Integrated circuit test socket

Claim 2

A test socket for integrated circuits comprising: a base; a platform supporting the integrated circuit; resilient contacts for electrical connection to said integrated circuit and for supporting said platform in spaced relationship to said base and permitting resilient movement of said platform relative to said base; and means for retaining said platform relative to said base at a rest position and for permitting rotational and translational movement of said platform toward said base from said rest position.

Claim 3

A test socket according to claim 1 further including a cover removably attached to said base for forcing the integrated circuit into contact with said contacts.

Claim 4

A test socket according to claim 2 further including a hinge for attaching said cover to said base.

Claim 5

A test socket according to claim 3 further including a latch for retaining said cover in contact with said integrated circuit.

Claim 6

A test socket according to claim 1 wherein said means for retaining said platform includes legs depending from said platform toward said base, which legs terminate in projections extending substantially perpendicularly to said legs, and wherein said base further includes walls interacting with said leg projections to permit movement of said legs toward said base but not away from said base.

Claim 7

A test socket for integrated circuits comprising: a base having a generally flat lower surface and upstanding walls extending from said lower surface to define an open interior above said lower surface; a platform for supporting the integrated circuit and having at least two dependent legs extending from said platform toward said base lower surface, said legs terminating in ends which project substantially perpendicularly to the extension of said legs; said base walls including recesses in register with said platform leg ends, which recesses engage said leg ends and prevent movement of said platform away from said base lower surface but permit movement of any portion of said platform toward said base lower surface independently of movement of any other portion of said platform toward said base; resilient contacts disposed between said base lower surface and said platform for electrical connection with the integrated circuit on said platform and for supporting said platform in spaced relation to said lower surface while permitting resilient movement of said platform toward said lower surface; a cover and a hinge connecting said cover to said base adjacent one of said base walls and permitting rotational movement of said cover relative to said base; and a latch releasably retaining said cover relative to said base so that said integrated circuit is retained in contact with said resilient contacts.

Claim 8

A test socket for integrated circuits comprising: a base having a generally flat lower surface and upstanding walls extending from said lower surface to define an open interior above said lower surface; a platform for supporting the integrated circuit and having at least two dependent legs extending from said platform toward said base lower surface, said legs terminating in ends which project substantially perpendicularly to the extension of said legs; said base walls including recesses in register with said platform leg ends, which recesses engage said leg ends and prevent movement of said platform away from said base lower surface but permit movement of any portion of said platform toward said base lower surface independently of movement of any other portion of said platform toward said base; resilient contacts disposed between said base lower surface and said platform for electrical connection with the integrated circuit on said platform and for supporting said platform in spaced relation to said lower surface while permitting resilient movement of said platform toward said lower surface; a cover and a hinge connecting said cover to said base adjacent one of said base walls and permitting rotational movement of said cover relative to said base; and a latch releasably retaining said cover relative to said base so that said integrated circuit is retained in contact with said resilient contacts.