US5378646A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Process for producing closely spaced conductive lines for integrated circuits
Assignee: United Microelectronics Corp
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Filing: 1994-07-07
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Granted: 1995-01-03
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Expires: 2014-07-07
Abstract
Abstract A process of fabricating a non-volatile read only memory device (ROM) wherein the conductive word lines have desirable very narrow widths and are closely spaced. The invention provides a process for forming word lines with a smaller width and line pitch than is possible with conventional processes. A first set of word lines is formed. Next, a second set of word lines is formed in between the first word lines using oxide spacers to define the second word lines.
Inventors
- 👤 Heng-Sheng Huang
- 👤 Kun-Luh Chen
- 👤 Wood Wu
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 19:10
CPC Classifications
H; H10; H10B; H10B20/00; H10B20/27; H10B20/30
Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
284 words
A method of forming a plurality of closely spaced word lines on the top surface of a semiconductor substrate, comprising the steps of: providing a first thin insulating layer on the surface the semiconductor substrate, depositing a first conductive polysilicon blanket layer over the first insulating layer, depositing a photoresist layer over the first conductive polysilicon blanket layer, exposing, developing and etching the photoresist layer to form a pattern of elongated spaced parallel resist lines, anisotrophically etching the first conductive layer, using the photoresist pattern as a mask, to form first spaced conductive polysilicon lines with substantially vertical sidewalls and exposing portions of the first insulating layer, removing the photoresist layer, depositing a thin conformal polysilicon layer over the first conductive lines and over the exposed portions first insulating layer, completely oxidizing the thin conformal polysilicon layer and portions of the first conductive polysilicon lines to form a conformal silicon oxide layer over the first conductive polysilicon lines, anisotrophically etching the conformal silicon oxide layer exposing the top surfaces of the first conductive lines and forming spacers having vertical sidewalls, on the vertical sidewalls of the first conductive lines and exposing areas of the substrate between the spacers, oxidizing the exposed top surfaces of the first conductive lines and the exposed areas of the substrate between the spacers to form a second thin insulating layer, depositing a second conductive polysilicon layer having a substantially planar top surface on the substrate over the first conductive lines having a thickness in excess of the first conductive lines measured from the substrate surface, and anisotrophically etching the second polycrystalline silicon layer to a depth below the top of the second insulating layer thereby forming second conductive lines.
Claim 2
Independent Claim
284 words
A method of forming a plurality of closely spaced word lines on the top surface of a semiconductor substrate, comprising the steps of: providing a first thin insulating layer on the surface the semiconductor substrate, depositing a first conductive polysilicon blanket layer over the first insulating layer, depositing a photoresist layer over the first conductive polysilicon blanket layer, exposing, developing and etching the photoresist layer to form a pattern of elongated spaced parallel resist lines, anisotrophically etching the first conductive layer, using the photoresist pattern as a mask, to form first spaced conductive polysilicon lines with substantially vertical sidewalls and exposing portions of the first insulating layer, removing the photoresist layer, depositing a thin conformal polysilicon layer over the first conductive lines and over the exposed portions first insulating layer, completely oxidizing the thin conformal polysilicon layer and portions of the first conductive polysilicon lines to form a conformal silicon oxide layer over the first conductive polysilicon lines, anisotrophically etching the conformal silicon oxide layer exposing the top surfaces of the first conductive lines and forming spacers having vertical sidewalls, on the vertical sidewalls of the first conductive lines and exposing areas of the substrate between the spacers, oxidizing the exposed top surfaces of the first conductive lines and the exposed areas of the substrate between the spacers to form a second thin insulating layer, depositing a second conductive polysilicon layer having a substantially planar top surface on the substrate over the first conductive lines having a thickness in excess of the first conductive lines measured from the substrate surface, and anisotrophically etching the second polycrystalline silicon layer to a depth below the top of the second insulating layer thereby forming second conductive lines.
Claim 3
Dependent Claim
27 words
The method of claim 1 wherein said first thin insulating layer is formed of silicon oxide having a thickness in the range of 80 to 200 Angstroms.
Claim 4
Dependent Claim
23 words
The method of claim 1 wherein said first conductive polysilicon blanket layer has a thickness in the range of 2000 to 4000 Angstroms.
Claim 5
Dependent Claim
31 words
The method of claim 1 wherein said first conductive blanket layer is doped Arsenic or Phosphorous impurity ions in a concentration in the range of 5E18 to 5E21 Atoms/cm 3 .
Claim 6
Dependent Claim
35 words
The method of claim 1 wherein said first conductive polysilicon lines have an initial width in the range of 0.4 to 0.8 microns, and an initial pitch in the range of 0.8 to 0.16 microns.
