US5393993A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Buffer structure between silicon carbide and gallium nitride and resulting semiconductor devices
Assignee: Wolfspeed Inc
•
Filing: 1993-12-13
•
Granted: 1995-02-28
•
Expires: 2013-12-13
Abstract
Abstract A transition crystal structure is disclosed for providing a good lattice and thermal match between a layer of single crystal silicon carbide and a layer of single crystal gallium nitride. The transition structure comprises a buffer formed of a first layer of gallium nitride and aluminum nitride, and a second layer of gallium nitride and aluminum nitride adjacent to the first layer. The mole percentage of aluminum nitride in the second layer is substantially different from the mole percentage of aluminum nitride in the first layer. A layer of single crystal gallium nitride is formed upon the second layer of gallium nitride. In preferred embodiments, the buffer further comprises an epitaxial layer of aluminum nitride upon a silicon carbide substrate.
Inventors
- 👤 John A. Edmond
- 👤 Vladimir Dmitriev
- 👤 Kenneth Irvine
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 01:25
CPC Classifications
H; H10; H10H; H10H20/00; H10H20/01; H10H20/011; H10H20/013; H10H20/0133; H10H20/01335; H10H20/80; H10H20/81; H10H20/815; H10H20/817
Claims Analysis
Total Claims: 30
Claim 1
Independent Claim
102 words
A transition crystal structure for providing a good lattice and thermal match between single crystal silicon carbide and a layer of single crystal gallium nitride, said transition structure comprising: a buffer formed of a first layer of gallium nitride and aluminum nitride; and a second layer of gallium nitride and aluminum nitride adjacent to said first layer, and in which the mole percentage of aluminum nitride in said second layer is substantially different from the mole percentage of aluminum nitride in said first layer; and a layer of single crystal gallium nitride upon said second layer of gallium nitride and aluminum nitride.
Claim 2
Dependent Claim
102 words
A transition crystal structure for providing a good lattice and thermal match between single crystal silicon carbide and a layer of single crystal gallium nitride, said transition structure comprising: a buffer formed of a first layer of gallium nitride and aluminum nitride; and a second layer of gallium nitride and aluminum nitride adjacent to said first layer, and in which the mole percentage of aluminum nitride in said second layer is substantially different from the mole percentage of aluminum nitride in said first layer; and a layer of single crystal gallium nitride upon said second layer of gallium nitride and aluminum nitride.
Claim 3
Dependent Claim
55 words
A structure according to claim 1 wherein the mole percentage of gallium nitride in said first layer is greater than the mole percentage of aluminum nitride in said first layer; and wherein the mole percentage of aluminum nitride in said second layer is greater than the mole percentage of gallium nitride in said second layer.
Claim 4
Dependent Claim
30 words
A structure according to claim 2 further comprising a single crystal silicon carbide substrate; and said buffer further comprising an epitaxial layer of aluminum nitride upon said silicon carbide substrate.
Claim 5
Dependent Claim
26 words
A structure according to claim 3 wherein said first layer of gallium nitride and aluminum nitride is between about 20 and 50 mole percent aluminum nitride.
Claim 6
Dependent Claim
23 words
A structure according to claim 3 wherein said first layer of gallium nitride and aluminum nitride is about 30 mole percent aluminum nitride.
Claim 7
Dependent Claim
26 words
A structure according to claim 3 wherein said second layer of gallium nitride and aluminum nitride is between about 60 and 95 mole percent aluminum nitride.
Claim 8
Dependent Claim
23 words
A structure according to claim 3 wherein said second layer of gallium nitride and aluminum nitride is about 90 mole percent aluminum nitride.
Claim 9
Dependent Claim
25 words
A structure according to claim 3 wherein said substrate is selected from the group consisting of the 6H, 4H, and 3C polytypes of silicon carbide.
Claim 10
Dependent Claim
94 words
A vertical device precursor structure comprising: a single crystal silicon carbide substrate; a buffer upon said substrate; and a single crystal layer of gallium nitride upon said buffer; wherein said buffer comprises, an epitaxial layer of aluminum nitride upon said silicon carbide substrate a first layer of gallium nitride and aluminum nitride; and a second layer of gallium nitride and aluminum nitride adjacent to said first layer, and in which the mole percentage of aluminum nitride in said second layer is substantially different from the mole percentage of aluminum nitride in said first layer.
Claim 11
Dependent Claim
94 words
A vertical device precursor structure comprising: a single crystal silicon carbide substrate; a buffer upon said substrate; and a single crystal layer of gallium nitride upon said buffer; wherein said buffer comprises, an epitaxial layer of aluminum nitride upon said silicon carbide substrate a first layer of gallium nitride and aluminum nitride; and a second layer of gallium nitride and aluminum nitride adjacent to said first layer, and in which the mole percentage of aluminum nitride in said second layer is substantially different from the mole percentage of aluminum nitride in said first layer.
