Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
365 words
A method of making, in a first conductivity type semiconductor substrate, a two phase charge coupled device with identical, self-aligned dopant implanted in the semiconductor substrate and underlying electrically connected first phase and second phase plans electrode strips recessed within a trench of insulative material, said trench defining the width of the electrode strips and said electrode strips being coplanar to the surface of the trench, the steps comprising: (a) forming a first insulative layer uniformly overlying the semiconductor substrate; (b) implanting in the semiconductor substrate impurity ions of the second conductivity type; (c) uniformly depositing a second insulative layer of thickness at least as great as the thickness of first and second conductive electrodes to be formed later; (d) patterning in said second insulative layer a trench extending to the top of the first insulative layer; (e) uniformly depositing a first conductive layer; (d) patterning, in the form of closely spaced first conductive strips, the first conductive layer on said first and second insulative layers, the first conductive strips having an exposed surface and being substantially perpendicular to the trench in the second insulative layer; (e) implanting impurity ions into the semiconductor substrate, the implant blocked in regions covered by the first conductive strips to form charge transfer direction biasing implants; (f) providing over the surface of the exposed first conductive strips a third insulating layer; (g) uniformly depositing a second conductive layer; (h) planarizing said uniformly deposited second conductive layer and first conductive strips, to remove the second conductive layer from regions in which it overlaps the first conductive strips and to remove the second conductive layer and the first conductive strips from regions in which they overlap the second insulative layer to the extent that the second conductive layer is patterned into electrically isolated second conductive strips also isolated from the first conductive strips; (i) etching grooves in the regions separating alternate pairs of the first and second conductive strips, the etched regions contiguous with portions of the first and second conductive strips on each side; and (j) filling said grooves with a conductive interconnecting material to electrically connect alternate pairs of strips to form electrically isolated first and second conductive electrodes.
Claim 2
Independent Claim
365 words
A method of making, in a first conductivity type semiconductor substrate, a two phase charge coupled device with identical, self-aligned dopant implanted in the semiconductor substrate and underlying electrically connected first phase and second phase plans electrode strips recessed within a trench of insulative material, said trench defining the width of the electrode strips and said electrode strips being coplanar to the surface of the trench, the steps comprising: (a) forming a first insulative layer uniformly overlying the semiconductor substrate; (b) implanting in the semiconductor substrate impurity ions of the second conductivity type; (c) uniformly depositing a second insulative layer of thickness at least as great as the thickness of first and second conductive electrodes to be formed later; (d) patterning in said second insulative layer a trench extending to the top of the first insulative layer; (e) uniformly depositing a first conductive layer; (d) patterning, in the form of closely spaced first conductive strips, the first conductive layer on said first and second insulative layers, the first conductive strips having an exposed surface and being substantially perpendicular to the trench in the second insulative layer; (e) implanting impurity ions into the semiconductor substrate, the implant blocked in regions covered by the first conductive strips to form charge transfer direction biasing implants; (f) providing over the surface of the exposed first conductive strips a third insulating layer; (g) uniformly depositing a second conductive layer; (h) planarizing said uniformly deposited second conductive layer and first conductive strips, to remove the second conductive layer from regions in which it overlaps the first conductive strips and to remove the second conductive layer and the first conductive strips from regions in which they overlap the second insulative layer to the extent that the second conductive layer is patterned into electrically isolated second conductive strips also isolated from the first conductive strips; (i) etching grooves in the regions separating alternate pairs of the first and second conductive strips, the etched regions contiguous with portions of the first and second conductive strips on each side; and (j) filling said grooves with a conductive interconnecting material to electrically connect alternate pairs of strips to form electrically isolated first and second conductive electrodes.
Claim 3
Dependent Claim
15 words
The method of claim 1 in which the means of planarization is chemical mechanical polishing.
Claim 4
Dependent Claim
34 words
The method of claim 2 in which chemical mechanical polishing is performed after deposition of the first layer to the extent that the first conductive layer is removed from over the second insulative material.
Claim 5
Dependent Claim
35 words
The method of claim 2 in which chemical mechanical polishing is performed after patterning of the first conductive layer to the extent that the first conductive layer is removed from over the second insulative material.
Claim 6
Dependent Claim
25 words
The method of claim 1 in which the first and second conductive electrode materials are polysilicon and the third insulative material is thermally grown oxide.
Claim 7
Dependent Claim
19 words
The method of claim 1 in which the charge transfer direction biasing implants are of the first conductivity type.
Claim 8
Dependent Claim
17 words
The method of claim 1 in which the first or second conductive layer comprises indium tin oxide.
Claim 9
Dependent Claim
16 words
The method of claim 1 further including removing at least portions of the second insulative layer.
Claim 10
Dependent Claim
23 words
The method of claim 1 in which the first insulative layer is a bilayer of a thermally grown oxide and a deposited nitride.
Claim 11
Dependent Claim
14 words
The method of claim 1 in which the second insulative layer is silicon nitride.
Claim 12
Dependent Claim
19 words
The method of claim 1 in which the charge transfer direction biasing implants are of the second conductivity type.