Patent US5516713A successfully refreshed from Google Patents.
US5516713A
Expired / Lapsed
US
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Method of making high coupling ratio NAND type flash memory
Assignee: United Microelectronics Corp
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Filing: 1994-09-06
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Granted: 1996-05-14
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Expires: 2014-09-06
Abstract
Abstract A new method of fabricating a high coupling ratio Flash EEPROM memory cell is described. A layer of silicon dioxide is grown over the surface of a semiconductor substrate. A layer of silicon nitride is deposited over the silicon dioxide layer and patterned. Silicon nitride spacers are formed on the sidewalls of the patterned silicon nitride layer. The silicon dioxide layer not covered by the patterned silicon nitride layer and the silicon nitride spacers is removed thereby exposing portions of the semiconductor substrate as tunneling windows. A tunnel oxide layer is grown on the exposed portions of the semiconductor substrate. The silicon nitride layer and spacers are removed. A first polysilicon layer is deposited over the surface of the silicon dioxide and tunnel oxide layers and patterned to form a floating gate. An interpoly dielectric layer is deposited over the patterned first polysilicon layer followed by a second polysilicon layer which is patterned to form a control gate. Passivation and metallization complete the fabrication of the NAND type memory cell with improved coupling ratio.
Inventors
- 👤 Chen-Chiu Hsue
- 👤 Ming-Tzong Yang
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 15:32
CPC Classifications
H; H10; H10B; H10B41/00; H10B41/30
Claims Analysis
Total Claims: 21
Claim 1
Independent Claim
191 words
The method of forming a memory cell with improved coupling ratio comprising: providing a layer of silicon dioxide over the surface of a semiconductor substrate; depositing a layer of silicon nitride over said silicon dioxide layer and patterning said silicon nitride layer; forming silicon nitride spacers on the sidewalls of said patterned silicon nitride layer whereby a portion of said silicon dixoide layer is covered with silicon nitride; removing said silicon dioxide layer not covered by said patterned silicon nitride layer and said silicon nitride spacers wherein portions of said semiconductor substrate are exposed; thereafter growing a tunnel oxide layer on said exposed portions of said semiconductor substrate; removing said silicon nitride spacers and said silicon nitride layer; depositing a first polysilicon layer over the surface of said silicon dioxide and said tunnel oxide layers and patterning said first polysilicon layer to form a floating gate; depositing a dielectric layer over said patterned first polysilicon layer; depositing a conductive layer overlying said dielectric layer and patterning said conducting layer to form a control gate; and providing passivation and metallization to complete the fabrication of said memory cell with improved coupling ratio.
Claim 2
Independent Claim
191 words
The method of forming a memory cell with improved coupling ratio comprising: providing a layer of silicon dioxide over the surface of a semiconductor substrate; depositing a layer of silicon nitride over said silicon dioxide layer and patterning said silicon nitride layer; forming silicon nitride spacers on the sidewalls of said patterned silicon nitride layer whereby a portion of said silicon dixoide layer is covered with silicon nitride; removing said silicon dioxide layer not covered by said patterned silicon nitride layer and said silicon nitride spacers wherein portions of said semiconductor substrate are exposed; thereafter growing a tunnel oxide layer on said exposed portions of said semiconductor substrate; removing said silicon nitride spacers and said silicon nitride layer; depositing a first polysilicon layer over the surface of said silicon dioxide and said tunnel oxide layers and patterning said first polysilicon layer to form a floating gate; depositing a dielectric layer over said patterned first polysilicon layer; depositing a conductive layer overlying said dielectric layer and patterning said conducting layer to form a control gate; and providing passivation and metallization to complete the fabrication of said memory cell with improved coupling ratio.
Claim 3
Dependent Claim
22 words
The method of claim 1 wherein said silicon dioxide layer is grown to a thickness of between about 200 to 400 Angstroms.
Claim 4
Dependent Claim
20 words
The method of claim 1 wherein said silicon nitride layer has a thickness of between about 1000 to 2000 Angstroms.
Claim 5
Dependent Claim
20 words
The method of claim 1 wherein said silicon nitride spacers have a width of between about 500 to 3000 Angstroms.
Claim 6
Dependent Claim
29 words
The method of claim 1 wherein said exposed portions of said semiconductor substrate have an elongated shape wherein two opposing sides are longer than the other two opposing sides.
Claim 7
Dependent Claim
31 words
The method of claim 1 wherein said tunnel oxide is grown to a thickness of between about 60 to 100 Angstroms before said silicon nitride layer and spacers have been removed.
Claim 8
Dependent Claim
22 words
The method of claim 1 wherein said first polysilicon layer is deposited to a thickness of between about 1000 to 3000 Angstroms.
Claim 9
Dependent Claim
20 words
The method of claim 1 wherein said dielectric layer is composed of silicon oxide, silicon nitride, and silicon oxide layers.
Claim 10
Dependent Claim
25 words
The method of claim 1 wherein said conducting layer is composed of doped polysilicon deposited to a thickness of between about 2000 to 5000 Angstroms.
Claim 11
Dependent Claim
13 words
The method of claim 1 wherein said conducting layer is a polycide layer.
