Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
210 words
Diagnostic circuit for amperometrically determining the current passing through a sensor (41), comprising a current source (V+, 46) for passing a constant DC current through said sensor (41), switching means (45) for selectively operating said current source, comparing means (42) for comparing the potential difference (V BS ) across said sensor to a reference voltage (V ref ), and producing a control signal (D) having a first logic level when said potential difference is less than said reference voltage (V ref ) and a second logic level when said potential difference is greater than said reference voltage (V ref ), control means (44) for providing a switching signal (Q) having said first logic level in response to said control signal (D) having said first logic level and said second logic level in response to said control signal (D) having said second logic level, said switching means (45) being caused to operate when said switching signal (Q) is in said first logic level, and timing means (48,49) for measuring the cumulative time during which said switching signal (Q) has said first logic level during a selected time interval, so as to provide an output signal (50) indicative of a mean value of current (I bs ave) passing through said sensor (41).
Claim 2
Dependent Claim
210 words
Diagnostic circuit for amperometrically determining the current passing through a sensor (41), comprising a current source (V+, 46) for passing a constant DC current through said sensor (41), switching means (45) for selectively operating said current source, comparing means (42) for comparing the potential difference (V BS ) across said sensor to a reference voltage (V ref ), and producing a control signal (D) having a first logic level when said potential difference is less than said reference voltage (V ref ) and a second logic level when said potential difference is greater than said reference voltage (V ref ), control means (44) for providing a switching signal (Q) having said first logic level in response to said control signal (D) having said first logic level and said second logic level in response to said control signal (D) having said second logic level, said switching means (45) being caused to operate when said switching signal (Q) is in said first logic level, and timing means (48,49) for measuring the cumulative time during which said switching signal (Q) has said first logic level during a selected time interval, so as to provide an output signal (50) indicative of a mean value of current (I bs ave) passing through said sensor (41).
Claim 3
Dependent Claim
69 words
Diagnostic circuit according to claim 1, said control means comprising a clock signal (CLOCK) having a known number of cycles per second, a latching circuit (44) for maintaining the logic level of said switching signal (Q) during each clock cycle, said timing means comprising a counting circuit (48) for counting the number of cycles during which said switching signal (Q) has said first logic level during said time interval.
Claim 4
Dependent Claim
139 words
A method of amperometrically determining the current passing through a sensor using the diagnostic circuit according to claim 2, said method comprising the following steps: (a) replacing said sensor (41) with a calibration element (51 ) of known resistance, (b) measuring a first cumulative time (NQ1cal) during which said switching signal (Q) is at said first logic level during said time interval so as to determine a calibration factor (Xcal), (c) replacing said calibration element (51) with said sensor (41), (d) measuring a second cumulative time (NQ1mes) during which said switching signal is at said first logic level during said time interval, and (e) multiplying said second cumulative time (NQ1mes) by said calibration factor (Xcal) so as to provide an output signal indicative of the mean current (l bs ave) passing through the sensor (41) during said time interval.
Claim 5
Dependent Claim
32 words
The method according to claim 3, wherein steps (b) and (d) comprise counting the number of cycles, during said time interval, when said switching signal (Q) is in said first logic level.
Claim 6
Dependent Claim
79 words
Diagnostic circuit according to claim 2, said current source comprising a voltage source (V+) for supplying a constant DC voltage, a resistance element (46) connected between said voltage source (v+) and said sensor (41), said switching means (45) being selectively operated so as to maintain the potential difference across said sensor (41) at a substantially constant level and thus supply a substantially constant DC current (I BS ) to said sensor (41) when said switching means (45) is operated.
Claim 7
Dependent Claim
20 words
Diagnostic circuit according to claim 5, and further comprising a capacitive element (47) connected in parallel with said sensor (41).
Claim 8
Dependent Claim
20 words
Diagnostic circuit according to claim 5, wherein said switching means (45) is connected in series with said resistance element (46).
Claim 9
Dependent Claim
21 words
Diagnostic circuit according to claim 7, wherein said switching means (45) has a resistance substantially less than said resistance element (46).
Claim 10
Dependent Claim
41 words
Diagnostic circuit according to claim 1, wherein said control means comprises a D-latch (44) having a D input and a Q output, said control signal being supplied to said D input and said switching signal being supplied by said Q output.
Claim 11
Dependent Claim
31 words
Diagnostic circuit according to claim 9, wherein said timing means (48,49) counts the number of clock cycles, during said time interval, when said Q output is at said first logic level.
Claim 12
Dependent Claim
138 words
A method of amperometrically determining the current passing through a sensor using the diagnostic circuit according to claim 10, said method comprising the following steps: (a) replacing said sensor (41) with a calibration element (51) of known resistance, (b) measuring a first cumulative time (NQ1cal) during which said switching signal (Q) is at said first logic level during said time interval so as to determine a calibration factor (Xcal), (c) replacing said calibration element (51) with said sensor (41), (d) measuring a second cumulative time (NQ1mes) during which said switching signal is at said first logic level during said time interval, and (e) multiplying said second cumulative time (NQ1mes) by said calibration factor (Xcal) so as to provide an output signal indicative of the mean current (I bs ave) passing through the sensor (41) during said time interval.
Claim 13
Dependent Claim
33 words
The method according to claim 11, wherein steps (b) and (d) comprise counting the number of clock cycles during which said Q output is in said first logic level during said time interval.
Claim 14
Dependent Claim
137 words
A method of amperometrically determining the current passing through a sensor using a diagnostic circuit according to claim 1, said method comprising the following steps: (a) replacing said sensor (41) with a calibration element (51) of known resistance, (b) measuring a first cumulative time (NQ1cal) during which said switching signal (Q) is at said first logic level during said time interval so as to determine a calibration factor (Xcal), (c) replacing said calibration element (51) with said sensor (41), (d) measuring a second cumulative time (NQ1mes) during which said switching signal is at said first logic level during said time interval, (e) multiplying said second cumulative time (NQ1mes) by said calibration factor (Xcal) so as to provide an output signal indicative of the mean current (I bs ave) passing through said sensor (41) during said time interval.