Superconducting device having a reduced thickness of oxide superconducting layer

Claim 2

A superconducting device comprising a substrate having a principal surface, first and second oxide superconducting regions formed on the principal surface of the substrate and separated from each other, and a third oxide superconducting region of an extremely thin thickness formed on the principal surface of the substrate between the first and second oxide superconducting regions to bridge the first and second oxide superconducting regions and to form a superconducting channel between the first and second oxide superconducting regions, the first and second oxide superconducting regions being thick relative to the thickness of the third oxide superconducting region, a source electrode and a drain electrode provided on the first and second oxide superconducting regions, respectively, so that a superconducting current can flow through the superconducting channel between the source electrode and the drain electrode, a gate electrode formed through a gate insulator on the third oxide superconducting region for controlling superconducting current flow through the superconducting channel, and a side electrically insulating region formed to completely cover each of opposite side surfaces of the gate electrode, the first, second and third oxide superconducting regions being formed of a same c-axis oriented, single crystal oxide superconductor thin film, and the gate electrode being surrounded by the oxide superconductor thin film but electrically isolated from the oxide superconductor thin film by the gate insulator and the side electrically insulating region.

Claim 3

A superconducting device claimed in claim 1 wherein the side electrically insulating region contacts all side surfaces of the gate electrode, and contacts all side surfaces of the first and second superconducting regions that are in opposition to all said side surfaces of the gate electrode, whereby the gate electrode is embedded within the oxide superconductor thin film and wherein an upper surface of the gate electrode, an upper surface of the electrically insulating region, and an upper surface of the first and second superconducting regions are coextensively planar with one another.

Claim 4

A superconducting device claimed in claim 1 wherein the oxide superconductor thin film is formed of an oxide superconductor material selected from the group consisting of a Y--Ba--Cu--O compound oxide superconductor material, a Bi--Sr--Ca--Cu--O compound oxide superconductor material, and a Tl--Ba--Ca--Cu--O compound oxide superconductor material.

Claim 5

A superconducting device claimed in claim 3 wherein the gate electrode is formed of a refractory metal or a silicide thereof.

Claim 6

A superconducting device comprising a substrate having a principal surface, first and second oxide superconducting regions formed on the principal surface of the substrate separated from each other, and a third oxide superconducting region of an extremely thin thickness formed on the principal surface of the substrate between the first and second oxide superconducting regions to bridge the first and second oxide superconducting regions and to form a superconducting channel between the first and second oxide superconducting regions, the first and second oxide superconducting regions being thick relative to the thickness of the third oxide superconductivity region, a source electrode and a drain electrode provided on the first and second oxide superconducting regions, respectively, so that a superconducting current can flow through the superconducting channel between the source electrode and the drain electrode, a gate electrode formed through a gate insulator on the third oxide superconducting region for controlling the superconducting current flowing through the superconducting channel, and a side electrically insulating region formed to completely cover each of opposite side surfaces of the gate electrode, the first, second and third oxide superconducting regions being formed of the same oxide superconducting thin film, and the gate electrode being surrounded by the oxide superconductor thin film but electrically isolated from the oxide superconductor thin film by the gate insulator and the side electrically insulating region, the oxide superconductor thin film being formed of an oxide superconductor material selected from the group consisting of a Y--Ba--Cu--O compound oxide superconductor material, a Bi--Sr--Ca--Cu--O compound oxide superconductor material, and a Tl--Ba--Ca--Cu--O compound oxide superconductor material, the first, second and third oxide superconducting regions being formed of a single c-axis orientated single crystal film, the gate electrode being formed of a material selected from the group consisting of Au, Ti, W, and a silicide thereof.

