Surface processing apparatus utilizing local thermal equilibrium plasma and method of using same

Claim 3

A surface processing apparatus comprising: reaction chamber means for storing a substrate to be surface-processed; discharge chamber means connected to the reaction chamber means and for defining discharge space in conjunction with a predetermined gas and alternating power supplied thereto: power source means for supplying the alternating power to the discharge chamber means so as to generate local thermal equilibrium (LTE) plasma in said discharge space, a ratio of a power capacity of said power source means to an opening area of said discharge space toward said substrate being selected to be a first predetermined value; and projection means for projecting at least one of radiation and an active species produced from the LTE plasma in said discharge chamber means to a surface of the substrate provided in said reaction chamber means.

Claim 4

A surface processing apparatus comprising: reaction chamber means for storing a substrate to be surface-processed; discharge chamber means connected to the reaction chamber means and for defining discharge space in conjunction with a predetermined gas and alternating power supplied thereto: power source means for supplying the alternating power to the discharge chamber means so as to generate local thermal equilibrium (LTE) plasma in said discharge space, a ratio of a power capacity of said power source means to an opening area of said discharge space toward said substrate being selected to be a first predetermined value; and projection means for projecting at least one of radiation and an active species produced from the LTE plasma in said discharge chamber means to a surface of the substrate provided in said reaction chamber means.

Claim 5

An apparatus as claimed in claim 2, wherein said first predetermined value is more than or equal to 2 W/cm 2 .

Claim 6

A surface processing apparatus comprising: reaction chamber means for storing a substrate to be surface-processed; discharge chamber means connected to the reaction chamber means and for defining dichargee space conjunction with a predetermined gas and alternating power supplied thereto; power source means for supplying the alternating power to the discharge chamber means so as to generate local thermal equilibrium (LTE) plasma in said discharge space, a ratio of a power capacity of said power source means to volume of said discharge space being selected to be a second predetermined value; and projection means for projecting at least one of radiation and an active species produced from the LTE plasma in said discharge chamber means to a surface of the substrate provided in said reaction chamber means.

Claim 7

A surface processing apparatus comprising: reaction chamber means for storing a substrate to be surface-processed; discharge chamber means connected to the reaction chamber means and for defining dichargee space conjunction with a predetermined gas and alternating power supplied thereto; power source means for supplying the alternating power to the discharge chamber means so as to generate local thermal equilibrium (LTE) plasma in said discharge space, a ratio of a power capacity of said power source means to volume of said discharge space being selected to be a second predetermined value; and projection means for projecting at least one of radiation and an active species produced from the LTE plasma in said discharge chamber means to a surface of the substrate provided in said reaction chamber means.

Claim 8

An apparatus as claimed in claim 4, wherein said second predetermined value is more than or equal to 1 W/cm 3 .

Claim 9

An apparatus as claimed in claim 2 or claim 4, wherein said discharge chamber means is made of a cylindrical quartz tube.

Claim 10

An apparatus as claimed in claim 6, wherein said cylindrical quartz tube has an inner diameter of less than or equal to 7 cm.

Claim 11

An apparatus as claimed in claim 2 or claim 4, wherein said alternating power of power source means is coupled by way of one of induction coupling, capacitive coupling and cavity resonance to said discharge space of the discharge chamber means.

Claim 12

An apparatus as claimed in claim 2 or claim 4, wherein said projecting means includes charged particles controlling means for controlling a travel of the charged particle.

Claim 13

An apparatus as claimed in claim 9, wherein said charged particle controlling means is a mesh-shaped electrode to which a predetermined biasing voltage is applied.

Claim 14

An apparatus as claimed in claim 9, wherein said charged particle controlling means is formed by a magnetic.

Claim 15

An apparatus as claimed in claim 2, or claim 4, wherein said discharge space is subdivided into a plurality of discharge sub-space for a single substrate provided in said reaction chamber means.

Claim 16

An apparatus as claimed in claim 12, wherein different sorts of gases are conducted into said plurality of discharge sub-space.

Claim 17

An apparatus as claimed in claim 2 or claim 4, wherein said predetermined gas conducted into said discharge space contains nitrogen (N 2 ), a gas conducted into said reaction chamber means contains at least one of monosilane, disilane, silane derivative and their mixture, and a silicon nitride (SiN) film is deposited on said surface of the substrate.

Claim 18

An apparatus as claimed in claim 12, wherein said plurality of discharge sub-space are formed by first and second discharge sub-space, a first gas conducted into said first discharge sub-space contains nitrogen (N 2 ), a second gas conducted into said second discharge sub-space contains hydrogen (H 2 ), at least one of monosilane, disilane, silane derivative and their mixture is conducted into said reaction chamber means without passing through said first and second discharge sub-space, thereby forming a silicon nitride film on said of the substrate.