Claim 12
Independent Claim
201 words
The method of forming a memory cell with improved coupling ratio comprising: providing a layer of silicon dioxide over the surface of a semiconductor substrate; depositing a layer of silicon nitride over said silicon dioxide layer and patterning said silicon nitride layer; forming silicon nitride spacers on the sidewalls of said patterned silicon nitride layer whereby a portion of said silicon dioxide layer is covered with silicon nitride; removing said silicon dioxide layer not covered by said patterned silicon nitride layer and said silicon nitride spacers wherein portions of said semiconductor substrate are exposed; removing said silicon nitride spacers and said silicon nitride layer; thereafter growing a tunnel oxide layer on said exposed portions of said semiconductor substrate to a thickness of between about 60 to 100 Angstroms; depositing a first polysilicon layer over the surface of said silicon dioxide and said tunnel oxide layers and patterning said first polysilicon layer to form a floating gate; depositing a dielectric layer over said patterned first polysilicon layer; depositing a conducting layer overlying said dielectric layer and patterning said conducting layer to form a control gate; and providing passivation and metallization to complete the fabrication of said memory cell with improved coupling ratio.
Claim 13
Independent Claim
201 words
The method of forming a memory cell with improved coupling ratio comprising: providing a layer of silicon dioxide over the surface of a semiconductor substrate; depositing a layer of silicon nitride over said silicon dioxide layer and patterning said silicon nitride layer; forming silicon nitride spacers on the sidewalls of said patterned silicon nitride layer whereby a portion of said silicon dioxide layer is covered with silicon nitride; removing said silicon dioxide layer not covered by said patterned silicon nitride layer and said silicon nitride spacers wherein portions of said semiconductor substrate are exposed; removing said silicon nitride spacers and said silicon nitride layer; thereafter growing a tunnel oxide layer on said exposed portions of said semiconductor substrate to a thickness of between about 60 to 100 Angstroms; depositing a first polysilicon layer over the surface of said silicon dioxide and said tunnel oxide layers and patterning said first polysilicon layer to form a floating gate; depositing a dielectric layer over said patterned first polysilicon layer; depositing a conducting layer overlying said dielectric layer and patterning said conducting layer to form a control gate; and providing passivation and metallization to complete the fabrication of said memory cell with improved coupling ratio.
Claim 14
Dependent Claim
22 words
The method of claim 11 wherein said silicon dioxide layer is grown to a thickness of between about 200 to 400 Angstroms.
Claim 15
Dependent Claim
23 words
The method of claim 11 wherein said exposed portions of said semiconductor substrate have a shape wherein there are four approximately equal sides.
Claim 16
Dependent Claim
29 words
The method of claim 11 wherein said exposed portions of said semiconductor substrate have an elongated shape wherein two opposing sides are longer than the other two opposing sides.
Claim 17
Independent Claim
210 words
The method of forming a memory cell with improved coupling ratio comprising: providing a layer of silicon dioxide over the surface of a semiconductor substrate; depositing a layer of silicon nitride over said silicon dioxide layer and patterning said silicon nitride layer; forming silicon nitride spacers on the sidewalls of said patterned silicon nitride layer whereby a portion of said silicon dioxide layer is covered with silicon nitride; removing said silicon dioxide layer not covered by said patterned silicon nitride layer and said silicon nitride spacers wherein portions of said semiconductor substrate are exposed and wherein said exposed portions of said semiconductor substrate have a shape wherein there are four approximately equal sides; thereafter growing a tunnel oxide layer on said exposed portions of said semiconductor substrate; removing said silicon nitride spacers and said silicon nitride layer; depositing a first polysilicon layer over the surface of said silicon dioxide and said tunnel oxide layers and patterning said first polysilicon layer to form a floating gate; depositing a dielectric layer over said patterned first polysilicon layer; depositing a conducting layer overlying said dielectric layer and patterning said conducting layer to form a control gate; and providing passivation and metallization to complete the fabrication of said memory cell with improved coupling ratio.
Claim 18
Independent Claim
210 words
The method of forming a memory cell with improved coupling ratio comprising: providing a layer of silicon dioxide over the surface of a semiconductor substrate; depositing a layer of silicon nitride over said silicon dioxide layer and patterning said silicon nitride layer; forming silicon nitride spacers on the sidewalls of said patterned silicon nitride layer whereby a portion of said silicon dioxide layer is covered with silicon nitride; removing said silicon dioxide layer not covered by said patterned silicon nitride layer and said silicon nitride spacers wherein portions of said semiconductor substrate are exposed and wherein said exposed portions of said semiconductor substrate have a shape wherein there are four approximately equal sides; thereafter growing a tunnel oxide layer on said exposed portions of said semiconductor substrate; removing said silicon nitride spacers and said silicon nitride layer; depositing a first polysilicon layer over the surface of said silicon dioxide and said tunnel oxide layers and patterning said first polysilicon layer to form a floating gate; depositing a dielectric layer over said patterned first polysilicon layer; depositing a conducting layer overlying said dielectric layer and patterning said conducting layer to form a control gate; and providing passivation and metallization to complete the fabrication of said memory cell with improved coupling ratio.
Claim 19
Dependent Claim
22 words
The method of claim 15 wherein said silicon dioxide layer is grown to a thickness of between about 200 to 400 Angstroms.
Claim 20
Dependent Claim
31 words
The method of claim 15 wherein said tunnel oxide is grown to a thickness of between about 60 to 100 Angstroms after said silicon nitride layer and spacers have been removed.
Claim 21
Dependent Claim
31 words
The method of claim 15 wherein said tunnel oxide is grown to a thickness of between about 60 to 100 Angstroms before said silicon nitride layer and spacers have been removed.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-05-14 | 1999-11-13 | 2000-05-14 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-05-14 | 2003-11-13 | 2004-05-14 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-05-14 | 2007-11-13 | 2008-05-14 | $7700.00 | Window Closed / Lapsed |