Patent US5453347A successfully refreshed from Google Patents.
US5453347A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for constructing ferroelectric capacitors on integrated circuit substrates
Assignee: Radiant Technologies Inc
•
Filing: 1994-06-07
•
Granted: 1995-09-26
•
Expires: 2014-06-07
Abstract
Abstract A ferroelectric capacitor and method for making the same are disclosed. The ferroelectric capacitor may be constructed on a silicon substrate such as SiO 2 or Si 3 N 4 . The ferroelectric capacitor includes a bottom electrode, a layer of ferroelectric material, and a top electrode. The bottom electrode is constructed from a layer of platinum which is bonded to the silicon substrate by a layer of metallic oxide. The metallic oxide does not diffuse into the platinum; hence, a thinner layer of platinum may be utilized for the electrode. This reduces the vertical height of the capacitor and other problems associated with diffusion of the layer used to bond the bottom electrode to the substrate surface.
Inventors
- 👤 Jeff A. Bullington
- 👤 Carl E. Montross, Jr.
- 👤 Joseph T. Evans, Jr.
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 19:50
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/60; H10D1/68; H10D1/692
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
100 words
A method for constructing a ferroelectric capacitor on a silicon based substrate, said ferroelectric capacitor comprising a layer of ferroelectric material sandwiched between first and second electrodes, said first electrode being the closest electrode to said silicon based substrate, said method comprising the steps of: (a) depositing a metallic layer; (b) oxidizing said metallic layer; (c) depositing a first platinum layer; (d) annealing said first platinum layer; (e) patterning said first platinum layer to form said first electrode; (f) depositing a layer of said ferroelectric material; and (g) depositing and patterning a layer of platinum to form said second electrode.
Claim 2
Independent Claim
100 words
A method for constructing a ferroelectric capacitor on a silicon based substrate, said ferroelectric capacitor comprising a layer of ferroelectric material sandwiched between first and second electrodes, said first electrode being the closest electrode to said silicon based substrate, said method comprising the steps of: (a) depositing a metallic layer; (b) oxidizing said metallic layer; (c) depositing a first platinum layer; (d) annealing said first platinum layer; (e) patterning said first platinum layer to form said first electrode; (f) depositing a layer of said ferroelectric material; and (g) depositing and patterning a layer of platinum to form said second electrode.
Claim 3
Dependent Claim
11 words
The method of claim 1 wherein said metallic layer comprises titanium.
Claim 4
Dependent Claim
47 words
The method of claim 1 wherein said step of depositing and patterning said platinum layer to form said second electrode comprises the steps of: (h) depositing and developing a photoresist lift-off pattern; (i) depositing a platinum layer on said lift-off pattern; and (j) removing said photoresist pattern.
Claim 5
Dependent Claim
15 words
The method of claim 1 wherein said first platinum layer is less than 1000 angstroms.
References Cited (Backward Citations)
US5242534A
Cited
US5258093A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-09-25 | 1999-03-27 | 1999-09-26 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-09-25 | 2003-03-27 | 2003-09-26 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-09-25 | 2007-03-27 | 2007-09-26 | $7700.00 | Window Closed / Lapsed |