Method for forming a carbon doped silicon semiconductor device having a narrowed bandgap characteristic

Claim 3

The method of claim 1 wherein the step of forming the second layer comprises the steps of: forming the second layer on the first layer; ion implanting carbon into the second layer at an ion implantation dose of between 3.5E15 and 7.0E15 atoms/cm 2 ; and heating the second layer in an inert ambient to induce solid phase epitaxial regrowth of the second layer to substitutionally incorporate carbon into the second layer.

Claim 4

The method of claim 2 further comprising the steps of: forming a screen oxide layer on the second layer before the step of ion implanting carbon; and ion implanting silicon into the second layer at ion implantation dose of between 1.0E15 to 1.0E16 atoms/cm 2 before the step of heating the second layer.

Claim 5

The method of claim 1 wherein the step of forming the third layer comprises the steps of: forming a polysilicon layer on the second layer; ion implanting an n-type dopant into the polysilicon layer; and annealing the polysilicon layer to diffuse n-type dopant in the polysilicon layer into the second layer to form the third layer.

Claim 6

The method of claim 1 wherein the step of forming the first layer comprises: forming the first layer having an n-type dopant concentration in a range from 1.0E16 to 1.0E18 atoms/cm 3 .

Claim 7

The method of claim 1 wherein the step of forming the second layer comprises: forming the second layer having a boron concentration in a range from 1.0E18to 1.0E19 atoms/cm 3 .

Claim 8

A process for forming a carbon doped silicon semiconductor device having a narrowed bandgap characteristic comprising the steps of: providing a first crystalline semiconductor layer made substantially of silicon and having a first surface; and forming a second crystalline semiconductor layer on the first surface, wherein the second crystalline semiconductor layer is made substantially of silicon and a dopant to provide a narrowed bandgap, wherein the dopant that provides the narrowed bandgap consists essentially of carbon, and wherein carbon is present in the second crystalline semiconductor layer at a substitutional concentration of less than 1.5%, and wherein the first and second crystalline semiconductor layers form a first heterojunction.

Claim 9

A process for forming a carbon doped silicon semiconductor device having a narrowed bandgap characteristic comprising the steps of: providing a first crystalline semiconductor layer made substantially of silicon and having a first surface; and forming a second crystalline semiconductor layer on the first surface, wherein the second crystalline semiconductor layer is made substantially of silicon and a dopant to provide a narrowed bandgap, wherein the dopant that provides the narrowed bandgap consists essentially of carbon, and wherein carbon is present in the second crystalline semiconductor layer at a substitutional concentration of less than 1.5%, and wherein the first and second crystalline semiconductor layers form a first heterojunction.

Claim 10

The process of claim 7 wherein the step of forming the second crystalline semiconductor layer comprises: forming the second crystalline semiconductor layer made substantially of silicon on the first surface; ion implanting carbon into the second crystalline semiconductor layer at a carbon implant dose up to 7.0E15 atoms/cm 2 ; and annealing the second crystalline semiconductor layer in an inert atmosphere to generate solid phase epitaxial regrowth of the second crystalline semiconductor layer to substitutionally integrate carbon into the second crystalline semiconductor layer.

Claim 11

The process of claim 8 further comprising the steps of: forming a thin oxide before the step of ion implanting carbon; and ion implanting silicon into the second crystalline semiconductor layer at an ion implant dose between 1.0E15 and 1.0E16 atoms/cm 2 before the step of annealing the second crystalline semiconductor layer.

Claim 12

The process of claim 7 wherein the step of forming the second crystalline semiconductor layer comprises forming the second crystalline semiconductor layer in a chemical vapor deposition reactor.

Claim 13

The process of claim 7 wherein the step of forming the second crystalline semiconductor layer comprises forming the second crystalline semiconductor layer with molecular beam epitaxy.

Claim 14

The method of claim 7 wherein the step of providing the first crystalline semiconductor layer includes providing a first crystalline semiconductor layer having a first conductivity type, and wherein the step of forming the second crystalline semiconductor layer includes forming a second crystalline semiconductor layer having a second conductivity type, wherein the second conductivity type is different than the first conductivity type.

