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US5473183A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor device of a first conductivity type which has a first well of a second conductivity type formed therein and a second well of the first conductivity type formed in the first well and a pair of MOSFET formed in the first and second wells

Assignee: Sony Corp
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Filing: 1994-09-07
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Granted: 1995-12-05
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Expires: 2014-09-07
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Abstract

Abstract The present invention is directed to a CMOS inverter in which an N-FET (Qn) formed of an N-type source region (2S), a drain region (2D) and a gate electrode (2G) and a P-FET (Qp) formed of a P-type source region (3S), a drain region (3D) and a gate electrode (3G) are formed on an N-type silicon substrate (1n). A first well region (4p) is formed under the N-FET (Qn) and P-FET (Qp). Further, an N-type well region (5n) is formed on the P-FET (Qp) within the first well region (4p). Thus, an influence exerted by a back-gate effect from the substrate can be prevented completely, whereby a phase displacement relative to a pulse response to a CMOS peripheral logic circuit and a malfunction can be avoided.

Inventors

  • 👤 Kazuya Yonemoto

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 12:04
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/80; H10D84/82; H10D84/83; H10D84/85; H10D84/859; Y; Y10; Y10S; Y10S257/00; Y10S257/901

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 121 words
A semiconductor device having a semiconductor substrate supplied with a fluctuating voltage comprising: said semiconductor substrate of a first conductivity type; a first well of a second conductivity type formed in said semiconductor substrate; a second well of the first conductivity type formed in said first well; and, wherein said first conductivity type is P-type and said second conductivity type is N-type, and wherein the device further comprising: a pair of first MOS field effect transistors of P-type formed on the surface of said first well of N-type; a pair of second MOS field effect transistors of N-type formed on the surface of said second well of P-type; and said four MOS field effect transistors being connected in a NAND circuit.
Claim 2
Dependent Claim 121 words
A semiconductor device having a semiconductor substrate supplied with a fluctuating voltage comprising: said semiconductor substrate of a first conductivity type; a first well of a second conductivity type formed in said semiconductor substrate; a second well of the first conductivity type formed in said first well; and, wherein said first conductivity type is P-type and said second conductivity type is N-type, and wherein the device further comprising: a pair of first MOS field effect transistors of P-type formed on the surface of said first well of N-type; a pair of second MOS field effect transistors of N-type formed on the surface of said second well of P-type; and said four MOS field effect transistors being connected in a NAND circuit.
Claim 3
Dependent Claim 27 words
A semiconductor device according to claim 1 wherein said second well is connected to a ground potential and said first well is connected to a power source.

References Cited (Backward Citations)

US3865654A Cited
JPS5546504A Cited
US4931880A Cited
US5198880A Cited
US5336913A Cited
US5373476A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1998-12-04 1999-06-05 1999-12-05 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2002-12-04 2003-06-05 2003-12-05 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2006-12-04 2007-06-05 2007-12-05 $7700.00 Window Closed / Lapsed

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