US5429987A
Expired / Lapsed
US
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Method for profile control of selective metallization
Assignee: Sharp Corp
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Filing: 1993-01-25
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Granted: 1995-07-04
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Expires: 2013-01-25
Abstract
Abstract A method for forming interconnects in an integrated circuit chip which includes a plurality of active devices over which a layer of dielectric material is deposited. The method comprises: (a) depositing a selective nucleating layer on the dielectric layer; (b) depositing a sacrificial layer over the nucleating layer; (c) pattering the sacrificial layer and nucleating layer such that the resulting pattern of the nucleating layer and sacrificial layer is equivalent to the desired pattern of conductive lines; (d) depositing a sidewall guide material over the patterned sacrificial and nucleating layers; (e) forming sidewall guides; (f) removing the sacrificial layer; and (g) depositing conductive material between the sidewall guides and on the nucleating layer. The nucleating layer may comprise titanium nitride, the sacrificial layer may comprise silicon dioxide, the sidewall guide material may comprise silicon nitride, and the conductive material may comprise copper. In another aspect of the invention, a layer of silicon nitride may be provided over the conductive material.
Inventors
- 👤 Gregory L. Allen
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 22:15
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/056; H10W20/057; Y; Y10; Y10S; Y10S438/00; Y10S438/976
Claims Analysis
Total Claims: 21
Claim 1
Independent Claim
89 words
In a process for manufacturing an integrated circuit device wherein a series of manufacturing steps results in an insulating layer overlying at least one active device, a method of depositing material to couple the active devices in a selected manner, comprising: (a) depositing a selective nucleation layer of titanium nitride on the surface of the insulating layer; (b) forming vertically oriented sidewalls about the selective nucleation layer to define a region between the sidewalls for the material; (c) depositing the material within the sidewalls; and (d) removing the sidewalls.
Claim 2
Dependent Claim
89 words
In a process for manufacturing an integrated circuit device wherein a series of manufacturing steps results in an insulating layer overlying at least one active device, a method of depositing material to couple the active devices in a selected manner, comprising: (a) depositing a selective nucleation layer of titanium nitride on the surface of the insulating layer; (b) forming vertically oriented sidewalls about the selective nucleation layer to define a region between the sidewalls for the material; (c) depositing the material within the sidewalls; and (d) removing the sidewalls.
Claim 3
Dependent Claim
72 words
The method of claim 1 wherein said step (b) comprises the steps of depositing an inert layer over the selective nucleation layer, patterning the inert layer and the selective nucleation layer leaving a portion of the insulating layer exposed, depositing a sidewall material over the patterned inert layer, selective nucleation layer, and insulating layer, removing the inert layer a portion of and the sidewall material overlying the portion of the insulating layer.
Claim 4
Dependent Claim
25 words
The method of claim 2 wherein the step of depositing the sidewall material includes forming sidewalls adjacent the patterned inert layer and selective nucleation layer.
Claim 5
Dependent Claim
19 words
The method of claim 1 wherein said step (c) includes the step of selectively depositing copper between the sidewalls.
Claim 6
Dependent Claim
19 words
The method of claim 4 further including the step of depositing a layer of silicon nitride over the copper.
Claim 7
Independent Claim
107 words
A method of selectively depositing a conductive metal for use in integrated circuit fabrication, comprising: (a) depositing a selective nucleation layer on the surface of a dielectric layer; (b) depositing a sacrificial oxide layer over the selective nucleation layer, the sacrificial oxide having a preselected thickness; (c) patterning the sacrificial oxide and selective nucleation layers with an interconnect pattern desired for the conductive layer; (d) depositing an inert material over the patterned surface; (e) etching the inert material to create sidewall spacers adjacent the patterned regions of sacrificial oxide; (f) selectively etching the sacrificial oxide; and (g) selectively depositing a conductive material on the selective nucleation layer.
Claim 8
Independent Claim
107 words
A method of selectively depositing a conductive metal for use in integrated circuit fabrication, comprising: (a) depositing a selective nucleation layer on the surface of a dielectric layer; (b) depositing a sacrificial oxide layer over the selective nucleation layer, the sacrificial oxide having a preselected thickness; (c) patterning the sacrificial oxide and selective nucleation layers with an interconnect pattern desired for the conductive layer; (d) depositing an inert material over the patterned surface; (e) etching the inert material to create sidewall spacers adjacent the patterned regions of sacrificial oxide; (f) selectively etching the sacrificial oxide; and (g) selectively depositing a conductive material on the selective nucleation layer.
Claim 9
Dependent Claim
19 words
The method of claim 6 wherein said step (a) comprises reactively sputtering titanium nitride as the selective nucleation layer.
Claim 10
Dependent Claim
21 words
The method of claim 6 wherein said step (b) comprises depositing a silicon dioxide layer through plasma enhanced chemical vapor deposition.
