Interconnect structure with replaced semiconductor chips

Claim 2

An interconnect structure, comprising: a first substrate with a surface; a pattern of multiple conductive pads defining an area on the surface of the first substrate; conductive bumps with first ends positioned on the conductive pads, and second ends of the bumps defined by a second surface approximately parallel to and above the surface of the first substrate and which defines the flat, distal ends of the bumps wherein the second surface is mountable to an electronic device having additional conductive bumps; and a first layer of an encapsulant filing around the bumps in the volume defined by the area of the pattern of conductive pads and between the first substrate surface and the defining second surface.

Claim 3

The structure of claim 1 in which the first ends of the solder bumps are approximately hemispherical.

Claim 4

The structure of claim 1 in which the conductive bumps include a high temperature solder; and which further comprises joints of low temperature solder connecting between the conductive pads and the first ends of the conductive bumps.

Claim 5

The structure of claim 1, in which the pads are copper and the conductive bumps are Pb rich with 3-5% Sn solder.

Claim 6

The structure of claim 1, in which the bumps are bonded to the pads by joints of approximately eutectic Pb/Sn solder.

Claim 7

The structure of claim 1, in which: the pads are copper and at positions defined by a rectangular or square grid; the interconnect structure includes an epoxy - fiberglass board; the bumps are Pb rich solder with about 3-5% Sn; the encapsulant includes epoxy, and further comprising: first joints of about eutectic Pb/Sn solder connecting between the conductive pads and the spherical ends of the solder bumps;

Claim 8

The structure of claim 1 in which the conductive bumps are of a different material than the conductive pads.

Claim 9

The structure of claim 1 in which the conductive bumps are a high melting temperature solder with a flat bottom which conforms to connects with the conductive pads and a shape indicating formation by reflow soldering directly to the pads.

Claim 10

An interconnect structure comprising: a first substrate with a surface; a pattern of multiple conductive pads defining an area on the surface of the first substrate; conductive bumps with first ends positioned on the conductive pads, the bumps truncated by a surface approximately parallel to and above the surface of the first substrate surface and which defines the flat, distal ends of the bumps; a first layer of an encapsulant filing around the bumps in the volume defined by the area of the pattern of conductive pads and between the first substrate surface and the truncating surface; a second substrate having terminals projecting toward the first substrate with distal ends approximately touching the flat, distal ends of the bumps; and joints of a first material having a melting temperature below the glass transition temperature of the first layer of encapsulant and connecting between the distal ends of the terminals and the flat distal ends of the bumps.

Claim 11

An interconnect structure comprising: a first substrate with a surface; a pattern of multiple conductive pads defining an area on the surface of the first substrate; conductive bumps with first ends positioned on the conductive pads, the bumps truncated by a surface approximately parallel to and above the surface of the first substrate surface and which defines the flat, distal ends of the bumps; a first layer of an encapsulant filing around the bumps in the volume defined by the area of the pattern of conductive pads and between the first substrate surface and the truncating surface; a second substrate having terminals projecting toward the first substrate with distal ends approximately touching the flat, distal ends of the bumps; and joints of a first material having a melting temperature below the glass transition temperature of the first layer of encapsulant and connecting between the distal ends of the terminals and the flat distal ends of the bumps.

Claim 12

The structure of claim 9 in which, the distal ends of the terminals are approximately hemispherical.

Claim 13

The structure of claim 9 further comprising: a second layer of an encapsulant between the first layer of encapsulant and the substrate which seals around the terminals and bottom of the second substrate.

Claim 14

The structure of claim 9 in which the bumps and terminals have a melting temperature sufficiently above the melting temperature of the first material, for joining the terminals to the bumps without significantly changing the shape of the bumps and terminals.

Claim 15

The structure of claim 12 in which the bumps and terminals are a high melting temperature Pb rich solder with 3 to 5% Sn, and the first material is eutectic Pb/Sn based solder.

Claim 16

The structure of claim 9 in which the second substrate is an IC chip.