Claim 7
Dependent Claim
23 words
The method of claim 1 wherein the thin conformal polycrystalline silicon layer has a thickness in the range of 500 to 2000 Angstroms.
Claim 8
Dependent Claim
22 words
The method of claim 1 wherein the conformal silicon oxide layer has a thickness in the range of 2000 to 4000 Angstroms.
Claim 9
Dependent Claim
19 words
The method of claim 1 wherein the spacers have a width in the range of 1000 to 4000 Angstroms.
Claim 10
Dependent Claim
22 words
The method of claim 1 wherein the second thin insulating layer has a thickness in the range of 80 to 200 Angstroms.
Claim 11
Dependent Claim
32 words
The method of claim 1 wherein said second conductive blanket layer is doped with Arsenic or Phosphorous impurity ions in a concentration in the range of 5E18 to 5E21 Atoms/cm 3 .
Claim 12
Independent Claim
169 words
A method of forming a device having a plurality of closely spaced polysilicon lines on the surface of a semiconductor substrate, comprising the steps of: providing a first insulating layer on the surface the semiconductor substrate, forming a plurality of first spaced polysilicon lines with substantially vertical sidewalls on the first insulating layer, oxidizing portions of the first polysilicon lines and the substrate to form a conformal silicon oxide layer over the substrate and the first polysilicon lines, anisotrophically etching the conformal silicon oxide layer to expose the top surfaces of the first polysilicon lines forming silicon oxide spacers, having vertical sidewalls, on the polysilicon line sidewalls and exposing areas of the substrate between the spacers, oxidizing the exposed top surface of the first polysilicon lines and the exposed areas of the substrate between the spacers to form a second insulating layer, depositing a second polycrystalline silicon layer having a substantially planar top surface on the substrate, and anisotrophically etching the second polycrystalline silicon layer forming second polysilicon lines.
Claim 13
Independent Claim
169 words
A method of forming a device having a plurality of closely spaced polysilicon lines on the surface of a semiconductor substrate, comprising the steps of: providing a first insulating layer on the surface the semiconductor substrate, forming a plurality of first spaced polysilicon lines with substantially vertical sidewalls on the first insulating layer, oxidizing portions of the first polysilicon lines and the substrate to form a conformal silicon oxide layer over the substrate and the first polysilicon lines, anisotrophically etching the conformal silicon oxide layer to expose the top surfaces of the first polysilicon lines forming silicon oxide spacers, having vertical sidewalls, on the polysilicon line sidewalls and exposing areas of the substrate between the spacers, oxidizing the exposed top surface of the first polysilicon lines and the exposed areas of the substrate between the spacers to form a second insulating layer, depositing a second polycrystalline silicon layer having a substantially planar top surface on the substrate, and anisotrophically etching the second polycrystalline silicon layer forming second polysilicon lines.
Claim 14
Dependent Claim
34 words
The method of claim 11 wherein said first polysilicon lines have an initial width in the range of 0.4 to 0.8 microns, and an initial pitch in the range of 0.8 to 1.6 microns.
Claim 15
Dependent Claim
21 words
The method of claim 11 wherein the first polysilicon lines have a thickness in the range of 2000 to 4000 Angstroms.
Claim 16
Dependent Claim
28 words
The method of claim 11 wherein a thin conformal polycrystalline silicon layer is deposited over the first polysilicon lines and the exposed portions of the first insulating layer.
Claim 17
Dependent Claim
23 words
The method of claim 14 wherein the thin conformal polycrystalline silicon layer has a thickness in the range of 500 to 2000 Angstroms.
Claim 18
Dependent Claim
30 words
The method of claim 14 wherein the thin conformal polycrystalline silicon layer is completely oxidized to form said conformal silicon oxide layer over the substrate and the first polysilicon lines.
Claim 19
Dependent Claim
16 words
The method of claim 11 wherein the first polysilicon lines are made conductive by insitu doping.
Claim 20
Dependent Claim
17 words
The method of claim 11 wherein the said first polysilicon lines are made conductive by ion implantation.
Claim 21
Dependent Claim
21 words
The method of claim 11 wherein the silicon oxide spacers have a width in the range of 1000 to 4000 Angstroms.
Claim 22
Dependent Claim
21 words
The method of claim 11 wherein the second insulating layer has a thickness in the range of 80 to 200 Angstroms.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-01-02 | 1998-07-04 | 1999-01-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-01-02 | 2002-07-04 | 2003-01-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-01-02 | 2006-07-04 | 2007-01-03 | $7700.00 | Window Closed / Lapsed |