Claim 7

A superconducting device comprising a substrate having a principal surface, first and second oxide superconducting regions formed on the principal surface of the substrate separated from each other, and a third oxide superconducting region of an extremely thin thickness formed on the principal surface of the substrate between the first and second oxide superconducting regions to bridge the first and second oxide superconducting regions and to form a superconducting channel between the first and second oxide superconducting regions, the first and second oxide superconducting regions being thick relative to the thickness of the third oxide superconductivity region, a source electrode and a drain electrode provided on the first and second oxide superconducting regions, respectively, so that a superconducting current can flow through the superconducting channel between the source electrode and the drain electrode, a gate electrode formed through a gate insulator on the third oxide superconducting region for controlling the superconducting current flowing through the superconducting channel, and a side electrically insulating region formed to completely cover each of opposite side surfaces of the gate electrode, the first, second and third oxide superconducting regions being formed of the same oxide superconducting thin film, and the gate electrode being surrounded by the oxide superconductor thin film but electrically isolated from the oxide superconductor thin film by the gate insulator and the side electrically insulating region, the oxide superconductor thin film being formed of an oxide superconductor material selected from the group consisting of a Y--Ba--Cu--O compound oxide superconductor material, a Bi--Sr--Ca--Cu--O compound oxide superconductor material, and a Tl--Ba--Ca--Cu--O compound oxide superconductor material, the first, second and third oxide superconducting regions being formed of a single c-axis orientated single crystal film, the gate electrode being formed of a material selected from the group consisting of Au, Ti, W, and a silicide thereof.

Claim 8

A superconducting device claimed in claim 5 wherein the substrate is formed of a material selected from the group consisting of a MgO (100) substrate, a SrTiO 3 (100) substrate and a CdNdAlO 4 (001) substrate, and a semiconductor substrate.

Claim 9

A superconducting device claim in claim 5 wherein the substrate is formed of a silicon substrate having a principal surface coated with an insulating material layer which is formed of a MgAl 2 O 4 layer and a BaTiO 3 layer.

Claim 10

A superconducting device claimed in claim 5 wherein the gate insulator is formed of an insulating material which avoids formation of a larger energy level density with the oxide superconductor material of the first, second and third oxide superconducting regions.

Claim 11

A superconducting device claimed in claim 5 wherein the third oxide superconducting region has a thickness of substantially 5 nm and the gate insulator is formed of MgO and has a thickness of not less than 10 nanometers.

Claim 12

A superconducting device claimed in claim 5 wherein the side electrically insulating region is formed of an electrical insulator material, and the gate electrode is embedded in the oxide superconductor thin film so that the gate electrode is isolated from the first, second and third oxide superconducting regions by the gate insulator and the side insulation region formed of the electrical insulator material.

Claim 13

A superconducting device claimed in claim 5 wherein the side electrically insulating region contacts all side surfaces of the gate electrode, and contacts all side surfaces of the first and second superconducting regions that are in opposition to all said side surfaces of the gate electrode, whereby the gate electrode is embedded within the oxide superconductor thin film and wherein an upper surface of the gate electrode, an upper surface of the electrically insulating region, and an upper surface of the first and second superconducting regions are coextensively planar with one another.

Claim 14

A superconducting device comprising a substrate having a principal surface, first and second oxide superconducting regions of a relatively thick thickness formed on the principal surface of the substrate separated from each other, and a third oxide superconducting region of an extremely thin thickness formed on the principal surface of the substrate between the first and second oxide superconducting regions to bridge the first and second oxide superconducting regions and to form a superconducting channel between the first and second oxide superconducting regions, the first and second oxide superconducting regions being thick relative to the thickness of the third oxide superconductivity region, a source electrode and a drain electrode provided on the first and second oxide superconducting regions, respectively, so that a superconducting current can flow through the superconducting channel between the source electrode and the drain electrode, a gate electrode formed through a gate insulator on the third oxide superconducting region for controlling the superconducting current flowing through the superconducting channel, and a side electrically insulating region formed to completely cover each of opposite side surfaces of the gate electrode, the first, second and third oxide superconducting regions being formed of the same oxide superconducting thin film, and the gate electrode being surrounded by the oxide superconductor thin film but electrically isolated from the oxide superconductor thin film by the gate insulator and the side electrically insulating region, the oxide superconductor thin film being formed of an oxide superconductor material selected from the group consisting of a Y--Ba--Cu--O compound oxide superconductor material, a Bi--Sr--Ca--Cu--O compound oxide superconductor material, and a Tl--Ba--Ca--Cu--O compound oxide superconductor material, the first, second and third oxide superconducting regions being formed of a single c-axis orientated single crystal film, the substrate being formed of a silicon substrate having a principal surface coated with an insulating material layer which is formed of a MgAl 2 O 4 layer and a BaTiO 3 .

