US5514609A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Through glass ROM code implant to reduce product delivering time
Assignee: Promos Technologies Inc
•
Filing: 1994-05-13
•
Granted: 1996-05-07
•
Expires: 2014-05-13
Abstract
Abstract A read only memory semiconductor integrated circuit device includes an improved cell region and a method of manufacture therefor. The improved cell region includes a recessed dielectric region overlying a gate electrode region. Such recessed dielectric region allows for an implanting or coding step to occur after the dielectric layer is applied to the surface of the device. Coding of the ROM device during a latter processing step shortens product turn-around-time. The improved cell also includes an improved method of manufacture. Such method provides for a dielectric layer formed over a gate electrode of a partially completed device. The method further provides etching the upper portion of the dielectric layer overlying the gate electrode to form a recessed region. A step of coding or implanting is then performed to change the device from enhancement mode into depletion mode, thereby providing the ROM code for the designated cell.
Inventors
- 👤 Min-Liang Chen
- 👤 Ying-Kit Tsui
- 👤 Jau-Nan Kau
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 08:54
CPC Classifications
H; H10; H10B; H10B20/00; H10B20/27; H10B20/30; H10B20/38; H10B20/383
Claims Analysis
Total Claims: 34
Claim 1
Independent Claim
110 words
A method of forming a semiconductor device comprising the steps of: providing a partially completed semiconductor device comprising at least a gate electrode and a channel region; forming a dielectric layer overlying said gate electrode, said dielectric layer comprising a BPSG layer overlying an oxide layer; removing a thickness of said dielectric layer overlying said gate electrode to form a dielectric layer comprising a recessed region; implanting impurities through said recessed region and through at least a portion of said gate electrode; and annealing said implant; wherein said BPSG layer and oxide layer after said removing step have a combined thickness ranging from about 1,500 Å to about 2,500 Å.
Claim 2
Independent Claim
110 words
A method of forming a semiconductor device comprising the steps of: providing a partially completed semiconductor device comprising at least a gate electrode and a channel region; forming a dielectric layer overlying said gate electrode, said dielectric layer comprising a BPSG layer overlying an oxide layer; removing a thickness of said dielectric layer overlying said gate electrode to form a dielectric layer comprising a recessed region; implanting impurities through said recessed region and through at least a portion of said gate electrode; and annealing said implant; wherein said BPSG layer and oxide layer after said removing step have a combined thickness ranging from about 1,500 Å to about 2,500 Å.
Claim 3
Independent Claim
94 words
A method of manufacturing an integrated circuit device comprising the steps of: providing a partially completed semiconductor device comprising a gate electrode, a channel region, a source region, and a drain region; forming a dielectric layer overlying said gate electrode, said source region, and said drain region; exposing said source region and said drain region; forming contact plugs on said exposed source region and said exposed drain region; forming a recessed region on a portion of said dielectric layer overlying said gate layer; and implanting impurities through said recessed region and said gate electrode.
Claim 4
Independent Claim
94 words
A method of manufacturing an integrated circuit device comprising the steps of: providing a partially completed semiconductor device comprising a gate electrode, a channel region, a source region, and a drain region; forming a dielectric layer overlying said gate electrode, said source region, and said drain region; exposing said source region and said drain region; forming contact plugs on said exposed source region and said exposed drain region; forming a recessed region on a portion of said dielectric layer overlying said gate layer; and implanting impurities through said recessed region and said gate electrode.
Claim 5
Dependent Claim
13 words
The method of claim 2 further comprising a step of annealing said implant.
Claim 6
Dependent Claim
19 words
The method of claim 2 wherein said impurities are impurities having an absolute charge greater than one electron volt.
Claim 7
Dependent Claim
17 words
The method of claim 4 wherein said implanting step is at an energy greater than 150 KeV.
Claim 8
Dependent Claim
17 words
The method of claim 2 wherein said dielectric layer is a BPSG layer overlying an oxide layer.
Claim 9
Dependent Claim
29 words
The method of claim 6 wherein said BPSG layer and oxide layer at said recessed region have a combined thickness ranging from about 1,500 Å to about 2,500 Å.
Claim 10
Dependent Claim
19 words
The method of claim 2 wherein said partially completed semiconductor device is an MOS device for a ROM cell.
Claim 11
Dependent Claim
35 words
The method of claim 2 further comprising a step of forming a masking layer overlying said dielectric layer before said recessed region forming step, said masking layer having an exposed region over said gate electrode.
Claim 12
Dependent Claim
19 words
The method of claim 2 wherein said impurities are selected from the group consisting of boron, phosphorous, and arsenic.
Claim 13
Dependent Claim
16 words
The method of claim 2 wherein said recessed region forming step is an anisotropic etching step.
