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US5545589A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of forming a bump having a rugged side, a semiconductor device having the bump, and a method of mounting a semiconductor unit and a semiconductor device

Assignee: Panasonic Holdings Corp
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Filing: 1994-01-27
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Granted: 1996-08-13
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Expires: 2014-01-27
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Abstract

Abstract According to the present invention, a method for forming bumps for electrically connecting electrode pads of a semiconductor device to terminal electrodes formed on a surface of a circuit board respectively, the semiconductor device being mounted facedown on the surface of the circuit board, includes: step a of forming the bumps on the electrode pad of the semiconductor device: step b of placing facedown the semiconductor device on a flat foundation so that the bumps contact with a grind sheet which is fixed to the flat foundation and which has abrasive grind; and step c of conducting ultrasonic vibration on the flat foundation while pressing the semiconductor device against the flat foundation, thereby forming a rugged side in a front end portion of each of the bumps.

Inventors

  • 👤 Yoshihiro Tomura
  • 👤 Yoshihiro Bessho

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 23:08
CPC Classifications
H; H10; H10W; H10W72/00; H10W72/01; H10W72/012; H10W72/20; H10W72/01251; H10W72/071; H10W72/072; H10W72/07251; H10W72/07253; H10W72/074; H10W72/221; H10W72/222; H10W72/223; H10W72/231; H10W72/234; H10W72/241; H10W72/245; H10W72/251; H10W72/252; H10W72/255; H10W72/261; H10W72/30; H10W72/321; H10W72/325; H10W72/351; H10W72/352; H10W72/353; H10W72/354; H10W72/50; H10W72/551; H10W72/552; H10W72/5522; H10W72/5524; H10W72/5525

Claims Analysis

Total Claims: 15
Claim 1
Independent Claim 123 words
A method for forming bumps for electrically connecting electrode pads of a semiconductor device to terminal electrodes formed on a surface of a circuit board respectively, said semiconductor device being mounted facedown on said surface of said circuit board, comprising: step a of forming said bumps on said electrode pad of said semiconductor device; step b of placing facedown said semiconductor device on a flat foundation so that said bumps contact with a grind sheet which is fixed to said flat foundation and which has abrasive grind; and step c of conducting ultrasonic vibration on said flat foundation while pressing said semiconductor device against said flat foundation, thereby forming a plurality of irregularities in a front end portion of each of said bumps.
Claim 2
Independent Claim 123 words
A method for forming bumps for electrically connecting electrode pads of a semiconductor device to terminal electrodes formed on a surface of a circuit board respectively, said semiconductor device being mounted facedown on said surface of said circuit board, comprising: step a of forming said bumps on said electrode pad of said semiconductor device; step b of placing facedown said semiconductor device on a flat foundation so that said bumps contact with a grind sheet which is fixed to said flat foundation and which has abrasive grind; and step c of conducting ultrasonic vibration on said flat foundation while pressing said semiconductor device against said flat foundation, thereby forming a plurality of irregularities in a front end portion of each of said bumps.
Claim 3
Dependent Claim 38 words
A method according to claim 1, wherein said step c includes a step of leveling said bumps to make said bumps a uniform height, said bumps being leveled when said semiconductor device is pressed against said flat foundation.
Claim 4
Dependent Claim 30 words
A method according to claim 1, wherein said bumps are made of a material selected from the group consisting of Au, Cu, Al, solder, or an alloy of these metals.
Claim 5
Dependent Claim 24 words
A method according to claim 1, wherein, in said step a, said bumps are formed on said electrode pads by a ball bonding method.
Claim 6
Dependent Claim 23 words
A method according to claim 1, wherein, in said step a, said bumps are formed by a soldering method or a plating method.
Claim 7
Independent Claim 166 words
A method for mounting a semiconductor device having electrode pads on a surface, on a circuit board having terminal electrodes on a surface, comprising: step a of forming bumps on said electrode pads of said semiconductor device; step b of placing facedown said semiconductor device on a flat foundation so that said bumps contact with a grind sheet which is fixed to said flat foundation and which has abrasive grind; step c of conducting ultrasonic vibration on said flat foundation while pressing said semiconductor device against said flat foundation, thereby forming a plurality of irregularities in a front end portion of each of said bumps; step d of applying a conductive adhesive material to the front end portion of each of said bumps in which a plurality of irregularities is formed; step e of facedown mounting said semiconductor device on said circuit board so that said bumps contact with said terminal electrodes; and step f of curing said conductive adhesive material to form a bonding layer.
Claim 8
Independent Claim 166 words
A method for mounting a semiconductor device having electrode pads on a surface, on a circuit board having terminal electrodes on a surface, comprising: step a of forming bumps on said electrode pads of said semiconductor device; step b of placing facedown said semiconductor device on a flat foundation so that said bumps contact with a grind sheet which is fixed to said flat foundation and which has abrasive grind; step c of conducting ultrasonic vibration on said flat foundation while pressing said semiconductor device against said flat foundation, thereby forming a plurality of irregularities in a front end portion of each of said bumps; step d of applying a conductive adhesive material to the front end portion of each of said bumps in which a plurality of irregularities is formed; step e of facedown mounting said semiconductor device on said circuit board so that said bumps contact with said terminal electrodes; and step f of curing said conductive adhesive material to form a bonding layer.
Claim 9
Dependent Claim 38 words
A method according to claim 6, wherein said step c includes a step of leveling said bumps to make said bumps a uniform height, said bumps being leveled when said semiconductor device is pressed against said flat foundation.
Claim 10
Dependent Claim 30 words
A method according to claim 6, wherein said bumps are made of a material selected from the group consisting of Au, Cu, Al, solder, or an alloy of these metals.
Claim 11
Dependent Claim 24 words
A method according to claim 6, wherein, in said step a, said bumps are formed on said electrode pads by a ball bonding method.
Claim 12
Dependent Claim 23 words
A method according to claim 6, wherein, in said step a, said bumps are formed by a soldering method or a plating method.
Claim 13
Dependent Claim 16 words
A method according to claim 6, wherein said bonding layer is made of a conductive adhesive.
Claim 14
Dependent Claim 17 words
A method according to claim 6, wherein said bonding layer is made of an anisotropic conductive material.
Claim 15
Dependent Claim 28 words
A method according to claim 6 including a step of forming another rugged side at least in a portion of a surface of each of said terminal electrodes.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1999-08-13 2000-02-12 2000-08-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2003-08-13 2004-02-12 2004-08-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2007-08-13 2008-02-12 2008-08-13 $7700.00 Window Closed / Lapsed

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