Claim 15

A superconducting device comprising a substrate having a principal surface, first and second oxide superconducting regions of a relatively thick thickness formed on the principal surface of the substrate separated from each other, and a third oxide superconducting region of an extremely thin thickness formed on the principal surface of the substrate between the first and second oxide superconducting regions to bridge the first and second oxide superconducting regions and to form a superconducting channel between the first and second oxide superconducting regions, the first and second oxide superconducting regions being thick relative to the thickness of the third oxide superconductivity region, a source electrode and a drain electrode provided on the first and second oxide superconducting regions, respectively, so that a superconducting current can flow through the superconducting channel between the source electrode and the drain electrode, a gate electrode formed through a gate insulator on the third oxide superconducting region for controlling the superconducting current flowing through the superconducting channel, and a side electrically insulating region formed to completely cover each of opposite side surfaces of the gate electrode, the first, second and third oxide superconducting regions being formed of the same oxide superconducting thin film, and the gate electrode being surrounded by the oxide superconductor thin film but electrically isolated from the oxide superconductor thin film by the gate insulator and the side electrically insulating region, the oxide superconductor thin film being formed of an oxide superconductor material selected from the group consisting of a Y--Ba--Cu--O compound oxide superconductor material, a Bi--Sr--Ca--Cu--O compound oxide superconductor material, and a Tl--Ba--Ca--Cu--O compound oxide superconductor material, the first, second and third oxide superconducting regions being formed of a single c-axis orientated single crystal film, the substrate being formed of a silicon substrate having a principal surface coated with an insulating material layer which is formed of a MgAl 2 O 4 layer and a BaTiO 3 .

Claim 16

A superconducting device claimed in claim 12 wherein the gate electrode is formed of a refractory metal or a silicide thereof.

Claim 17

A superconducting device claimed in claim 12 wherein the gate insulator is formed of an insulating material which avoids formation of a larger energy level density with the oxide superconductor material of the first, second and third oxide superconducting regions.

Claim 18

A superconducting device claimed in claim 12 wherein the third oxide superconducting region has a thickness of substantially 5 nm and the gate insulator is formed of MgO and has a thickness of not less than 10 nanometers.

Claim 19

A superconducting device claimed in claim 12 wherein the side electrically insulating region is formed of an electrical insulator material, and the gate electrode is embedded in the oxide superconductor thin film so that the gate electrode is isolated from the first, second and third oxide superconducting regions by the gate insulator and the side insulation region formed of the electrical insulator material.

Claim 20

A superconducting device claimed in claim 12 wherein the side electrically insulating region contacts all side surfaces of the gate electrode, and contacts all side surfaces of the first and second superconducting regions that are in opposition to all said side surfaces of the gate electrode, whereby the gate electrode is embedded within the oxide superconductor thin film and wherein an upper surface of the gate electrode, an upper surface of the electrically insulating region, and an upper surface of the first and second superconducting regions are coextensively planar with one another.