Claim 11
Dependent Claim
19 words
The method of claim 6 wherein said step (d) comprises depositing silicon nitride by plasma enhanced chemical vapor deposition.
Claim 12
Dependent Claim
13 words
The method of claim 6 wherein said step (g) comprises selecting copper trimethylvinylsilane.
Claim 13
Independent Claim
112 words
A method for forming interconnects in an integrated circuit chip, the chip including a plurality of active devices over which a layer of dielectric material is deposited, comprising: (a) depositing a selective nucleating layer on the dielectric layer; (b) depositing a sacrificial layer over the nucleating layer; (c) patterning the sacrificial layer and nucleating layer such that the resulting pattern of the nucleating layer and sacrificial layer is equivalent to the desired pattern of conductive lines; (d) depositing a sidewall guide material over the patterned sacrificial and nucleating layers; (e) forming sidewall guides; (f) removing the sacrificial layer; and (g) depositing conductive material between the sidewall guides and on the nucleating layer.
Claim 14
Independent Claim
112 words
A method for forming interconnects in an integrated circuit chip, the chip including a plurality of active devices over which a layer of dielectric material is deposited, comprising: (a) depositing a selective nucleating layer on the dielectric layer; (b) depositing a sacrificial layer over the nucleating layer; (c) patterning the sacrificial layer and nucleating layer such that the resulting pattern of the nucleating layer and sacrificial layer is equivalent to the desired pattern of conductive lines; (d) depositing a sidewall guide material over the patterned sacrificial and nucleating layers; (e) forming sidewall guides; (f) removing the sacrificial layer; and (g) depositing conductive material between the sidewall guides and on the nucleating layer.
Claim 15
Dependent Claim
69 words
The method of claim 11 wherein said step (e) comprises the steps of depositing an inert layer over the selective nucleation layer, patterning the inert layer and the selective nucleation layer leaving a portion of the dielectric material exposed, depositing a sidewall material over the patterned inert layer, selective nucleation layer, and dielectric material, removing the inert layer and a portion of the sidewall material overlying the dielectric material.
Claim 16
Dependent Claim
30 words
The method of claim 12 wherein step (g) includes selectively depositing a metal interconnect layer which nucleates with the selective nucleation layer to form an interconnect layer between the sidewalls.
Claim 17
Dependent Claim
21 words
The method of claim 13 further including the step of (h) depositing a layer of silicon nitride over the metal interconnect.
Claim 18
Independent Claim
68 words
A method comprising: (a) providing a semiconductor substrate having a plurality of active components formed thereon; (b) depositing a nucleating layer over the semiconductor substrate; (c) patterning the nucleating layer; (d) forming vertically oriented sidewalls about the nucleating layer; and (e) depositing a conductive material within the vertical sidewalls such that the conductive material selectively deposits within the sidewalls due to the presence of the nucleating layer thereinbetween.
Claim 19
Independent Claim
68 words
A method comprising: (a) providing a semiconductor substrate having a plurality of active components formed thereon; (b) depositing a nucleating layer over the semiconductor substrate; (c) patterning the nucleating layer; (d) forming vertically oriented sidewalls about the nucleating layer; and (e) depositing a conductive material within the vertical sidewalls such that the conductive material selectively deposits within the sidewalls due to the presence of the nucleating layer thereinbetween.
Claim 20
Independent Claim
101 words
A method comprising: (a) depositing a layer of titanium nitride on the surface of a dielectric layer; (b) depositing a layer of silicon dioxide over the titanium nitride layer; (c) patterning the silicon dioxide and titanium nitride layers with an interconnect pattern; (d) depositing a layer of silicon nitride over the patterned surface; (e) etching the silicon nitride to create sidewall spacers adjacent the patterned regions of silicon dioxide; (f) selectively removing the silicon dioxide by etching the silicon dioxide; (g) depositing a conductive material which selectively deposits on the titanium nitride; and (h) depositing a second layer of silicon nitride.
Claim 21
Independent Claim
101 words
A method comprising: (a) depositing a layer of titanium nitride on the surface of a dielectric layer; (b) depositing a layer of silicon dioxide over the titanium nitride layer; (c) patterning the silicon dioxide and titanium nitride layers with an interconnect pattern; (d) depositing a layer of silicon nitride over the patterned surface; (e) etching the silicon nitride to create sidewall spacers adjacent the patterned regions of silicon dioxide; (f) selectively removing the silicon dioxide by etching the silicon dioxide; (g) depositing a conductive material which selectively deposits on the titanium nitride; and (h) depositing a second layer of silicon nitride.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-07-03 | 1999-01-02 | 1999-07-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-07-03 | 2003-01-02 | 2003-07-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-07-03 | 2007-01-02 | 2007-07-04 | $7700.00 | Window Closed / Lapsed |