Patent US5474615A successfully refreshed from Google Patents.
US5474615A
Expired / Lapsed
US
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Method for cleaning semiconductor devices
Assignee: Mitsubishi Electric Corp
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Filing: 1992-12-17
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Granted: 1995-12-12
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Expires: 2012-12-17
Abstract
Abstract A method of cleaning semiconductor devices which removes or transmutes the contaminants sticking on sidewalls of a pattern or a trench is formed is disclosed. A substrate to be treated on which a pattern or a trench is formed is located in a processing container. A reactive gas which reacts with the contaminants sticking on the sidewall of the pattern or the trench to produce reactive ions which remove or transmute the contaminants is introduced into the processing container. Plasma of the reactive gas is produced by electronic cyclotron resonance in order to produce reactive ions from the reactive gas introduced into the processing container. According to the method, the temperature of the reactive ions in the plasma becomes high, with the result that the motion of the reactive ions in the plasma becomes more active. Accordingly, a velocity vector in a horizontal direction of the reactive ions becomes larger, which enables efficient removal or change in quality of the contaminants sticking on the sidewalls of the pattern or the trench.
Inventors
- 👤 Tomoaki Ishida
- 👤 Kenji Kawai
- 👤 Moriaki Akazawa
- 👤 Takahiro Maruyama
- 👤 Toshiaki Ogawa
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 12:30
CPC Classifications
H; H10; H10P; H10P70/00; H10P70/10; H10P70/12; H10P70/20; H10P70/27; H10P70/273; H10P72/00; H10P72/04; H10P72/0402; H10P72/0406; Y; Y10; Y10S; Y10S438/00; Y10S438/963
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
117 words
A method of cleaning semiconductor devices which selectively removes or transmutes contaminates sticking on a sidewall of a pattern or a trench, comprising the steps of: locating a substrate to be treated on which said pattern or trench is formed into a processing container; introducing a reactive gas, into said processing container said reactive gas including an element selected from the group consisting of fluorine, chlorine, bromine and iodine; and generating a plasma of said reactive gas by electronic cyclotron resonance so as to produce reactive ions from said reactive gas which reactive ions selectively remove or transmute only said contaminates sticking on said sidewall of said pattern or said trench while avoiding etching of said substrate.
Claim 2
Independent Claim
117 words
A method of cleaning semiconductor devices which selectively removes or transmutes contaminates sticking on a sidewall of a pattern or a trench, comprising the steps of: locating a substrate to be treated on which said pattern or trench is formed into a processing container; introducing a reactive gas, into said processing container said reactive gas including an element selected from the group consisting of fluorine, chlorine, bromine and iodine; and generating a plasma of said reactive gas by electronic cyclotron resonance so as to produce reactive ions from said reactive gas which reactive ions selectively remove or transmute only said contaminates sticking on said sidewall of said pattern or said trench while avoiding etching of said substrate.
Claim 3
Dependent Claim
39 words
The method according to claim 1, wherein a gas selected from the group consisting of oxygen, nitrogen, hydrogen and ammonia is mixed into said reactive gas, and plasma of this mixed gas is produced by said electronic cyclotron resonance.
Claim 4
Dependent Claim
48 words
The method according to claim 1, wherein the step of producing plasma of said reactive gas by said electronic cyclotron resonance comprises the steps of: supplying a microwave into said processing container in which said reactive gas is introduced, and producing a magnetic field in said processing container.
Claim 5
Independent Claim
112 words
A method of cleaning semiconductor devices which selectively removes or transmutes contaminates sticking on a sidewall of a pattern or a trench, comprising the steps of: locating a substrate to be treated on which said pattern or trench is formed into a processing container; introducing a reactive gas into said processing container; introducing krypton or xenon into said processing container together with said reactive gas; and generating a plasma of said reactive gas by electronic cyclotron resonance so as to produce reactive ions from said reactive gas which reactive ions selectively remove or transmute only said contaminates sticking on the sidewall of said pattern or trench while avoiding etching of said substrate.
Claim 6
Independent Claim
112 words
A method of cleaning semiconductor devices which selectively removes or transmutes contaminates sticking on a sidewall of a pattern or a trench, comprising the steps of: locating a substrate to be treated on which said pattern or trench is formed into a processing container; introducing a reactive gas into said processing container; introducing krypton or xenon into said processing container together with said reactive gas; and generating a plasma of said reactive gas by electronic cyclotron resonance so as to produce reactive ions from said reactive gas which reactive ions selectively remove or transmute only said contaminates sticking on the sidewall of said pattern or trench while avoiding etching of said substrate.
Claim 7
Dependent Claim
33 words
The method according to claim 4, wherein said krypton or xenon is introduced in a mixed gas containing said reactive gas and said krypton or xenon at a flow rate ratio of 25-75%.
Claim 8
Dependent Claim
27 words
The method according to claim 4, wherein said reactive gas includes a gas including an element selected from the group consisting of fluorine, chlorine, bromine and iodine.
Claim 9
Dependent Claim
41 words
The method according to claim 4, wherein a gas selected from the group consisting of oxygen, nitrogen, hydrogen and ammonia is further mixed into said reactive gas, and a plasma of this mixed gas is produced by said electronic cyclotron resonance.
Claim 10
Dependent Claim
48 words
The method according to claim 4, wherein the step of producing plasma of said reactive gas by said electronic cyclotron resonance comprises the steps of: supplying a microwave into said processing container in which said reactive gas is introduced, and producing a magnetic field in said processing container.
Claim 11
Dependent Claim
60 words
The method of cleaning semiconductor devices according to claim 4, wherein in said step of producing a plasma of said reactive gas by electronic cyclotron resonance, a direction of providing said reactive ions is uncontrolled and a plurality of said reactive ions impact said substrate and said sidewall of said pattern or said trench at a plurality of different angles.
Claim 12
Dependent Claim
28 words
The method of cleaning semiconductor devices according to claim 1, further including the step of introducing krypton or xenon into said processing container together with said reactive gas.
References Cited (Backward Citations)
US4996077A
Cited
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| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1998-12-11 | 1999-06-12 | 1999-12-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-12-11 | 2003-06-12 | 2003-12-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-12-11 | 2007-06-12 | 2007-12-12 | $7700.00 | Window Closed / Lapsed |