Abstract The present invention provides a programmable structure for a programmable read-only memory (PROM) which utilizes one-sided ozone spacers constructed on the digit lines as one time programmable nodes. An oxide/nitride/oxide layer (ONO) is used as an interface between underlying parallel rows of digit lines, having one-sided ozone spacers, and overlying parallel columns of word lines in a programmable read only memory. With a each digit line passing under each word line in a row/column matrix is formed thereby providing a programmable digit/word line matrix. Each crossing point of the digit and word lines in the matrix will be permanently programmed to either a one or a zero by rupturing the thin ONO dielectric interface by applying the appropriate voltage potential between the associated digit/word line conductors.
A process to fabricate a one time programmable structure on a starting substrate of an integrated circuit comprising: a) forming an isolative dielectric layer superjacent said substrate; b) placing a first conductive material superjacent said isolative dielectric layer; c) forming a first dielectric layer superjacent said first conductive material; d) patterning said first conductive material and said first dielectric layer thereby forming first conductive lines spaced apart in parallel rows, said conductive lines having first and second sides; forming a second dielectric layer superjacent and coextensive said first conductive lines and exposed portions of said isolative dielectric layer; f) patterning said second dielectric layer thereby forming a thick dielectric spacer superjacent said first side of each said first conductive lines; g) forming a third dielectric layer blanketing said thick dielectric spacer, said second side of said first conductive lines and said first dielectric; h) placing a second conductive material superjacent said third dielectric layer; and i) patterning second conductive material thereby forming second conductive lines spaced apart in parallel columns, said parallel columns overlying said first conductive lines in an intersecting angular fashion.
Claim 2
Dependent Claim
183 words
A process to fabricate a one time programmable structure on a starting substrate of an integrated circuit comprising: a) forming an isolative dielectric layer superjacent said substrate; b) placing a first conductive material superjacent said isolative dielectric layer; c) forming a first dielectric layer superjacent said first conductive material; d) patterning said first conductive material and said first dielectric layer thereby forming first conductive lines spaced apart in parallel rows, said conductive lines having first and second sides; forming a second dielectric layer superjacent and coextensive said first conductive lines and exposed portions of said isolative dielectric layer; f) patterning said second dielectric layer thereby forming a thick dielectric spacer superjacent said first side of each said first conductive lines; g) forming a third dielectric layer blanketing said thick dielectric spacer, said second side of said first conductive lines and said first dielectric; h) placing a second conductive material superjacent said third dielectric layer; and i) patterning second conductive material thereby forming second conductive lines spaced apart in parallel columns, said parallel columns overlying said first conductive lines in an intersecting angular fashion.
Claim 3
Dependent Claim
10 words
The process of claim 1 wherein said substrate comprises silicon.
Claim 4
Dependent Claim
19 words
The process of claim 1 wherein said isolative dielectric, said first dielectric and said third dielectric layers comprise oxide.
Claim 5
Dependent Claim
12 words
The process of claim 7 wherein said third dielectric layer comprises ozone.
Claim 6
Dependent Claim
18 words
The process of claim 1 wherein said third dielectric layer comprises ozone formed form a TEOS source gas.
Claim 7
Dependent Claim
12 words
The process of claim 1 wherein said second dielectric layer comprises oxide/nitride/oxide.
Claim 8
Dependent Claim
16 words
The process of claim 1 wherein said first and said second conductive materials comprise doped polysilicon.
Claim 9
Dependent Claim
22 words
The process of claim 7 wherein the vertical width of said first conductor is the limiting lithography resolution dimension of said process.