High voltage semiconductor device having improved electrical ruggedness and reduced cell pitch

Claim 2

A high voltage semiconductor device having improved ruggedness and reduced cell pitch, comprising: a semiconductor substrate of a first electrical conductivity type having a first doping concentration; a first conducting material in conductive relation with said substrate; a bulk region of semiconductor material of a first electrical conductivity type and having a doping concentration less than said first doping concentration, said bulk region being disposed on said substrate and defining a major surface; a second conducting material disposed on said major surface and defining an opening therein; a first impurity region of a second electrical conductivity type having a second doping concentration formed in said bulk region, said first impurity region having a first predetermined depth and a channel portion extending to said major surface, said channel portion being disposed outside said opening and in conducting relation with said second conducting material; a second impurity region of said second electrical conductivity type and having a doping concentration greater than said second doping concentration, said second impurity region being formed in said first impurity region and isolated from said bulk region by said first impurity region, said second impurity region having a second predetermined depth less than said first predetermined depth and a surface area on said major surface defining a second impurity region outer boundary; a third impurity region formed in said first impurity region, said third impurity region being of said first electrical conductivity type and having a third predetermined depth less than said first predetermined depth, said third impurity region having a doping concentration greater than said doping concentration of said bulk region and a surface area on said major surface defining a third impurity region outer boundary, a portion of said third impurity region being in direct physical contact with said channel portion; said second impurity region having a distal portion in direct physical contact with said channel portion and a proximal portion in direct physical contact with said third impurity region and, wherein a portion of said outer boundary of said second impurity region defines an edge of said distal portion, said edge extending on said major surface beyond said boundary of said third impurity region; an insulating material disposed on said first conducting material; and a third conducting material disposed on said insulating material and in conductive relation with said second and third impurity regions.

Claim 3

The device of claim 1, wherein said proximal portion of said second impurity region includes an enlarged portion disposed in direct physical contact with said channel portion.

Claim 4

A high voltage semiconductor device having improved ruggedness and reduced cell pitch, comprising: a semiconductor substrate of a first electrical conductivity type having a first doping concentration; a first conducting material in conductive relation with said substrate; a bulk region of semiconductor material of a first electrical conductivity type and having a doping concentration less than said first doping concentration, said bulk region being disposed on said substrate and defining a major surface; a second conducting material disposed on said major surface and defining an opening therein; a first impurity region of a second electrical conductivity type having a second doping concentration formed in said bulk region, said first impurity region having a first predetermined depth and a channel portion extending to said major surface, said channel portion being disposed outside said opening and in conducting relation with said second conducting material; a second impurity region of said second electrical conductivity type having a doping concentration greater than said second doping concentration, said second impurity region being formed in said first impurity region and isolated from said bulk region by said first impurity region, said second impurity region having a second predetermined depth less than said first predetermined depth, a surface area on said major surface defining a second impurity region outer boundary, a distal portion in direct physical contact with said channel portion, and a proximal portion; third and fourth impurity regions formed in said first impurity region on either side of said second impurity region and in direct physical contact and in conducting relation with said proximal portion of said second impurity region, said third and fourth impurity regions being of said first electrical conductivity type, each having a predetermined depth less than said first predetermined depth, a doping concentration greater than said doping concentration of said bulk region, a portion in direct physical contact with said channel portion, and surface areas on said major surface defining third and fourth impurity region outer boundaries; wherein a portion of said outer boundary of said second impurity region defines an edge of said distal portion, said edge extending on said major surface beyond said boundaries of said third and said fourth impurity regions; an insulating material disposed on said second conducting material; and a third conducting material disposed on said insulating material and in conductive relation with said second, third and fourth impurity regions.

Claim 5

A high voltage semiconductor device having improved ruggedness and reduced cell pitch, comprising: a semiconductor substrate of a first electrical conductivity type having a first doping concentration; a first conducting material in conductive relation with said substrate; a bulk region of semiconductor material of a first electrical conductivity type and having a doping concentration less than said first doping concentration, said bulk region being disposed on said substrate and defining a major surface; a second conducting material disposed on said major surface and defining an opening therein; a first impurity region of a second electrical conductivity type having a second doping concentration formed in said bulk region, said first impurity region having a first predetermined depth and a channel portion extending to said major surface, said channel portion being disposed outside said opening and in conducting relation with said second conducting material; a second impurity region of said second electrical conductivity type having a doping concentration greater than said second doping concentration, said second impurity region being formed in said first impurity region and isolated from said bulk region by said first impurity region, said second impurity region having a second predetermined depth less than said first predetermined depth, a surface area on said major surface defining a second impurity region outer boundary, a distal portion in direct physical contact with said channel portion, and a proximal portion; third and fourth impurity regions formed in said first impurity region on either side of said second impurity region and in direct physical contact and in conducting relation with said proximal portion of said second impurity region, said third and fourth impurity regions being of said first electrical conductivity type, each having a predetermined depth less than said first predetermined depth, a doping concentration greater than said doping concentration of said bulk region, a portion in direct physical contact with said channel portion, and surface areas on said major surface defining third and fourth impurity region outer boundaries; wherein a portion of said outer boundary of said second impurity region defines an edge of said distal portion, said edge extending on said major surface beyond said boundaries of said third and said fourth impurity regions; an insulating material disposed on said second conducting material; and a third conducting material disposed on said insulating material and in conductive relation with said second, third and fourth impurity regions.

Claim 6

The device of claim 3, wherein said proximal portion of said second impurity region includes a central, elongate portion and wherein said third and fourth impurity regions are disposed on either side of said central, elongate portion.

Claim 7

The device of claim 4, wherein said proximal portion of said second impurity region includes an enlarged portion disposed at one end of said central, elongate portion and in direct physical contact with said channel portion.

Claim 8

The device of claim 5, wherein said enlarged portion comprises two enlarged portions, one disposed at one end of said elongated portion and another disposed at another end of said elongated portion.