Etch chamber with gas dispersing membrane

Claim 3

An apparatus according to claim 1, wherein the enclosure means has a periphery around the processing portion of the open interior, peripheral means defining said gas outlet around the periphery of said processing portion to receive gases flowing across said portion of the front side of the wafer portion, and a second plastic membrane having pores therethrough and dispersed thereacross, the second membrane extending peripherally of said processing portion and traversing the gas outlet to require process gases to pass therethrough and the second membrane cooperating with the first membrane in obtaining substantially uniformly dispersed flow of process gases onto the wafer portion.

Claim 4

A processing chamber for gaseous processing of semiconductor wafer portions, comprising enclosure means having an open interior with a gas supplying plenum portion and a processing portion wherein a portion of such wafer portion may be exposed to process gases, and a plastic membrane having pores therethrough and dispersed thereacross, the pores being in the size range of 20 to 50 microns, the membrane traversing said open interior between the plenum portion and the processing portion and admitting passage and dispersing the flow of such process gases through the pores of the membrane and toward and onto an exposed portion of such a wafer portion.

Claim 5

A processing chamber for gaseous processing of semiconductor wafer portions, comprising enclosure means having an open interior with a gas supplying plenum portion and a processing portion wherein a portion of such wafer portion may be exposed to process gases, and a plastic membrane having pores therethrough and dispersed thereacross, the pores being in the size range of 20 to 50 microns, the membrane traversing said open interior between the plenum portion and the processing portion and admitting passage and dispersing the flow of such process gases through the pores of the membrane and toward and onto an exposed portion of such a wafer portion.

Claim 6

A processing chamber according to claim 3 wherein the enclosure means and membrane means are free of gas modifying electric charges.

Claim 7

A processing chamber according to claim 3 wherein the processing portion of the enclosure means has gas outlet means with diverse portions spaced from each other about the periphery of said processing portion and accepting gases flowing in various directions and discharging such gases.

Claim 8

The processing chamber according to claim 5 wherein the gas outlet means is substantially annular to encircle the periphery of the wafer portion being processed.

Claim 9

The processing chamber according to claim 5 and a second membrane traversing the diverse portions of the outlet means.

Claim 10

The processing chamber according to claim 3 and the processing portion of the enclosure means being shaped to accommodate the wafer portion oriented in confronting relation to the membrane.

Claim 11

The processing chamber according to claim 3 wherein the membrane is substantially flat to be nearly uniformly spaced from the wafer portion.

Claim 12

An apparatus according to claim 1 wherein the support means comprises rotary means for revolving the wafer portion being processed.

Claim 13

An apparatus according to claim 2, wherein the pores are uniformly dispersed across the membrane means and are of a size in the range of 20 to 50 microns.

Claim 14

A processing chamber for gaseous processing of semiconductor wafer portions, comprising a base wall, a wafer mounting rotor adjacent the base wall to carry and revolve a wafer portion being processed, a housing having a closed top and a peripheral wall sealing against the base wall and encircling the rotor and a wafer portion thereon, the housing having an open interior, a plastic membrane in the housing and having pores therethrough and dispersed thereacross, the membrane traversing said open interior and overlying said rotor to confront the wafer portion thereon in closely spaced relation, the membrane dividing the open interior into a gas supplying plenum adjacent the closed top and a processing space adjacent the rotor, the membrane uniformly dispersing the gas across the wafer as the gas flows through the membrane and pores thereof from the supply plenum, means mounting the membrane on the peirpheral wall of the housing, means defining a gas outlet extending around the peripheral wall and communicating with the processing space to receive and discharge gases flowing from the periphery of the wafer portion, and a second plastic membrane with pores therethrough and dispersed thereacross and traversing said gas outlet around the entire peripheral wall.

Claim 15

A processing chamber for gaseous processing of semiconductor wafer portions, comprising a base wall, a wafer mounting rotor adjacent the base wall to carry and revolve a wafer portion being processed, a housing having a closed top and a peripheral wall sealing against the base wall and encircling the rotor and a wafer portion thereon, the housing having an open interior, a plastic membrane in the housing and having pores therethrough and dispersed thereacross, the membrane traversing said open interior and overlying said rotor to confront the wafer portion thereon in closely spaced relation, the membrane dividing the open interior into a gas supplying plenum adjacent the closed top and a processing space adjacent the rotor, the membrane uniformly dispersing the gas across the wafer as the gas flows through the membrane and pores thereof from the supply plenum, means mounting the membrane on the peirpheral wall of the housing, means defining a gas outlet extending around the peripheral wall and communicating with the processing space to receive and discharge gases flowing from the periphery of the wafer portion, and a second plastic membrane with pores therethrough and dispersed thereacross and traversing said gas outlet around the entire peripheral wall.