comprising means for connecting at least one other connection pin of said electrical component to said common signal return.
Claim 5
Dependent Claim
16 words
The system of claim 1, wherein said measuring means comprises means for measuring an electrical current.
Claim 6
Dependent Claim
16 words
The system of claim 1, wherein said measuring means comprises means for measuring an electrical voltage.
Claim 7
Dependent Claim
20 words
The system of claim 1, wherein said measuring means is connected between said common signal return and said conductive electrode.
Claim 8
Independent Claim
158 words
A system for measuring the integrity of an electrical contact between a first electrical connection pin of an electrical component and a trace of a circuit assembly, said system comprising: (a) signal supplying means, comprising an output and a common signal return, for supplying an electrical signal via said output; (b) an electrical connection between a second connection pin of said electrical component and said common signal return of said signal supplying means; (c) a conductive electrode, coupled to said output of said signal supplying means, comprising a surface adapted to be placed in a fixed position in proximity to a surface of said first pin; and (d) measuring means, operatively coupled to said first pin, for measuring a parameter indicative of a capacitance associated with the connection of said first pin to said circuit assembly, said capacitance being indicative of the integrity of the electrical connection between said first pin and said trace of said circuit assembly.
Claim 9
Independent Claim
158 words
A system for measuring the integrity of an electrical contact between a first electrical connection pin of an electrical component and a trace of a circuit assembly, said system comprising: (a) signal supplying means, comprising an output and a common signal return, for supplying an electrical signal via said output; (b) an electrical connection between a second connection pin of said electrical component and said common signal return of said signal supplying means; (c) a conductive electrode, coupled to said output of said signal supplying means, comprising a surface adapted to be placed in a fixed position in proximity to a surface of said first pin; and (d) measuring means, operatively coupled to said first pin, for measuring a parameter indicative of a capacitance associated with the connection of said first pin to said circuit assembly, said capacitance being indicative of the integrity of the electrical connection between said first pin and said trace of said circuit assembly.
Claim 10
Dependent Claim
22 words
The system of claim 7, wherein said measuring means further comprises means for holding said first pin to a virtual ground potential.
Claim 11
Dependent Claim
63 words
The system of claim 8, wherein said measuring means further comprises a measuring operational amplifier and a microprocessor, said operational amplifier comprising an input terminal adapted to receive a signal indicative of said parameter and an output terminal operatively coupled to said microprocessor, said microprocessor comprising means for computing a capacitance value on the basis of an output signal of said operational amplifier.
Claim 12
Dependent Claim
23 words
The system of claim 7, further comprising error indicating means for indicating an error condition whenever said parameter is not within predetermined limits.
Claim 13
Dependent Claim
25 words
The system of claim 7, further comprising means for connecting at least one other connection pin of said electrical component to said common signal return.
Claim 14
Dependent Claim
16 words
The system of claim 7, wherein said measuring means comprises means for measuring an electrical current.
Claim 15
Dependent Claim
16 words
The system of claim 7, wherein said measuring means comprises means for measuring an electrical voltage.
Claim 16
Dependent Claim
20 words
The system of claim 7, wherein said measuring means is connected between said common signal return and said first pin.
Claim 17
Independent Claim
125 words
A method for measuring the integrity of an electrical contact between a first electrical connection pin of an electrical component and a trace of a circuit assembly, said method comprising: (a) supplying an electrical signal to said trace of the circuit assembly; (b) positioning a conductive electrode in a fixed position in proximity to a surface of said first pin; (c) measuring a parameter indicative of a capacitance associated with connection of said first pin to said circuit assembly, said capacitance being indicative of the integrity of the electrical connection between said first pin and said trace of said circuit assembly; and (d) attenuating spurious electrical signals which may inject capacitively into the electrode through pins of said electrical component other than said first pin.
Claim 18
Independent Claim
125 words
A method for measuring the integrity of an electrical contact between a first electrical connection pin of an electrical component and a trace of a circuit assembly, said method comprising: (a) supplying an electrical signal to said trace of the circuit assembly; (b) positioning a conductive electrode in a fixed position in proximity to a surface of said first pin; (c) measuring a parameter indicative of a capacitance associated with connection of said first pin to said circuit assembly, said capacitance being indicative of the integrity of the electrical connection between said first pin and said trace of said circuit assembly; and (d) attenuating spurious electrical signals which may inject capacitively into the electrode through pins of said electrical component other than said first pin.
Claim 19
Dependent Claim
35 words
The method of claim 15 wherein said step of attenuating spurious electrical signals comprises electrically connecting at least one other connection pin of said electrical component to a common signal return of the signal supply.
Claim 20
Dependent Claim
23 words
The method of claim 15 further comprising the step of indicating an error condition whenever said parameter is lower than a predetermined threshold.
Claim 21
Dependent Claim
14 words
The method of claim 15 wherein the measuring step comprises measuring an electrical current.
Claim 22
Dependent Claim
14 words
The method of claim 15 wherein the measuring step comprising measuring an electrical voltage.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-09-17 | 2000-03-18 | 2000-09-17 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-09-17 | 2004-03-18 | 2004-09-17 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-09-17 | 2008-03-18 | 2008-09-17 | $7700.00 | Window Closed / Lapsed |