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US5530668A Expired / Lapsed US ⏱️ 0.0 years remaining

Ferroelectric memory sensing scheme using bit lines precharged to a logic one voltage

Assignee: Cypress Semiconductor Corp
•
Filing: 1995-04-12
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Granted: 1996-06-25
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Expires: 2015-04-12
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Abstract

Abstract In a ferroelectric memory cell having a plate line, a word line and a bit line coupled to a sense amplifier, a sensing method includes the steps of precharging the bit line to a logic one voltage, setting the word and plate lines to an initial logic zero voltage, stepping the word line from the initial logic zero voltage to the logic one voltage, stepping the plate line from the initial logic zero voltage to the logic one voltage, activating the sense amplifier to resolve voltage developed on the bit line to a full logic voltage while the word and plate lines are at the logic one voltage, and returning the word and plate lines to the initial logic zero voltage.

Inventors

  • 👤 Wen-Foo Chern
  • 👤 Dennis Wilson

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 02:05
CPC Classifications
G; G11; G11C; G11C11/00; G11C11/21; G11C11/22

Claims Analysis

Total Claims: 15
Claim 1
Independent Claim 146 words
In a ferroelectric memory cell having a plate line, a word line, and a bit line, the bit line being coupled to a sense amplifier, a sensing method comprising the steps of: biasing all N-wells in the sense amplifier to a voltage greater than the most positive voltage excursion of the bit line; precharging the bit line to a logic one voltage; setting the word and plate lines to an initial logic zero voltage; stepping the word line from the initial logic zero voltage to the logic one voltage; stepping the plate line from the initial logic zero voltage to the logic one voltage; activating the sense amplifier to resolve voltage developed on the bit line to a full logic voltage while the word and plate lines are at the logic one voltage; and returning the word and plate lines to the initial logic zero voltage.
Claim 2
Dependent Claim 146 words
In a ferroelectric memory cell having a plate line, a word line, and a bit line, the bit line being coupled to a sense amplifier, a sensing method comprising the steps of: biasing all N-wells in the sense amplifier to a voltage greater than the most positive voltage excursion of the bit line; precharging the bit line to a logic one voltage; setting the word and plate lines to an initial logic zero voltage; stepping the word line from the initial logic zero voltage to the logic one voltage; stepping the plate line from the initial logic zero voltage to the logic one voltage; activating the sense amplifier to resolve voltage developed on the bit line to a full logic voltage while the word and plate lines are at the logic one voltage; and returning the word and plate lines to the initial logic zero voltage.
Claim 3
Dependent Claim 53 words
The method of claim 1 in which the step of stepping the word line voltage from the initial logic zero voltage to the logic one voltage comprises the step of stepping the word line voltage from the initial logic zero voltage to a bootstrapped logic one voltage greater than the logic one voltage.
Claim 4
Dependent Claim 23 words
The method of claim 1 further comprising the step of coupling the bit line to a sense amplifier comprised solely of N-channel transistors.
Claim 5
Dependent Claim 145 words
In a ferroelectric memory cell having a plate line, a word line, and a bit line, the bit line being coupled to a sense amplifier, a sensing method comprising the steps of: biasing all N-wells in the sense amplifier to a voltage greater than the most positive voltage excursion of the bit line; precharging the bit line to a logic one voltage; setting the word and plate lines to an initial logic zero voltage; stepping the word line from the initial logic zero voltage to the logic one voltage; activating the sense amplifier to resolve voltage developed on the bit line to a full logic voltage while the word line is at the logic one voltage and the plate line is at the logic zero voltage; pulsing the plate line with a positive-going pulse; and returning the word line to the initial logic zero voltage.
Claim 6
Dependent Claim 145 words
In a ferroelectric memory cell having a plate line, a word line, and a bit line, the bit line being coupled to a sense amplifier, a sensing method comprising the steps of: biasing all N-wells in the sense amplifier to a voltage greater than the most positive voltage excursion of the bit line; precharging the bit line to a logic one voltage; setting the word and plate lines to an initial logic zero voltage; stepping the word line from the initial logic zero voltage to the logic one voltage; activating the sense amplifier to resolve voltage developed on the bit line to a full logic voltage while the word line is at the logic one voltage and the plate line is at the logic zero voltage; pulsing the plate line with a positive-going pulse; and returning the word line to the initial logic zero voltage.
Claim 7
Dependent Claim 53 words
The method of claim 4 in which the step of stepping the word line voltage from the initial logic zero voltage to the logic one voltage comprises the step of stepping the word line voltage from the initial logic zero voltage to a bootstrapped logic one voltage greater than the logic one voltage.
Claim 8
Independent Claim 22 words
The method of claim 4further comprising the step of coupling the bit line to a sense amplifier comprised solely of N-channel transistors.
Claim 9
Dependent Claim 134 words
In a ferroelectric memory cell having a plate line, a word line, and a bit line, the bit line being coupled to a sense amplifier, a sensing method comprising the steps of: precharging the bit line to a power supply voltage, the power supply voltage representing a logic one voltage; setting the word and plate lines to an initial logic zero voltage; stepping the word line from the initial logic zero voltage to the logic one voltage; stepping the plate line from the initial logic zero voltage to the logic one voltage; activating the sense amplifier to resolve voltage developed on the bit line to a full logic voltage while the word and plate lines are at the logic one voltage; and returning the word and plate lines to the initial logic zero voltage.
Claim 10
Dependent Claim 134 words
In a ferroelectric memory cell having a plate line, a word line, and a bit line, the bit line being coupled to a sense amplifier, a sensing method comprising the steps of: precharging the bit line to a power supply voltage, the power supply voltage representing a logic one voltage; setting the word and plate lines to an initial logic zero voltage; stepping the word line from the initial logic zero voltage to the logic one voltage; stepping the plate line from the initial logic zero voltage to the logic one voltage; activating the sense amplifier to resolve voltage developed on the bit line to a full logic voltage while the word and plate lines are at the logic one voltage; and returning the word and plate lines to the initial logic zero voltage.
Claim 11
Dependent Claim 26 words
The method of claim 7 in which the precharging step comprises the step of precharging the bit line to a power supply voltage of five volts.
Claim 12
Dependent Claim 26 words
The method of claim 7 in which the precharging step comprises the step of precharging the bit line to a power supply voltage of 3.3 volts.
Claim 13
Dependent Claim 53 words
The method of claim 7 in which the step of stepping the word line voltage from the initial logic zero voltage to the logic one voltage comprises the step of stepping the word line voltage from the initial logic zero voltage to a bootstrapped logic one voltage greater than the logic one voltage.
Claim 14
Dependent Claim 31 words
The method of claim 7 further comprising the step of biasing all N-wells in the sense amplifier to a voltage greater than the most positive voltage excursion of the bit line.
Claim 15
Dependent Claim 23 words
The method of claim 7 further comprising the step of coupling the bit line to a sense amplifier comprised solely of N-channel transistors.

References Cited (Backward Citations)

US4918654A Cited
US5029128A Cited
US5121353A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1999-06-25 1999-12-25 2000-06-25 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2003-06-25 2003-12-25 2004-06-25 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2007-06-25 2007-12-25 2008-06-25 $7700.00 Window Closed / Lapsed

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