Patent US5424964A successfully refreshed from Google Patents.
US5424964A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and system for optimizing a transistor model
Assignee: Texas Instruments Inc
•
Filing: 1993-04-13
•
Granted: 1995-06-13
•
Expires: 2013-04-13
Abstract
Abstract A modeling system 10 comprises a central processing unit 12 coupled to an arithmetic logic unit 16. A device testing system 18 is used to empirically analyze the operational characteristics of a transistor to be modeled by the system 10. A set of parameter values are stored in a memory circuit 14 coupled to central processing unit 12. An input and display system 20 is used to interact with the central processing unit 12. The central processing unit 12 uses the arithmetic logic unit 16 to calculate an objective function which is essentially a measure of the error between the measured values of operating variables of the device to be modeled and theoretical values of the operating variables calculated using initial guesses of modeling parameters. The objective function is minimized by calculating the gradient of the objection function to obtain a next guess point with its associated parameter values. If one of the parameter values for the next guess point violates a constraint on that parameter value, the gradient of the objective function is recalculated ignoring the particular parameter. The multiple iterations associated with the "hem-stitching" operations common with prior art systems are thus avoided.
Inventors
- 👤 Charles F. Machala, III
- 👤 James E. Flowers
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 03:41
CPC Classifications
G; G06; G06F; G06F30/00; G06F30/30; G06F30/36; G06F30/367
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
265 words
A method for designing a transistor on a computer modeling system, wherein a plurality of modeling parameters raze associated with various operating points of said transistor and certain ones of said plurality of modeling parameters having constraints associated with said certain ones of said plurality of parameters, said method comprising: measuring values of operating variables associated with various operating points of a transistor to be modeled using a transistor testing system; calculating initial values of said operating variables at the various operating points using an initial set of modeling parameters such that for each of the operating points there is a measured value and an initial calculated value; storing said initial calculated values and said measured values in a computer memory; calculating an initial objective function as a measure of the error between said calculated values and said measured values; calculating a next set of modeling parameters from said objective function; determining if any particular parameter within said next set of modeling parameters violates a constraint associated with the particular parameter; calculating a new next set of modeling parameters, responsive to said step of determining, wherein any particular parameter which violates the constraint associated with said parameter is ignored in said calculating of said new next set of modeling parameters; reiterating said calculating a new next set of modeling parameters until a final set of modeling parameters is found to be within said constraints; and designing a circuit comprising circuit transistors having similar operational characteristics as said transistor to be modeled using a circuit design system operable to use said final set of modeling parameters.
Claim 2
Independent Claim
265 words
A method for designing a transistor on a computer modeling system, wherein a plurality of modeling parameters raze associated with various operating points of said transistor and certain ones of said plurality of modeling parameters having constraints associated with said certain ones of said plurality of parameters, said method comprising: measuring values of operating variables associated with various operating points of a transistor to be modeled using a transistor testing system; calculating initial values of said operating variables at the various operating points using an initial set of modeling parameters such that for each of the operating points there is a measured value and an initial calculated value; storing said initial calculated values and said measured values in a computer memory; calculating an initial objective function as a measure of the error between said calculated values and said measured values; calculating a next set of modeling parameters from said objective function; determining if any particular parameter within said next set of modeling parameters violates a constraint associated with the particular parameter; calculating a new next set of modeling parameters, responsive to said step of determining, wherein any particular parameter which violates the constraint associated with said parameter is ignored in said calculating of said new next set of modeling parameters; reiterating said calculating a new next set of modeling parameters until a final set of modeling parameters is found to be within said constraints; and designing a circuit comprising circuit transistors having similar operational characteristics as said transistor to be modeled using a circuit design system operable to use said final set of modeling parameters.
Claim 3
Dependent Claim
27 words
The method of claim 1 wherein said step of calculating a next set of modeling parameters comprises the step of calculating a gradient of said objective function.
Claim 4
Dependent Claim
62 words
The method of claim 1 wherein said step of calculating a new next set of modeling parameters comprises calculating a gradient of said objective function by ignoring a term associated with said particular parameter such that said particular parameter's value in said new next set of modeling parameters is identical to said particular parameters value in said initial set of modeling parameters.