Claim 12
Dependent Claim
55 words
A structure according to claim 9 wherein the mole percentage of gallium nitride in said first layer is greater than the mole percentage of aluminum nitride in said first layer; and wherein the mole percentage of aluminum nitride in said second layer is greater than the mole percentage of gallium nitride in said second layer.
Claim 13
Dependent Claim
28 words
A vertical device precursor according to claim 9 wherein said first layer of gallium nitride and aluminum nitride is between about 20 and 50 mole percent aluminum nitride.
Claim 14
Dependent Claim
25 words
A vertical device precursor according to claim 9 wherein said first layer of gallium nitride and aluminum nitride is about 30 mole percent aluminum nitride.
Claim 15
Dependent Claim
28 words
A vertical device precursor according to claim 9 wherein said second layer of gallium nitride and aluminum nitride is between about 60 and 95 mole percent aluminum nitride.
Claim 16
Dependent Claim
25 words
A vertical device precursor according to claim 9 wherein said second layer of gallium nitride and aluminum nitride is about 90 mole percent aluminum nitride.
Claim 17
Dependent Claim
27 words
A vertical device precursor according to claim 9 wherein said substrate is selected from the group consisting of the 6H, 4H, and 3C polytypes of silicon carbide.
Claim 18
Dependent Claim
164 words
A vertical light emitting diode formed from single crystal gallium nitride upon single crystal silicon carbide, said light emitting diode comprising: a single crystal silicon carbide substrate; a buffer upon said substrate; a first single crystal layer of gallium nitride upon said buffer and having a first conductivity type; a second single crystal layer of gallium nitride upon said first gallium nitride layer, and having the opposite conductivity type from said first gallium nitride layer, said first and second layers forming a p-n junction therebetween; and ohmic contacts to said substrate and to said second gallium nitride layer; wherein said buffer comprises, an epitaxial layer of aluminum nitride upon said silicon carbide substrate, a first layer of gallium nitride and aluminum nitride, and a second layer of gallium nitride and aluminum nitride adjacent to said first layer, and in which the mole percentage of aluminum nitride in said second layer is substantially different from the mole percentage of aluminum nitride in said first layer.
Claim 19
Dependent Claim
164 words
A vertical light emitting diode formed from single crystal gallium nitride upon single crystal silicon carbide, said light emitting diode comprising: a single crystal silicon carbide substrate; a buffer upon said substrate; a first single crystal layer of gallium nitride upon said buffer and having a first conductivity type; a second single crystal layer of gallium nitride upon said first gallium nitride layer, and having the opposite conductivity type from said first gallium nitride layer, said first and second layers forming a p-n junction therebetween; and ohmic contacts to said substrate and to said second gallium nitride layer; wherein said buffer comprises, an epitaxial layer of aluminum nitride upon said silicon carbide substrate, a first layer of gallium nitride and aluminum nitride, and a second layer of gallium nitride and aluminum nitride adjacent to said first layer, and in which the mole percentage of aluminum nitride in said second layer is substantially different from the mole percentage of aluminum nitride in said first layer.
Claim 20
Dependent Claim
14 words
A light emitting diode according to claim 16 wherein said buffer is conductively doped.
Claim 21
Dependent Claim
34 words
A light emitting diode according to claim 16 wherein said buffer is an insulator and wherein said diode further comprises shorting contacts between said substrate and said first single crystal layer of gallium nitride.
Claim 22
Dependent Claim
28 words
A light emitting diode according to claim 16 wherein said first layer of gallium nitride and aluminum nitride is between about 20 and 50 mole percent aluminum nitride.
Claim 23
Dependent Claim
25 words
A light emitting diode according to claim 16 wherein said first layer of gallium nitride and aluminum nitride is about 30 mole percent aluminum nitride.
Claim 24
Dependent Claim
28 words
A light emitting diode according to claim 16 wherein said second layer of gallium nitride and aluminum nitride is between about 60 and 95 mole percent aluminum nitride.
Claim 25
Dependent Claim
25 words
A light emitting diode according to claim 16 wherein said second layer of gallium nitride and aluminum nitride is about 90 mole percent aluminum nitride.
Claim 26
Dependent Claim
28 words
A light emitting diode according to claim 16 and further comprising an epitaxial layer of a gallium nitride alloy between said first and second layers of gallium nitride.
Claim 27
Dependent Claim
17 words
A light emitting diode according to claim 23 wherein said gallium nitride alloy comprises indium gallium nitride.
Claim 28
Dependent Claim
22 words
A light emitting diode according to claim 16 having a peak emission at a wavelength of between about 410 and 470 nanometers.
Claim 29
Dependent Claim
22 words
A light emitting diode according to claim 16 having a peak emission at a wavelength of between about 470 and 560 nanometers.
Claim 30
Dependent Claim
18 words
A light emitting diode according to claim 16 wherein said substrate comprises the 6H polytype of silicon carbide.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-02-27 | 1998-08-29 | 1999-02-28 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-02-27 | 2002-08-29 | 2003-02-28 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-02-27 | 2006-08-29 | 2007-02-28 | $7700.00 | Window Closed / Lapsed |