Claim 21

A superconducting device comprising a substrate having a principal surface, first and second oxide superconducting regions of a relatively thick thickness formed on the principal surface of the substrate separated from each other, and a third oxide superconducting region of an extremely thin thickness formed on the principal surface of the substrate between the first and second oxide superconducting regions to bridge the first and second oxide superconducting regions and to form a superconducting channel between the first and second oxide superconducting regions, the first and second oxide superconducting regions being thick relative to the thickness of the third oxide superconductivity region, a source electrode and a drain electrode provided on the first and second oxide superconducting regions, respectively, so that a superconducting current can flow through the superconducting channel between the source electrode and the drain electrode, a gate electrode formed through a gate insulator on the third oxide superconducting region for controlling the superconducting current flowing through the superconducting channel, and a side electrically insulating region formed to completely cover each of opposite side surfaces of the gate electrode, the first, second and third oxide superconducting regions being formed of the same oxide superconducting thin film, and the gate electrode being surrounded by the oxide superconductor thin film but electrically isolated from the oxide superconductor thin film by the gate insulator and the side electrically insulating region, the oxide superconductor thin film being formed of an oxide superconductor material selected from the group consisting of a Y--Ba--Cu--O compound oxide superconductor material, a Bi--Sr--Ca--CU--O compound oxide superconductor material, and a Tl--Ba--Ca--Cu--O compound oxide superconductor material, the first, second and third oxide superconducting regions being formed of a single c-axis orientated single crystal film, the gate insulator being formed of an insulating material which avoids formation of a large energy level density with the oxide superconductor material of the first, second and third oxide superconducting regions.

Claim 22

A superconducting device comprising a substrate having a principal surface, first and second oxide superconducting regions of a relatively thick thickness formed on the principal surface of the substrate separated from each other, and a third oxide superconducting region of an extremely thin thickness formed on the principal surface of the substrate between the first and second oxide superconducting regions to bridge the first and second oxide superconducting regions and to form a superconducting channel between the first and second oxide superconducting regions, the first and second oxide superconducting regions being thick relative to the thickness of the third oxide superconductivity region, a source electrode and a drain electrode provided on the first and second oxide superconducting regions, respectively, so that a superconducting current can flow through the superconducting channel between the source electrode and the drain electrode, a gate electrode formed through a gate insulator on the third oxide superconducting region for controlling the superconducting current flowing through the superconducting channel, and a side electrically insulating region formed to completely cover each of opposite side surfaces of the gate electrode, the first, second and third oxide superconducting regions being formed of the same oxide superconducting thin film, and the gate electrode being surrounded by the oxide superconductor thin film but electrically isolated from the oxide superconductor thin film by the gate insulator and the side electrically insulating region, the oxide superconductor thin film being formed of an oxide superconductor material selected from the group consisting of a Y--Ba--Cu--O compound oxide superconductor material, a Bi--Sr--Ca--CU--O compound oxide superconductor material, and a Tl--Ba--Ca--Cu--O compound oxide superconductor material, the first, second and third oxide superconducting regions being formed of a single c-axis orientated single crystal film, the gate insulator being formed of an insulating material which avoids formation of a large energy level density with the oxide superconductor material of the first, second and third oxide superconducting regions.

Claim 23

A superconducting device claimed in claim 18 wherein the gate electrode is formed of a refractory metal or a silicide thereof.

Claim 24

A superconducting device claimed in claim 18 wherein the substrate is formed of a material selected from the group consisting of a MgO (100) substrate, a SrTiO 3 (100) substrate and a CdNdAlO 4 (001) substrate, and a semiconductor substrate.

Claim 25

A superconducting device claimed in claim 18 wherein the third oxide superconducting region has a thickness of substantially 5 nm and the gate insulator is formed of MgO and has a thickness of not less than 10 nanometers.

Claim 26

A superconducting device claimed in claim 18 wherein the side electrical insulating region is formed of an electrical insulator material, and the gate electrode is embedded in the oxide superconductor thin film so that the gate electrode is isolated from the first, second and third oxide superconducting regions by the gate insulator and the side insulation region formed of the electrical insulator material.

Claim 27

A superconducting device claimed in claim 18 wherein the side electrically insulating region contacts all side surfaces of the gate-electrode, and contacts all side surfaces of the first and second superconducting regions that are in opposition to all said side surfaces of the gate electrode, whereby the gate electrode is embedded within the oxide superconductor thin film and wherein an upper surface of the gate electrode, an upper surface of the electrically insulating region, and an upper surface of the first and second superconducting regions are coextensively planar with one another.