Claim 14
Independent Claim
80 words
A method of implanting impurities in an integrated circuit device comprising the steps of: providing a partially completed semiconductor device comprising a polysilicon layer overlying a substrate; forming a dielectric layer overlying said polysilicon layer; forming a recessed region on a portion of said dielectric layer overlying said polysilicon layer; implanting impurities comprising an absolute charge greater than one electron volt through said recessed region and said polysilicon layer; and annealing said implant to drive-in said impurities into said substrate.
Claim 15
Independent Claim
80 words
A method of implanting impurities in an integrated circuit device comprising the steps of: providing a partially completed semiconductor device comprising a polysilicon layer overlying a substrate; forming a dielectric layer overlying said polysilicon layer; forming a recessed region on a portion of said dielectric layer overlying said polysilicon layer; implanting impurities comprising an absolute charge greater than one electron volt through said recessed region and said polysilicon layer; and annealing said implant to drive-in said impurities into said substrate.
Claim 16
Independent Claim
104 words
A method of making a read only memory comprising the steps of: forming MOS transistors in a ROM region of an integrated circuit, said MOS transistors comprising a dielectric layer thereon, said dielectric layer comprising a BPSG layer overlying an oxide layer; storing said integrated circuit; and programming said ROM region by the steps of etching a thickness of said dielectric layer from gate regions of selected MOS transistors and implanting impurities through said gate regions into channel regions of said selected MOS transistors, wherein said BPSG layer and oxide layer have a combined thickness ranging from about 1,500 Å to about 2,500 Å.
Claim 17
Independent Claim
104 words
A method of making a read only memory comprising the steps of: forming MOS transistors in a ROM region of an integrated circuit, said MOS transistors comprising a dielectric layer thereon, said dielectric layer comprising a BPSG layer overlying an oxide layer; storing said integrated circuit; and programming said ROM region by the steps of etching a thickness of said dielectric layer from gate regions of selected MOS transistors and implanting impurities through said gate regions into channel regions of said selected MOS transistors, wherein said BPSG layer and oxide layer have a combined thickness ranging from about 1,500 Å to about 2,500 Å.
Claim 18
Dependent Claim
19 words
The method of claim 1 wherein said impurities are impurities having an absolute charge greater than one electron volt.
Claim 19
Dependent Claim
17 words
The method of claim 14 wherein said implanting step is at an energy greater than 150 keV.
Claim 20
Dependent Claim
19 words
The method of claim 1 wherein said partially completed semiconductor device is an MOS device for a ROM cell.
Claim 21
Dependent Claim
33 words
The method of claim 1 further comprising a step of forming a masking layer overlying said dielectric layer before said removing step, said masking layer having an exposed region over said gate electrode.
Claim 22
Dependent Claim
19 words
The method of claim 1 wherein said impurities are selected from a group consisting of boron, phosphorous, and arsenic.
Claim 23
Dependent Claim
14 words
The method of claim 1 wherein said removing step is an anisotropic etching step.
Claim 24
Dependent Claim
16 words
The method of claim 1 wherein said implanting step implants impurities completely through said gate electrode.
Claim 25
Dependent Claim
18 words
The method of claim 2 wherein said gate electrode is a double layer gate electrode comprising a silicide.
Claim 26
Dependent Claim
19 words
The method of claim 12 wherein said partially completed semiconductor device is an MOS device in a ROM cell.
Claim 27
Dependent Claim
18 words
The method of claim 12 wherein said recessed region of said dielectric layer is fabricated by anisotropic etching.
Claim 28
Dependent Claim
18 words
The method of claim 12 wherein said gate electrode is a double layer gate electrode comprising a silicide.
Claim 29
Dependent Claim
17 words
The method of claim 12 wherein said dielectric layer is a BPSG layer overlying an oxide layer.
Claim 30
Dependent Claim
29 words
The method of claim 12 wherein said BPSG layer and oxide layer at said recessed region includes a combined thickness ranging from about 1,500 Å to about 2,500 Å.
Claim 31
Dependent Claim
19 words
The method of claim 13 wherein said impurities are impurities having an absolute charge greater than one electron volt.
Claim 32
Dependent Claim
17 words
The method of claim 27 wherein said implanting step is at an energy greater than 150 KeV.
Claim 33
Dependent Claim
19 words
The method of claim 13 wherein said impurities are selected from the group consisting of boron, phosphorous, and arsenic.
Claim 34
Dependent Claim
18 words
The method of claim 13 wherein said gate electrode is a double layer gate electrode comprising a silicide.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-05-07 | 1999-11-06 | 2000-05-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-05-07 | 2003-11-06 | 2004-05-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-05-07 | 2007-11-06 | 2008-05-07 | $7700.00 | Window Closed / Lapsed |