US4940935A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Automatic SMD tester
Assignee: Ried Ashman Manufacturing
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Filing: 1989-08-28
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Granted: 1990-07-10
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Expires: 2009-08-28
Abstract
Abstract Automated apparatus transfers SMDs with leads for contacting mounting pad surfaces of surface mount PCBs from containers to nests on a rotatable dial, such that the nests support the SMDs by the leads without touching the body of an SMD. At a test station an elevator device elevated the nest to place an SMD in the nest in a test socket positioned above the dial so the SMD leads connect to test circuitry through contacts in the test socket. In a preferred embodiment the test socket is the base of a manual insert test socket and the nest performs the function of the lid of a manual insert test socket.
Inventors
- 👤 Bryan R. Riley
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 14:11
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/04; G01R1/0408; G01R1/0433
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
199 words
Apparatus for automatically testing SMDs having leads with surfaces for contacting mounting pads on PCBs comprising: nest means for carrying said SMDs, said nest means having ledges for contacting said leads such that said nest means supports said SMD by said leads alone without contacting the body of said SMD; carrier means for supporting and translating said nest means such that said nest means may be elevated above said carrier means and replaced therein; transfer means for picking up said SMDs from storage containers and placing said SMDs in said nest means and for picking up said SMDs from said nest means and replacing said SMDs in said storage containers; test socket means positioned above said carrier means for contacting said leads of said SMDs, thereby connecting said leads to circuitry for performing electrical tests on said SMDs; and elevation means for engaging said nest means, elevating said nest means above said carrier means and inserting said nest means into said test socket means such that said leads are connected to said circuitry, and for withdrawing said nest means from said test socket means after performance of said electrical tests and replacing said nest means in said carrier means.
Claim 2
Dependent Claim
199 words
Apparatus for automatically testing SMDs having leads with surfaces for contacting mounting pads on PCBs comprising: nest means for carrying said SMDs, said nest means having ledges for contacting said leads such that said nest means supports said SMD by said leads alone without contacting the body of said SMD; carrier means for supporting and translating said nest means such that said nest means may be elevated above said carrier means and replaced therein; transfer means for picking up said SMDs from storage containers and placing said SMDs in said nest means and for picking up said SMDs from said nest means and replacing said SMDs in said storage containers; test socket means positioned above said carrier means for contacting said leads of said SMDs, thereby connecting said leads to circuitry for performing electrical tests on said SMDs; and elevation means for engaging said nest means, elevating said nest means above said carrier means and inserting said nest means into said test socket means such that said leads are connected to said circuitry, and for withdrawing said nest means from said test socket means after performance of said electrical tests and replacing said nest means in said carrier means.
Claim 3
Dependent Claim
40 words
Apparatus as in claim 1 wherein said nest means has three sides such that said transfer means may pass through the open side to place an SMD in said nest means or to remove an SMD from said nest means.
Claim 4
Dependent Claim
30 words
Apparatus as in claim 2 wherein said elevation means comprises an attachment forming a forth side for said nest means when said elevation means is engaged with said nest means.
Claim 5
Dependent Claim
14 words
Apparatus as in claim 1 wherein said carrier means comprises a rotatable dial plate.
Claim 6
Dependent Claim
20 words
Apparatus as in claim 1 wherein said test socket means comprises a manual insert test socket with the lid removed.
Claim 7
Dependent Claim
31 words
Apparatus as in claim 1 wherein said elevation means comprises suction means for contacting and holding said SMDs in said nest means, said vacuum means contacting the body of said SMD.
Claim 8
Dependent Claim
14 words
Apparatus as in claim 6 wherein said vacuum means comprises a flexible suction cup.
Claim 9
Independent Claim
131 words
A method of performing an electrical test on an SMD comprising: separating the base and lid of a manual insert test socket; positioning said base above a carrier means; supporting a nest means for said SMD on said carrier means such that said nest means may be elevated above said carrier means and replaced on said carrier means; transferring said SMD to be tested to said nest means such that said nest means while supporting said SMD contacts only leads of said SMD; translating said SMD in said nest means to a position under said base by moving said carrier means; and elevating said nest means to place said SMD into said base such that said leads of said SMD are connected to test circuitry through electrical contacts in said base.
Claim 10
Independent Claim
131 words
A method of performing an electrical test on an SMD comprising: separating the base and lid of a manual insert test socket; positioning said base above a carrier means; supporting a nest means for said SMD on said carrier means such that said nest means may be elevated above said carrier means and replaced on said carrier means; transferring said SMD to be tested to said nest means such that said nest means while supporting said SMD contacts only leads of said SMD; translating said SMD in said nest means to a position under said base by moving said carrier means; and elevating said nest means to place said SMD into said base such that said leads of said SMD are connected to test circuitry through electrical contacts in said base.
Claim 11
Independent Claim
126 words
A method of performing an electrical test on an SMD comprising: positioning a test socket means above a carrier means; supporting a nest means for said SMD on said carrier means such that said nest means may be elevated above said carrier means and replaced on said carrier means; transferring said SMD to be tested to said nest means such that said nest means wile supporting said SMD contacts only leads of said SMD; translating said SMD in said nest means to a position under said test socket means by moving said carrier means; and elevating said nest means to place said SMD into said test socket means such that said leads of said SMD are connected to test circuitry through electrical contacts in said base.
Claim 12
Independent Claim
126 words
A method of performing an electrical test on an SMD comprising: positioning a test socket means above a carrier means; supporting a nest means for said SMD on said carrier means such that said nest means may be elevated above said carrier means and replaced on said carrier means; transferring said SMD to be tested to said nest means such that said nest means wile supporting said SMD contacts only leads of said SMD; translating said SMD in said nest means to a position under said test socket means by moving said carrier means; and elevating said nest means to place said SMD into said test socket means such that said leads of said SMD are connected to test circuitry through electrical contacts in said base.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1993-07-09 | 1994-01-08 | 1994-07-10 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-07-09 | 1998-01-08 | 1998-07-10 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-07-09 | 2002-01-08 | 2002-07-10 | $7700.00 | Window Closed / Lapsed |