Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
215 words
Testing apparatus for an integrated circuit "chip", where said chip is generally a planar electronic device having plural traces thereon for electrical interconnection to complementary traces on a further planar electronic device upon which said apparatus is to be mounted, said apparatus comprising: (a) a frame member for mounting to said further planar electronic device, where said frame member includes a central opening extending between first and second surfaces and is dimensionally sized to receive said chip, means for receiving an electronic interface member mounting plural electrical interconnection means for engaging said electrically conductive areas during testing, and plural recesses extending from at least said first surface, where each recess includes a compression spring; (b) a floatably mounted force applying member having first and second generally parallel surfaces and arranged to overlie said frame member, a central opening concentric with said central opening of said frame member, plural posts extending from said second parallel surface for receipt in respective said recesses of said frame member; (c) first means for urging said force applying member toward said frame member, said first means including an eccentric camming surface in contact with said first surface of said force applying member; and (d) second means responsive to said first means to engage and secure said chip during testing thereof.
Claim 2
Dependent Claim
215 words
Testing apparatus for an integrated circuit "chip", where said chip is generally a planar electronic device having plural traces thereon for electrical interconnection to complementary traces on a further planar electronic device upon which said apparatus is to be mounted, said apparatus comprising: (a) a frame member for mounting to said further planar electronic device, where said frame member includes a central opening extending between first and second surfaces and is dimensionally sized to receive said chip, means for receiving an electronic interface member mounting plural electrical interconnection means for engaging said electrically conductive areas during testing, and plural recesses extending from at least said first surface, where each recess includes a compression spring; (b) a floatably mounted force applying member having first and second generally parallel surfaces and arranged to overlie said frame member, a central opening concentric with said central opening of said frame member, plural posts extending from said second parallel surface for receipt in respective said recesses of said frame member; (c) first means for urging said force applying member toward said frame member, said first means including an eccentric camming surface in contact with said first surface of said force applying member; and (d) second means responsive to said first means to engage and secure said chip during testing thereof.
Claim 3
Dependent Claim
46 words
The testing apparatus according to claim 1, wherein plural pairs of posts extend from the first surface of said frame member, and said force applying member includes complementary through holes for receiving said posts, whereby said force applying member is in sliding relationship with said posts.
Claim 4
Dependent Claim
20 words
The testing apparatus according to claim 2, wherein said first means are pivotal members mounted between two of said posts.
Claim 5
Dependent Claim
23 words
The testing apparatus according to claim 1, wherein the wall of said central opening of said frame member includes a cam riding shoulder.
Claim 6
Dependent Claim
44 words
The testing apparatus according to claim 4, wherein said second means comprises plural pivoting members mounted about said central opening of said frame member, and that said pivoting members include an arm adapted to ride along said shoulder into engagement with said test chip.
Claim 7
Dependent Claim
57 words
The testing apparatus according to claim 1, wherein said electronic interface member includes a plurality of through slots, where each slot contains an electrical connector comprising an elastomeric core having a thin flexible film wrapped thereabout, where said film is provided with circuitry thereon for electrically interconnecting the electrically conductive areas of the respective planar electronic devices.