Claim 28

A superconducting device comprising a substrate having a principal surface, first and second oxide superconducting regions formed on the principal surface of the substrate separated from each other, and a third oxide superconducting region of an extremely thin thickness formed on the principal surface of the substrate between the first and second oxide superconducting regions to bridge the first and second oxide superconducting regions and to form a superconducting channel between the first and second oxide superconducting regions, the first and second oxide superconducting regions being thick relative to the thickness of the third oxide superconductivity region, a source electrode and a drain electrode provided on the first and second oxide superconducting regions, respectively, so that a superconducting current can flow through the superconducting channel between the source electrode and the drain electrode, a gate electrode formed through a gate insulator on the third oxide superconducting region for controlling the superconducting current flowing through the superconducting channel, and a side electrically insulating region formed to completely cover each of opposite side surfaces of the gate electrode, the first, second and third oxide superconducting regions being formed of the same oxide superconducting thin film, and the gate electrode being surrounded by the oxide superconductor thin film but electrically isolated from the oxide superconductor thin film by the gate insulator and the side electrically insulating region, the oxide superconductor thin film being formed of an oxide superconductor material selected from the group consisting of a Y--Ba--Cu--O compound oxide superconductor material, a Bi--Sr--Ca--CU--O compound oxide superconductor material, and a Tl--Ba--Ca--Cu--O compound oxide superconductor material, the first, second and third oxide superconducting regions being formed of a single c-axis orientated single crystal film, the third oxide superconducting region having a thickness of substantially 5 nm and the gate insulator being formed of MgO and having a thickness of not less than 10 nanometers.

Claim 29

A superconducting device comprising a substrate having a principal surface, first and second oxide superconducting regions formed on the principal surface of the substrate separated from each other, and a third oxide superconducting region of an extremely thin thickness formed on the principal surface of the substrate between the first and second oxide superconducting regions to bridge the first and second oxide superconducting regions and to form a superconducting channel between the first and second oxide superconducting regions, the first and second oxide superconducting regions being thick relative to the thickness of the third oxide superconductivity region, a source electrode and a drain electrode provided on the first and second oxide superconducting regions, respectively, so that a superconducting current can flow through the superconducting channel between the source electrode and the drain electrode, a gate electrode formed through a gate insulator on the third oxide superconducting region for controlling the superconducting current flowing through the superconducting channel, and a side electrically insulating region formed to completely cover each of opposite side surfaces of the gate electrode, the first, second and third oxide superconducting regions being formed of the same oxide superconducting thin film, and the gate electrode being surrounded by the oxide superconductor thin film but electrically isolated from the oxide superconductor thin film by the gate insulator and the side electrically insulating region, the oxide superconductor thin film being formed of an oxide superconductor material selected from the group consisting of a Y--Ba--Cu--O compound oxide superconductor material, a Bi--Sr--Ca--CU--O compound oxide superconductor material, and a Tl--Ba--Ca--Cu--O compound oxide superconductor material, the first, second and third oxide superconducting regions being formed of a single c-axis orientated single crystal film, the third oxide superconducting region having a thickness of substantially 5 nm and the gate insulator being formed of MgO and having a thickness of not less than 10 nanometers.

Claim 30

A superconducting device claimed in claim 24 wherein the gate electrode is formed of a refractory metal or a silicide thereof.

Claim 31

A superconducting device claimed in claim 24 wherein the substrate is formed of a material selected from the group consisting of a MgO (100) substrate, a SrTiO 3 (100) substrate and a CdNdAlO 4 (001) substrate, and a semiconductor substrate.

Claim 32

A superconducting device claimed in claim 24 wherein the side electrical insulating region is formed of an electrical insulator material, and the gate electrode is embedded in the oxide superconductor thin film so that the gate electrode is isolated from the first, second and third oxide superconducting regions by the gate insulator and the side insulation region formed of the electrical insulator material.

Claim 33

A superconducting device claimed in claim 24 wherein the side electrically insulating region contacts all side surfaces of the gate electrode, and contacts all side surfaces of the first and second superconducting regions that are in opposition to all said side surfaces of the gate electrode, whereby the gate electrode is embedded within the oxide superconductor thin film and wherein an upper surface of the gate electrode, an upper surface of the electrically insulating region, and an upper surface of the first and second superconducting regions are coextensively planar with one another.