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US5126290A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of making memory devices utilizing one-sided ozone teos spacers

Assignee: Micron Technology Inc
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Filing: 1991-09-11
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Granted: 1992-06-30
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Expires: 2011-09-11
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Abstract

Abstract The present invention provides a programmable structure for a programmable read-only memory (PROM) which utilizes one-sided ozone spacers constructed on the digit lines as one time programmable nodes. An oxide/nitride/oxide layer (ONO) is used as an interface between underlying parallel rows of digit lines, having one-sided ozone spacers, and overlying parallel columns of word lines in a programmable read only memory. With a each digit line passing under each word line in a row/column matrix is formed thereby providing a programmable digit/word line matrix. Each crossing point of the digit and word lines in the matrix will be permanently programmed to either a one or a zero by rupturing the thin ONO dielectric interface by applying the appropriate voltage potential between the associated digit/word line conductors.

Inventors

  • 👤 Tyler A. Lowrey
  • 👤 Ruojia Lee

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 21:26
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/69; H10P14/692; H10P14/6921; H10P14/69215; H10B; H10B20/00; H10B20/20; H10B20/25; H10P14/63; H10P14/6326; H10P14/6328; H10P14/6334; H10P14/66; H10P14/662; H10P14/694; H10P14/6943; H10P14/69433; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/064; H10W20/065; H10W20/071; H10W20/081; H10W20/40; H10W20/49; H10W20/491; Y; Y10; Y10S; Y10S257/00; Y10S257/90

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 183 words
A process to fabricate a one time programmable structure on a starting substrate of an integrated circuit comprising: a) forming an isolative dielectric layer superjacent said substrate; b) placing a first conductive material superjacent said isolative dielectric layer; c) forming a first dielectric layer superjacent said first conductive material; d) patterning said first conductive material and said first dielectric layer thereby forming first conductive lines spaced apart in parallel rows, said conductive lines having first and second sides; forming a second dielectric layer superjacent and coextensive said first conductive lines and exposed portions of said isolative dielectric layer; f) patterning said second dielectric layer thereby forming a thick dielectric spacer superjacent said first side of each said first conductive lines; g) forming a third dielectric layer blanketing said thick dielectric spacer, said second side of said first conductive lines and said first dielectric; h) placing a second conductive material superjacent said third dielectric layer; and i) patterning second conductive material thereby forming second conductive lines spaced apart in parallel columns, said parallel columns overlying said first conductive lines in an intersecting angular fashion.
Claim 2
Dependent Claim 183 words
A process to fabricate a one time programmable structure on a starting substrate of an integrated circuit comprising: a) forming an isolative dielectric layer superjacent said substrate; b) placing a first conductive material superjacent said isolative dielectric layer; c) forming a first dielectric layer superjacent said first conductive material; d) patterning said first conductive material and said first dielectric layer thereby forming first conductive lines spaced apart in parallel rows, said conductive lines having first and second sides; forming a second dielectric layer superjacent and coextensive said first conductive lines and exposed portions of said isolative dielectric layer; f) patterning said second dielectric layer thereby forming a thick dielectric spacer superjacent said first side of each said first conductive lines; g) forming a third dielectric layer blanketing said thick dielectric spacer, said second side of said first conductive lines and said first dielectric; h) placing a second conductive material superjacent said third dielectric layer; and i) patterning second conductive material thereby forming second conductive lines spaced apart in parallel columns, said parallel columns overlying said first conductive lines in an intersecting angular fashion.
Claim 3
Dependent Claim 10 words
The process of claim 1 wherein said substrate comprises silicon.
Claim 4
Dependent Claim 19 words
The process of claim 1 wherein said isolative dielectric, said first dielectric and said third dielectric layers comprise oxide.
Claim 5
Dependent Claim 12 words
The process of claim 7 wherein said third dielectric layer comprises ozone.
Claim 6
Dependent Claim 18 words
The process of claim 1 wherein said third dielectric layer comprises ozone formed form a TEOS source gas.
Claim 7
Dependent Claim 12 words
The process of claim 1 wherein said second dielectric layer comprises oxide/nitride/oxide.
Claim 8
Dependent Claim 16 words
The process of claim 1 wherein said first and said second conductive materials comprise doped polysilicon.
Claim 9
Dependent Claim 22 words
The process of claim 7 wherein the vertical width of said first conductor is the limiting lithography resolution dimension of said process.

References Cited (Backward Citations)

US4876220A Cited
US5017515A Cited
US4981810A Cited
US5053351A Cited
US5084406A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-06-30 1995-12-30 1996-06-30 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-06-30 1999-12-30 2000-06-30 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-06-30 2003-12-30 2004-06-30 $7700.00 Window Closed / Lapsed

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