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Patent US5448578A successfully refreshed from Google Patents.
US5448578A
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US
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Electrically erasable and programmable read only memory with an error check and correction circuit
Assignee: Samsung Electronics Co Ltd
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Filing: 1993-03-30
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Granted: 1995-09-05
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Expires: 2013-03-30
Abstract
Abstract An electrically erasable programmable read only memory (EEPROM), having error checking and correction circuitry uses a separation circuit to electrically isolate a temporary page buffer memory from a memory array so that better reliability of parity generation and error correction is provided. The EEPROM memory array includes a plurality of bit lines, a plurality of memory cells respectively connected to the bit lines and parity cells. The error check and correction circuit includes a column gate logic, connected to the plurality of bit lines, for temporarily loading randomly input data onto a memory page buffer. The EEPROM processes the data in the page buffer to logically store it as multi-byte data, simultaneously together with appropriate parity bit data corresponding to each multi-byte data set, in the memory array. Because data randomly input to and from the page buffer is selectively, electrically isolated from the memory array, bit errors that would otherwise be caused by defective memory cells, or bit lines, within the memory array, are compensated for in advance.
Inventors
- 👤 Jin-Ki Kim
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 14:53
CPC Classifications
G; G11; G11C; G11C16/00; G11C16/02; G11C16/06; G06; G06F; G06F11/00; G06F11/07; G06F11/08; G06F11/10; G06F11/1008; G06F11/1076
Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
142 words
A semiconductor memory device provided with error check and correction circuit comprising: a page buffer for storing a plurality of input data bytes, said input data bytes logically defining a plurality of multiple-byte sets, said page buffer including a memory page buffer portion for storing said plurality of multiple-byte sets during a data loading period, and a parity page buffer portion; parity generation means for generating, during a parity generation period, a plurality of parity data sets in response to corresponding ones of said multiple-byte sets, and storing said generated parity data sets into said parity page buffer portion; a memory array for storing the contents of said page buffer therein after said parity data sets have been generated; and separation means for electrically isolating said page buffer and said memory array during said data loading period and said parity generation period.
Claim 2
Dependent Claim
142 words
A semiconductor memory device provided with error check and correction circuit comprising: a page buffer for storing a plurality of input data bytes, said input data bytes logically defining a plurality of multiple-byte sets, said page buffer including a memory page buffer portion for storing said plurality of multiple-byte sets during a data loading period, and a parity page buffer portion; parity generation means for generating, during a parity generation period, a plurality of parity data sets in response to corresponding ones of said multiple-byte sets, and storing said generated parity data sets into said parity page buffer portion; a memory array for storing the contents of said page buffer therein after said parity data sets have been generated; and separation means for electrically isolating said page buffer and said memory array during said data loading period and said parity generation period.
Claim 3
Dependent Claim
39 words
The semiconductor memory device of claim 1, wherein said separation means is responsive to a memory write control signal to electrically disconnect bit lines and memory cells within said memory array with shared buffer logic within said page buffer.
Claim 4
Dependent Claim
23 words
The semiconductor memory device of claim 1, wherein said memory array comprises a plurality of electrically erasable programmable read only memory (EEPROM) cells.
Claim 5
Dependent Claim
23 words
The semiconductor memory device of claim 2, wherein said memory array comprises a plurality of electrically erasable programmable read only memory (EEPROM) cells.
Claim 6
Dependent Claim
47 words
The semiconductor memory device of claim 2, wherein said separation means comprises a plurality of switching transistors, each switching transistor being responsive to said memory write control signal to electrically disconnect a bit line in said memory array from corresponding shared buffer logic within said page buffer.
Claim 7
Dependent Claim
87 words
A semiconductor memory device provided with error check and correction circuit comprising: a page buffer for storing input data bytes during a data loading period; parity generation means for generating parity data corresponding to said input data bytes during a parity generation period; means for storing said parity data; a memory array for storing the contents of said page buffer and said parity data; and separation means for electrically isolating said page buffer and said memory array during said data loading period and said parity generation period.
