Dynamic random access memory having improved layout

Claim 2

A dynamic random access memory having a plurality of memory cells, comprising: a semiconductor substrate having a plurality of active regions, wherein each memory cell includes an active region having a first impurity diffusion region, a second impurity diffusion region in common with an adjacent memory cell, and a channel forming region located between the first and second impurity diffusion regions, the first impurity diffusion regions of adjacent active regions being located at positions symmetrical with respect to the common second impurity diffusion region; a plurality of uniformly spaced word lines formed on said semiconductor substrate, each of the word lines extending obliquely with respect to the channel forming region of each corresponding active region; a plurality of uniformly spaced bit lines formed on the semiconductor substrate and extending perpendicularly to the word lines, each of the bit lines having a center line extending obliquely with respect to the channel forming region of each corresponding active region; a plurality of capacitors each having a center located longitudinally between two adjacent bit lines and laterally between two adjacent word lines; and an insulation layer having first contact holes for connecting the first impurity diffusion regions to the corresponding capacitors and second contact holes for connecting the second impurity diffusion regions to the corresponding bit lines, each of the second contact holes being arranged between respective first contact holes of two adjacent memory cells such that an imaginary line connecting a second contact hole and adjacent first contact holes is bent at a predetermined angle and is not a straight line.

Claim 3

A dynamic random access memory as claimed in claim 1, wherein adjacent active regions form a sea gull wing shape including a body corresponding to the second impurity diffusion region in common with the two adjacent active regions, inner wing portions corresponding to the channel forming regions of the two adjacent active regions, and outer wing portions corresponding to the first impurity diffusion regions of the two adjacent active regions.

Claim 4

A dynamic random access memory as claimed in claim 2, wherein each first impurity diffusion region corresponding to each outer wing portion of the sea gull wing shape has an oblique upper surface facing adjacent active regions arranged adjacent thereto and an irregular width so that the first impurity diffusion region is positioned a predetermined distance away from the adjacent active regions arranged adjacent thereto.

Claim 5

A dynamic random access memory as claimed in claim 2, wherein the body, inner wing portions and outer wing portions of the sea gull wing shape have different widths from one another.

Claim 6

A dynamic random access memory as claimed in claim 2, wherein the end of each of the outer wing portions having the irregular width is disposed above the corresponding bit line.

Claim 7

A dynamic random access memory as claimed in claim 3, wherein each outer wing portion has an upper surface extending obliquely with respect to the center line of the bit line and a lower surface extending in parallel to the center line of the bit line.

Claim 8

A dynamic random access memory as claimed in claim 3, wherein the extension direction of the upper surface of each outer wing portion is opposite to that of the corresponding channel forming region.

Claim 9

A dynamic random access memory as claimed in claim 1, wherein the center of each second contact hole is located on the center line of the corresponding bit line, the center of each first contact hole is located on the center of the corresponding capacitor, and the size of each first contact hole is determined so that the first contact hole is positioned at least a predetermined distance away from the two word lines and the two bit lines arranged adjacent thereto.

Claim 10

A dynamic random access memory as claimed in claim 8, wherein the line connecting the center of each first contact hole and the center of each corresponding second contact hole is of V shape having a predetermined angle.

Claim 11

A dynamic random access memory as claimed in claim 1, wherein each channel forming region extends obliquely at an angle of about 30° with respect to the corresponding bit line and at an angle of about 60° with respect to the corresponding word line.

Claim 12

A dynamic random access memory having a plurality of memory cells, comprising: a plurality of active regions, wherein each memory cell includes an active region having a first impurity diffusion region, a second impurity diffusion region in common with an adjacent memory cell and a channel forming region positioned between the first and second impurity diffusion regions and extending obliquely with respect to a word line functioning as a gate and a bit line arranged adjacent thereto, the first impurity diffusion regions of two adjacent active regions being located at positions symmetrical with respect to the common second impurity diffusion region; a plurality of bit lines, the bit lines being perpendicular to the word lines with each bit line having a protrusion extending in a direction parallel to the word lines, the location of the protrusion being in the corresponding second impurity diffusion region between respective channel forming regions of two adjacent memory cells, and with each bit line having at a desired area a bent portion adapted to position the bit line away from the protrusion of an adjacent bit line, thereby preventing short-circuiting from occurring between the two bit lines; a plurality of capacitors each having a center located between two adjacent bit lines and between two adjacent word lines; and a plurality of word lines each having at a desired area a bent portion adapted to maintain the word lines away from first contact holes, wherein the first contact holes serve to electrically connect each first impurity diffusion region to each corresponding capacitor, the bent portion also adapted to maintain the word lines away from second contact holes, wherein the second contact holes serve to electrically connect each second impurity diffusion region to each corresponding bit line, thereby preventing short-circuiting from occurring therebetween.