Claim 15

The method of claim 12 further comprising the steps of: forming a third crystalline semiconductor layer made substantially of silicon, wherein the third crystalline semiconductor layer is of the first conductivity type, and wherein the third crystalline semiconductor layer and the second crystalline semiconductor layer form a second heterojunction; forming a first ohmic contact on the first crystalline semiconductor layer to form a collector contact; forming a second ohmic contact on the second crystalline semiconductor layer to form a base contact; and forming a third ohmic contact on the third crystalline semiconductor layer to form an emitter contact, wherein the first, second, and third crystalline semiconductor layers form a heterojunction bipolar transistor.

Claim 16

A process for forming a heterojunction bipolar device comprising the steps of: forming a first semiconductor layer of a first conductivity type on a semiconductor substrate of the first conductivity type, wherein the first semiconductor layer is made substantially of silicon and forms a collector region; forming a second semiconductor layer of a second conductivity type, opposite the first conductivity type, on the first semiconductor layer, wherein the second semiconductor layer is made substantially of silicon and a dopant to provide a narrowed bandgap compared to silicon, and wherein the dopant that provides the narrowed bandgap consists essentially of carbon, and wherein the carbon is present in the second semiconductor layer at a substitutional concentration between 0.5% and 1.1%, and wherein the second semiconductor layer forms a base region; and forming a third semiconductor layer on at least a portion of the second semiconductor layer, wherein the third semiconductor layer is made substantially of silicon and doped in the first conductivity type to form an emitter region.

Claim 17

A process for forming a heterojunction bipolar device comprising the steps of: forming a first semiconductor layer of a first conductivity type on a semiconductor substrate of the first conductivity type, wherein the first semiconductor layer is made substantially of silicon and forms a collector region; forming a second semiconductor layer of a second conductivity type, opposite the first conductivity type, on the first semiconductor layer, wherein the second semiconductor layer is made substantially of silicon and a dopant to provide a narrowed bandgap compared to silicon, and wherein the dopant that provides the narrowed bandgap consists essentially of carbon, and wherein the carbon is present in the second semiconductor layer at a substitutional concentration between 0.5% and 1.1%, and wherein the second semiconductor layer forms a base region; and forming a third semiconductor layer on at least a portion of the second semiconductor layer, wherein the third semiconductor layer is made substantially of silicon and doped in the first conductivity type to form an emitter region.

Claim 18

The process of claim 14 wherein the step of forming the second semiconductor layer includes forming the second semiconductor layer with carbon present in the second semiconductor layer at a substitutional concentration of approximately 0.8%.

Claim 19

The process of claim 14 wherein the step of forming the second semiconductor layer comprises: forming the second semiconductor layer having an upper surface on the first semiconductor layer; implanting carbon into the upper surface at a implant dosage between 3.5E15 and 7.0E15 atoms/cm 2 ; and exposing the second semiconductor layer to an elevated temperature and an inert ambient to provide solid phase epitaxial regrowth of the second semiconductor layer to substitutionally incorporate carbon into the second semiconductor layer.

Claim 20

The process of claim 16 wherein the step of exposing the second semiconductor layer to the elevated temperature includes exposing the second semiconductor layer to a temperature of approximately 700° C. for approximately 30 minutes in a nitrogen ambient.

Claim 21

The process of claim 16 further comprising the step of implanting silicon into the upper surface of the second semiconductor layer at an implant dose between 1.0E15 and 1.0E16 atoms/cm 2 before the step of exposing the second semiconductor layer to the elevated temperature.

Claim 22

The process of claim 14 further comprising the steps of: forming a first metallization contact on a portion of the second semiconductor layer to form a base contact; forming a second metallization contact on the third semiconductor layer to form an emitter contact; and forming a third metallization contact on the substrate to form a collector contact.

Claim 23

The process of claim 19 wherein the step of forming the first metallization contact includes forming a platinum silicide base contact, and wherein the step of forming the second metallization contact includes forming a platinum silicide emitter contact.

Claim 24

The process of claim 14 wherein the step of forming the first semiconductor layer includes forming the first semiconductor layer doped with an n-type dopant at a concentration between 1.0E16 and 1.0E18 atoms/cm 3 , and wherein the step of forming the second semiconductor layer includes forming the second semiconductor layer doped with boron at a concentration between 1.0E18 and 1.0E19 atoms/cm 3 , and wherein the step of forming the third semiconductor layer includes forming the third semiconductor layer doped with an n-type dopant having a surface concentration of approximately 1.0E19 atoms/cm 3 .