Claim 8
Dependent Claim
87 words
A semiconductor memory device provided with error check and correction circuit comprising: a page buffer for storing input data bytes during a data loading period; parity generation means for generating parity data corresponding to said input data bytes during a parity generation period; means for storing said parity data; a memory array for storing the contents of said page buffer and said parity data; and separation means for electrically isolating said page buffer and said memory array during said data loading period and said parity generation period.
Claim 9
Dependent Claim
39 words
The semiconductor memory device of claim 6, wherein said separation means is responsive to a memory write control signal to electrically disconnect bit lines and memory cells within said memory array with shared buffer logic within said page buffer.
Claim 10
Dependent Claim
23 words
The semiconductor memory device of claim 6, wherein said memory array comprises a plurality of electrically erasable programmable read only memory (EEPROM) cells.
Claim 11
Dependent Claim
23 words
The semiconductor memory device of claim 7, wherein said memory array comprises a plurality of electrically erasable programmable read only memory (EEPROM) cells.
Claim 12
Dependent Claim
47 words
The semiconductor memory device of claim 7, wherein said separation means comprises a plurality of switching transistors, each switching transistor being responsive to said memory write control signal to electrically disconnect a bit line in said memory array from corresponding shared buffer logic within said page buffer.
Claim 13
Independent Claim
148 words
A method for providing error checking and correction in a semiconductor memory device, comprising the steps of: electrically isolating a plurality of bit lines within a memory array from within a page buffer; storing a plurality of input data bytes into said page buffer after electrical isolation thereof from the memory array, said input data bytes logically defining a plurality of multiple-byte sets, said page buffer including a memory page buffer portion for storing said plurality of multiple-byte sets, and a parity page buffer portion; generating a plurality of parity data sets in response to corresponding ones of said multiple-byte sets; storing said generated parity data sets into said parity page buffer portion; electrically connecting said page buffer and said memory array after said page of parity data sets have been generated; and storing the contents of said page buffer into said memory array after electrical connection thereof.
Claim 14
Independent Claim
148 words
A method for providing error checking and correction in a semiconductor memory device, comprising the steps of: electrically isolating a plurality of bit lines within a memory array from within a page buffer; storing a plurality of input data bytes into said page buffer after electrical isolation thereof from the memory array, said input data bytes logically defining a plurality of multiple-byte sets, said page buffer including a memory page buffer portion for storing said plurality of multiple-byte sets, and a parity page buffer portion; generating a plurality of parity data sets in response to corresponding ones of said multiple-byte sets; storing said generated parity data sets into said parity page buffer portion; electrically connecting said page buffer and said memory array after said page of parity data sets have been generated; and storing the contents of said page buffer into said memory array after electrical connection thereof.
Claim 15
Independent Claim
75 words
A method for providing error checking and correction in a semiconductor memory device, comprising the steps of: electrically isolating a plurality of bit lines within a memory array from a page buffer; storing input data bytes into said page buffer; generating a plurality of parity data corresponding to said input data bytes; electrically connecting said page buffer and said memory array; and loading said parity data and said input data bytes into said memory array.
Claim 16
Independent Claim
75 words
A method for providing error checking and correction in a semiconductor memory device, comprising the steps of: electrically isolating a plurality of bit lines within a memory array from a page buffer; storing input data bytes into said page buffer; generating a plurality of parity data corresponding to said input data bytes; electrically connecting said page buffer and said memory array; and loading said parity data and said input data bytes into said memory array.
References Cited (Backward Citations)
US3668632A
Cited
US4410988A
Cited
US4672613A
Cited
JPH024813A
Cited
US4996690A
Cited
US5274647A
Cited
JPH0318832A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-09-04 | 1999-03-06 | 1999-09-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-09-04 | 2003-03-06 | 2003-09-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-09-04 | 2007-03-06 | 2007-09-05 | $7700.00 | Window Closed / Lapsed |