Claim 13

A dynamic random access memory having a plurality of memory cells, comprising: a plurality of active regions, wherein each memory cell includes an active region having a first impurity diffusion region, a second impurity diffusion region in common with an adjacent memory cell and a channel forming region positioned between the first and second impurity diffusion regions and extending obliquely with respect to a word line functioning as a gate and a bit line arranged adjacent thereto, the first impurity diffusion regions of two adjacent active regions being located at positions symmetrical with respect to the common second impurity diffusion region; a plurality of bit lines, the bit lines being perpendicular to the word lines with each bit line having a protrusion extending in a direction parallel to the word lines, the location of the protrusion being in the corresponding second impurity diffusion region between respective channel forming regions of two adjacent memory cells, and with each bit line having at a desired area a bent portion adapted to position the bit line away from the protrusion of an adjacent bit line, thereby preventing short-circuiting from occurring between the two bit lines; a plurality of capacitors each having a center located between two adjacent bit lines and between two adjacent word lines; and a plurality of word lines each having at a desired area a bent portion adapted to maintain the word lines away from first contact holes, wherein the first contact holes serve to electrically connect each first impurity diffusion region to each corresponding capacitor, the bent portion also adapted to maintain the word lines away from second contact holes, wherein the second contact holes serve to electrically connect each second impurity diffusion region to each corresponding bit line, thereby preventing short-circuiting from occurring therebetween.

Claim 14

A dynamic random access memory as claimed in claim 11, wherein the second impurity diffusion region and the second contact hole are located at a portion of the corresponding bit line at which the protrusion is disposed.

Claim 15

A dynamic random access memory as claimed in claim 12, wherein the center of the second contact hole is elongated along the center line of the width of the protrusion, where the direction of the center line of the width of the protrusion is the same as the direction of the protrusion, and the center line is orthogonal to the center line of the bit line.

Claim 16

A dynamic random access memory as claimed in claim 11, wherein the shape of the first contact hole is similar to that of the capacitor and the shape of the second contact hole is approximately identical to that of the bit line protrusion.

Claim 17

A dynamic random access memory as claimed in claim 14, wherein the shape of the first contact hole approximates a rectangular shape and the shape of the second contact hole approximates a circular shape.

Claim 18

A dynamic random access memory as claimed in claim 11, wherein the first impurity diffusion region, the second impurity diffusion region and the channel forming region constituting one active region are not aligned with one another in a linear manner, thereby providing a process margin.

Claim 19

A dynamic random access memory as claimed in claim 11, wherein the channel region extends obliquely at an angle of about 30° with respect to the corresponding bit line and at an angle of about 60° with respect to the corresponding word line.

Claim 20

A dynamic random access memory as claimed in claim 11, wherein the protrusion of each bit line does not extend beyond the line connecting centers of first contact holes of two adjacent memory cells which share the same second contact holes.

Claim 21

A dynamic random access memory as claimed in claim 11, wherein each word line has a uniform width at its portion located in each corresponding channel forming region of two adjacent active regions symmetrically arranged with each other, thereby maintaining the switch-off characteristic of the resulting transistor, and at its portion located next to the first impurity diffusion region of an adjacent memory cell a bent portion having a width varying such that the word line is maintained away from the adjacent active regions of neighboring memory cells at a predetermined distance.

Claim 22

A dynamic random access memory as claimed in claim 11, wherein the center of the first contact hole corresponds to the center of the corresponding capacitor.

Claim 23

A dynamic random access memory as claimed in claim 11, wherein each memory cell is disposed within a rectangular region, wherein the direction that the channel forming region of a memory cell extends is approximately parallel to a diagonal line of the rectangular region in which the memory cell is disposed.

Claim 24

A dynamic random access memory as claimed in claim 21, wherein each memory cell is disposed within a rectangular region defined by connecting respective lower edge centers of two second contact holes arranged diagonally adjacent to each other.

Claim 25

A dynamic random access memory as claimed in claim 11, wherein the bent portion of each bit line has a shape similar to the upper portion of the protrusion of adjacent bit line.