US5366910A
Expired / Lapsed
US
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Process for the production of thin film transistors using on SOG film
Assignee: SK Hynix Inc
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Filing: 1993-09-28
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Granted: 1994-11-22
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Expires: 2013-09-28
Abstract
Abstract A process for producing a thin film transistor suitable to a high integrated static ram (SRAM) or a liquid crystal display, thereby improvements in a leak current and an operating current along with a process for the production of a thin film transistor. The process comprises a step of forming a SOG film in a predetermined thickness on the entire upper surface of a TFT structure and subsequently treating the SOG film with O 2 plasma to increase the hydrogen content therein, a step of depositing an insulating film on the SOG film to prevent the hydrogen of SOG film from escaping therefrom and thereafter, applying heat treatment to the SOG film to infiltrating the hydrogen of the SOG film into a channel formed in a polysilicon layer in the TFT structure, and a step of removing the insulating film and the SOG film. There may be reduced a leak current when switching off the TFT as well as increased an operating current when switching on the TFT. Accordingly, in accordance with the present invention, the characteristics of TFT is greatly improved.
Inventors
- 👤 Hyoung C. Ha
- 👤 Dong K. Choi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 20:14
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/021; H10D30/031; H10D30/0312; H10D30/0314; H10D30/0316; H10D30/0321; H10P; H10P95/00; H10P95/08; H10P95/94
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
205 words
A process for producing a thin film transistor, said process comprising the steps of: (a) providing a thin film transistor structure having a source, a drain, a channel polysilicon layer, and an upper surface above the source, the drain, and the channel polysilicon layer; (b) following said step (a), forming an inter-layer insulating film on the upper surface of the thin film transistor structure; (c) following said step (a), depositing a metal to contact the source, the drain, and the channel polysilicon layer, respectively, to form a resulting TFT structure having an upper surface; (d) following said steps (b) and (c), forming an insulating film on the upper surface of the resulting TFT structure; (e) following said step (d), coating the insulating film with a spin-on-glass film having a hydrogen content; (f) following said step (e), treating the spin-on-glass film with a plasma including an oxygen atom; (g) following said step (f), exposing the spin-on-glass film to a hydrogen-containing atmosphere to increase the hydrogen content of the spin-on-glass film; (h) following said step (g), depositing a protective film on the spin-on-glass film; and (i) following said step (h), applying a heat treatment to the spin-on-glass film to infiltrate the hydrogen into the channel polysilicon layer.
Claim 2
Dependent Claim
205 words
A process for producing a thin film transistor, said process comprising the steps of: (a) providing a thin film transistor structure having a source, a drain, a channel polysilicon layer, and an upper surface above the source, the drain, and the channel polysilicon layer; (b) following said step (a), forming an inter-layer insulating film on the upper surface of the thin film transistor structure; (c) following said step (a), depositing a metal to contact the source, the drain, and the channel polysilicon layer, respectively, to form a resulting TFT structure having an upper surface; (d) following said steps (b) and (c), forming an insulating film on the upper surface of the resulting TFT structure; (e) following said step (d), coating the insulating film with a spin-on-glass film having a hydrogen content; (f) following said step (e), treating the spin-on-glass film with a plasma including an oxygen atom; (g) following said step (f), exposing the spin-on-glass film to a hydrogen-containing atmosphere to increase the hydrogen content of the spin-on-glass film; (h) following said step (g), depositing a protective film on the spin-on-glass film; and (i) following said step (h), applying a heat treatment to the spin-on-glass film to infiltrate the hydrogen into the channel polysilicon layer.
Claim 3
Dependent Claim
18 words
The process according to claim 1, wherein in said step (f), the plasma is an O 2 plasma.
Claim 4
Dependent Claim
19 words
The process according to claim 1, wherein in said step (f), the plasma is an N 2 O plasma.
Claim 5
Dependent Claim
41 words
The process according to claim 1, wherein in said step (a), the thin film transistor structure has a top structure, and wherein said process further comprises the step of forming a gate over the channel polysilicon layer, following said step (d).
Claim 6
Dependent Claim
41 words
The process according to claim 1, wherein in said step (a), the thin film transistor structure has a bottom structure, and wherein said process further comprises the step of forming a gate below the channel polysilicon layer, following said step (d).
Claim 7
Dependent Claim
161 words
A process for producing a thin film transistor, said process comprising the steps of: (a) constructing in a conventional manner a thin film transistor structure having a gate electrode of polysilicon layer, a gate insulating film, a source electrode of polysilicon layer, a drain electrode of polysilicon layer, a channel polysilicon layer, and an upper surface above the source, the drain, and the channel polysilicon layer; (b) following said step (a), forming a spin-on-glass film on the upper surface of the thin film transistor; (c) treating the spin-on-glass film with a plasma including an oxygen atom, the spin-on-glass film having a hydrogen content; (d) following said step (c), exposing the spin-on-glass film to a hydrogen-containing atmosphere to increase the hydrogen content of the spin-on-glass film; (e) following said step (d), depositing a protective film on the spin-on-glass film; and (f) following said step (e), applying a heat treatment to the spin-on-glass film to infiltrate the hydrogen into the channel polysilicon layer.
Claim 8
Dependent Claim
161 words
A process for producing a thin film transistor, said process comprising the steps of: (a) constructing in a conventional manner a thin film transistor structure having a gate electrode of polysilicon layer, a gate insulating film, a source electrode of polysilicon layer, a drain electrode of polysilicon layer, a channel polysilicon layer, and an upper surface above the source, the drain, and the channel polysilicon layer; (b) following said step (a), forming a spin-on-glass film on the upper surface of the thin film transistor; (c) treating the spin-on-glass film with a plasma including an oxygen atom, the spin-on-glass film having a hydrogen content; (d) following said step (c), exposing the spin-on-glass film to a hydrogen-containing atmosphere to increase the hydrogen content of the spin-on-glass film; (e) following said step (d), depositing a protective film on the spin-on-glass film; and (f) following said step (e), applying a heat treatment to the spin-on-glass film to infiltrate the hydrogen into the channel polysilicon layer.
Claim 9
Dependent Claim
18 words
The process according to claim 6, wherein in said step (c), the plasma is an O 2 plasma.
Claim 10
Dependent Claim
19 words
The process according to claim 6, wherein in said step (c), the plasma is an N 2 O plasma.
Claim 11
Dependent Claim
19 words
The process according to claim 6, wherein in said step (e), the protective film is a silicon oxide film.
Claim 12
Dependent Claim
41 words
The process according to claim 6, wherein in said step (a), the thin film transistor structure has a bottom structure, and wherein said process further comprises the step of forming a gate below the channel polysilicon layer, following said step (a).
Claim 13
Dependent Claim
41 words
The process according to claim 6, wherein in said step (a), the thin film transistor structure has a top structure, and wherein said process further comprises the step of forming a gate over the channel polysilicon layer, following said step (a).
References Cited (Backward Citations)
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