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US5394246A Expired / Lapsed US ⏱️ 0.0 years remaining

Bonding wire inspection apparatus and method

Assignee: Shinkawa Ltd
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Filing: 1994-07-07
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Granted: 1995-02-28
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Expires: 2014-07-07
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Abstract

Abstract An apparatus for inspecting wires bonded between the pads of a semiconductor chip and the leads of a lead frame including: an illuminating assembly that emits lights, via LED's that are arranged in a ring-shape, onto the object of inspection such as the ball at the end of a bonded wire; an optical assembly that images the object of inspection which is illuminated by the illumination assembly, and cameras that photograph the image taken in by the optical assembly. When the ball, particularly its shape, is inspected, a dark field illumination circumstance is created by the illuminating assembly so that only the ball can appear bright. In this case, a diaphragm of the optical assembly is also adjusted so as to create a shallow focal depth for the ball.

Inventors

  • 👤 Kenji Sugawara

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 12:38
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/84; G01N21/88; G01N21/8806; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2853; G01R31/302; G01R31/308; G01R31/311; G01N2021/8822; G01N21/8851; G01N2021/8887; G01N2201/00; G01N2201/06; G01N2201/061; G01N2201/06146; G01N2201/06153; G01N2201/10; G01N2201/102; H; H10; H10W; H10W72/00; H10W72/071; H10W72/0711; H10W72/075; H10W72/07531; H10W72/50; H10W72/531; H10W72/536; H10W72/5363; H10W72/541; H10W72/5449; H10W72/551; H10W72/552; H10W72/5522; H10W72/59; H10W72/851; H10W72/874; H10W72/884; H10W72/90; H10W72/931; H10W72/932; H10W72/951; H10W90/00; H10W90/701; H10W90/751; H10W90/756

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 143 words
A bonding wire inspection apparatus that inspects wires bonded between the pads of a semiconductor chip and the leads of a lead frame comprising: a ring-form illumination means made up of plural LED's arranged in a ring shape so as to illuminate an object of inspection at inclined angles to provide dark field illumination; a vertical illuminator for illuminating said object to provide bright field illumination; an optical means that receives light reflected by said object and images said object; and cameras that photograph the image taken in by said optical means; and wherein said optical means further comprises a diaphragm means provided only in an optical path of said cameras, said diaphragm means having variable opening diameter to provide a wide opening for shallow optical depth of focus or a small opening to provide a large optical depth of field of focus.
Claim 2
Dependent Claim 143 words
A bonding wire inspection apparatus that inspects wires bonded between the pads of a semiconductor chip and the leads of a lead frame comprising: a ring-form illumination means made up of plural LED's arranged in a ring shape so as to illuminate an object of inspection at inclined angles to provide dark field illumination; a vertical illuminator for illuminating said object to provide bright field illumination; an optical means that receives light reflected by said object and images said object; and cameras that photograph the image taken in by said optical means; and wherein said optical means further comprises a diaphragm means provided only in an optical path of said cameras, said diaphragm means having variable opening diameter to provide a wide opening for shallow optical depth of focus or a small opening to provide a large optical depth of field of focus.
Claim 3
Dependent Claim 28 words
A bonding wire inspection apparatus according to claim 1, wherein said optical means further comprises a high magnification imaging lens group and a low magnification imaging lens group.
Claim 4
Dependent Claim 34 words
An apparatus according to claim 2, wherein said diaphragm means comprises at least two diaphragms, one of said two diaphragms being provided only in an optical path of said low magnification imaging lens group.
Claim 5
Dependent Claim 19 words
An apparatus according to claim 3, wherein an opening diameter of each of said two diaphragms is independently varied.

References Cited (Backward Citations)

JPH02129942A Cited
US5030008A Cited
JPH0376137A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1998-02-27 1998-08-29 1999-02-28 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2002-02-27 2002-08-29 2003-02-28 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2006-02-27 2006-08-29 2007-02-28 $7700.00 Window Closed / Lapsed

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