Claim 17

The structure of claim 9, in which the pads are copper and located at positions defined by a rectangular or square grid, the interconnect structure includes an epoxy - fiberglass board, the bumps are Pb rich solder with about 3-5% Sn, the encapsulant includes epoxy, and further comprising: first joints of about eutectic Pb/Sn solder connecting between the conductive pads and the spherical ends of the solder bumps; an IC chip having terminals of Pb rich solder with about 3-5% Sn projecting downward, with distal ends of terminals approximately touching the flat, distal ends of the solder bumps; second joints of approximately eutectic Pb/Sn solder connecting between the distal ends of the solder terminals and the flat distal ends of the solder bumps; and a second layer of epoxy encapsulant between the first layer of encapsulant and the IC chip which seals around the solder terminals, second joints and bottom of the IC chip.

Claim 18

The structure of claim 9 in which both the conductive bumps and the terminals include a high temperature solder; and which further comprises joints of low temperature solder connecting between the conductive bumps and the distal ends of the terminals.

Claim 19

The structure of claim 9, in which the pads are copper and the conductive bumps are Pb rich with 3-5% Sn solder.

Claim 20

The structure of claim 9, in which the solder bumps are bonded to the copper pads by joints of approximately eutectic Pb/Sn solder.

Claim 21

The structure of claim 9 in which the conductive bumps are of a different material than the conductive pads.

Claim 22

An interconnect structure resulting from a method for replacing a substrate bonded to the interconnect structure by bump electrodes with the space between the substrate and the structure being filled with an encapsulant, comprising the steps of: mechanically removing the substrate from the structure; planarizing the surface of the encapsulant and the bump electrodes remaining on the structure, to form a surface of encapsulant with flat bump electrodes; and bonding another substrate to the planarized bump electrodes on the structure through the use of other bump electrodes.

Claim 23

An interconnect structure resulting from a method for replacing a substrate bonded to the interconnect structure by bump electrodes with the space between the substrate and the structure being filled with an encapsulant, comprising the steps of: mechanically removing the substrate from the structure; planarizing the surface of the encapsulant and the bump electrodes remaining on the structure, to form a surface of encapsulant with flat bump electrodes; and bonding another substrate to the planarized bump electrodes on the structure through the use of other bump electrodes.

Claim 24

The structure of claim 20, further comprising: joints of low temperature solder connecting between distal ends of the other bump electrodes and the flat bump electrodes.

Claim 25

The structure of claim 20 in which, the distal ends of the other bump electrodes are approximately hemispherical.

Claim 26

The structure of claim 20 further comprising: a second layer of encapsulant between the first layer of encapsulant and the substrate which seals around the other bump electrodes.

Claim 27

An interconnect structure resulting from a method for removing a substrate bonded to the interconnect structure by bump electrodes with the space between the bottom surface of said substrate and the structure being filled with an encapsulant, comprising the steps: mechanically removing the substrate from the structure; planarizing the exposed surface of the encapsulant and bump electrodes remaining on the surface of the structure, to form flat bump electrodes.

Claim 28

An interconnect structure resulting from a method for removing a substrate bonded to the interconnect structure by bump electrodes with the space between the bottom surface of said substrate and the structure being filled with an encapsulant, comprising the steps: mechanically removing the substrate from the structure; planarizing the exposed surface of the encapsulant and bump electrodes remaining on the surface of the structure, to form flat bump electrodes.

Claim 29

The structure of claim 24 in which: the bump electrodes include a high melting temperature material; the lower end of the bump electrodes are approximately hemispherical; and in which the structure further comprises: pads of a high melting temperature metal on the substrate surface; a joining material connecting the bump electrodes to the pads, with a sufficiently low melting or transition temperature that the shapes of the pads and bump electrodes are not altered by their joining.

Claim 30

The structure of claim 24 which further comprises: pads on the surface of the substrate to which the bump electrodes are joined; and in which the bottoms of the bump electrodes conform to the pads.

Claim 33

The method claim 27 further comprising the step: bonding another substrate to the planarized bump electrodes on the structure, through the use of second bump electrodes.

Claim 34

The method of claim 28 in which the step of bonding another substrate to the structure includes the steps of: depositing a low temperature joining material between the first and the second bump electrodes which is wettable to both electrodes; and heating to join the first and second bump electrodes at a sufficiently low temperature that the bump electrodes are not melted.

Claim 35

The method of claim 29 in which the first and second bump electrodes are Pb rich solder with about 3 to 5% Sn; distal ends of the second bump electrodes are about hemispherical; and the joining material is approximately eutectic Pb/Sn solder.