Patent US5474644A successfully refreshed from Google Patents.
US5474644A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and apparatus for high-flatness etching of wafer
Assignee: Shin-Etsu Handotai Co Ltd
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Filing: 1994-07-21
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Granted: 1995-12-12
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Expires: 2014-07-21
Abstract
Abstract A method and an apparatus for high-flatness etching a semiconductor single crystal wafer wherein said wafer is so rotated in a flow of an ethchant radially spreading in a plane that the main surface of said wafer may move parallelly with the flow of said etchant.
Inventors
- 👤 Tadahiro Kato
- 👤 Hideo Kudo
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 07:58
CPC Classifications
H; H10; H10P; H10P90/00; H10P90/12; H10P90/126; H10P50/00; H10P50/60; H10P50/64; H10P50/642
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
163 words
An apparatus for high-flatness etching of a wafer characterized by comprising an etching tank and an absorbing and rotating device for absorbing and rotating a wafer, said etching tank provided with two disclike plates formed flatly either wholly or except for the central part thereof and coaxially opposed in the vertical direction across a suitable space as laid parallelly or substantially parallelly with each other, an etchant supply part formed at the central part of either of said plates, an etchant outlet formed of the gap between the peripheral edge parts of said plates, and an etchant flow path formed by said space intervening between the opposed surfaces of said plates, and an opening part formed at a suitable position on at least one of said plates except for the central part thereof, said absorbing and rotating device has the wafer absorbing surface of the absorbing part thereof disposed to confront said etchant flow path via said opening part parallelly with said plates.
Claim 2
Independent Claim
163 words
An apparatus for high-flatness etching of a wafer characterized by comprising an etching tank and an absorbing and rotating device for absorbing and rotating a wafer, said etching tank provided with two disclike plates formed flatly either wholly or except for the central part thereof and coaxially opposed in the vertical direction across a suitable space as laid parallelly or substantially parallelly with each other, an etchant supply part formed at the central part of either of said plates, an etchant outlet formed of the gap between the peripheral edge parts of said plates, and an etchant flow path formed by said space intervening between the opposed surfaces of said plates, and an opening part formed at a suitable position on at least one of said plates except for the central part thereof, said absorbing and rotating device has the wafer absorbing surface of the absorbing part thereof disposed to confront said etchant flow path via said opening part parallelly with said plates.
Claim 3
Dependent Claim
46 words
An apparatus according to claim 1, wherein the central part of said plate provided with said etchant supply part is formed in a flared shape and the central part of the other plate is formed in a shape conically or hemispherically projecting toward said flared part.
Claim 4
Dependent Claim
61 words
An apparatus according to claim 2, wherein said opening part is provided only on the upper side plate and said absorbing and rotating device is disposed movably in the vertical direction directly above said opening part so that said opening part may be sealed against liquid leakage by the mutual contact between said absorbing and rotating device and said opening part.
Claim 5
Dependent Claim
94 words
An apparatus according to claim 1, wherein an annular template is disposed around the outer periphery of said absorbing part of said absorbing and rotating device concentrically with said absorbing part so that the surface of said template may be caused by the contact of said absorbing and rotating device with said opening part to protrude toward said etchant flow path from the surface of a wafer being etched in the absorbed state or to lie in one and the same plane as the surface of said wafer being etched in the absorbed state.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-12-11 | 1999-06-12 | 1999-12-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-12-11 | 2003-06-12 | 2003-12-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-12-11 | 2007-06-12 | 2007-12-12 | $7700.00 | Window Closed / Lapsed |