Claim 5
Dependent Claim
23 words
The method of claim 1 and further comprising determining a minimum value of said objective function with said final set of modeling parameters.
Claim 6
Dependent Claim
66 words
The method of claim 1 wherein said step of calculating a new next set of modeling parameters comprises calculating a gradient of said objective function by ignoring a term associated with said particular parameter such that said particular parameter's value in said new next set of modeling parameters is identical to said particular parameters value in said set of modeling parameters before said constraint was violated.
Claim 7
Independent Claim
263 words
A method for designing a transistor on a computer modeling system, wherein a plurality of modeling parameters are associated with various operating points of said transistor and certain ones of said plurality of modeling parameters having constraints associated with said certain ones of said plurality of parameters, said method comprising: measuring values of operating variables associated with various operating points of a transistor to be modeled using a transistor testing system; calculating initial values of said operating variables at the various operating points using an initial set of modeling parameters such that for each of the operating points there is a measured value and an initial calculated value; storing said initial calculated values and said measured values in a computer memory; calculating an initial objective function as a measure of the error between said calculated values and said measured values; calculating a next set of modeling parameters from said objective function; determining if any particular parameter within said next set of modeling parameters violates a constraint associated with the particular parameter; calculating a new next set of modeling parameters, responsive to said step of determining, wherein any particular parameter which violates the constraint associated with said parameter is ignored in said calculating of said new next set of modeling parameters; reiterating said calculating a new next set of modeling parameters until a final set of modeling parameters is found to be within said constraints; and designing a transistor having similar modeling parameters as said final set of modeling parameters using a circuit design system operable to use said final set of modeling parameters.
Claim 8
Independent Claim
263 words
A method for designing a transistor on a computer modeling system, wherein a plurality of modeling parameters are associated with various operating points of said transistor and certain ones of said plurality of modeling parameters having constraints associated with said certain ones of said plurality of parameters, said method comprising: measuring values of operating variables associated with various operating points of a transistor to be modeled using a transistor testing system; calculating initial values of said operating variables at the various operating points using an initial set of modeling parameters such that for each of the operating points there is a measured value and an initial calculated value; storing said initial calculated values and said measured values in a computer memory; calculating an initial objective function as a measure of the error between said calculated values and said measured values; calculating a next set of modeling parameters from said objective function; determining if any particular parameter within said next set of modeling parameters violates a constraint associated with the particular parameter; calculating a new next set of modeling parameters, responsive to said step of determining, wherein any particular parameter which violates the constraint associated with said parameter is ignored in said calculating of said new next set of modeling parameters; reiterating said calculating a new next set of modeling parameters until a final set of modeling parameters is found to be within said constraints; and designing a transistor having similar modeling parameters as said final set of modeling parameters using a circuit design system operable to use said final set of modeling parameters.
Claim 9
Dependent Claim
27 words
The method of claim 6, wherein said step of calculating a next set of modeling parameters comprises the step of calculating a gradient of said objective function.
Claim 10
Dependent Claim
62 words
The method of claim 6, wherein said step of calculating a new next set of modeling parameters comprises calculating a gradient of said objective function by ignoring a term associated with said particular parameter such that said particular parameter's value in said new next set of modeling parameter is identical to said particular parameter's value in said initial set of modeling parameters.
Claim 11
Dependent Claim
23 words
The method of claim 6, and further comprising determining a minimum value of said objective function with said final set of modeling parameters.
Claim 12
Dependent Claim
66 words
The method of claim 6, wherein said step of calculating a new next set of modeling parameters comprises calculating a gradient of said objective function by ignoring a term associated with said particular parameter such that said particular parameter's value in said new next set of modeling parameters is identical to said particular parameter's value in said set of modeling parameters before said constraint was violated.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-06-12 | 1998-12-12 | 1999-06-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-06-12 | 2002-12-12 | 2003-06-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-06-12 | 2006-12-12 | 2007-06-13 | $7700.00 | Window Closed / Lapsed |