US5366851A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Device fabrication process
Assignee: Nokia Bell Labs
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Filing: 1993-09-16
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Granted: 1994-11-22
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Expires: 2013-09-16
Abstract
Abstract The sensitivity and dry etching pattern control of chemically amplified resists used in the production of devices such as electronic devices is substantially enhanced while image quality is improved through use of a specific expedient. In particular, the resist material after coating on the device substrate, is treated, e.g., heated to sufficiently high temperatures, to remove a portion of the protective groups on the polymeric component of the resist. Generally, when removal up to approximately 90% of the protective groups for substituents such as t-butoxycarboxyl is effected through this procedure, sensitivities as good as 10 mJ/cm 2 for an X-ray exposure (λ=14Å) have been achieved, and both the image quality and dry etching pattern control are improved.
Inventors
- 👤 Anthony E. Novembre
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 23:11
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/26; G03F7/38; G03F7/004; G03F7/039; G03F7/16; G03F7/168; G03F7/40
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
124 words
A process for producing a device comprising the steps of depositing a radiation sensitive material on a substrate baking said material, exposing said material to patterned actinic radiation, baking said material after said exposure, subjecting said material to a developer to delineate a pattern, and employing said material with said pattern in fabricating said device characterized in that said radiation sensitive material comprises a material having a substituent including a protective group and that after said baking after exposure but before said subjecting said material to developer a sufficient amount of said protective groups are removed from said material such that the difference in thickness between exposed and non-exposed regions is less than 30 percent of the thickness of said material in non-exposed regions.
Claim 2
Dependent Claim
124 words
A process for producing a device comprising the steps of depositing a radiation sensitive material on a substrate baking said material, exposing said material to patterned actinic radiation, baking said material after said exposure, subjecting said material to a developer to delineate a pattern, and employing said material with said pattern in fabricating said device characterized in that said radiation sensitive material comprises a material having a substituent including a protective group and that after said baking after exposure but before said subjecting said material to developer a sufficient amount of said protective groups are removed from said material such that the difference in thickness between exposed and non-exposed regions is less than 30 percent of the thickness of said material in non-exposed regions.
Claim 3
Dependent Claim
22 words
The process of claim 1 wherein said bake before exposure is done at a temperature in the range 130° to 180° C.
Claim 4
Dependent Claim
22 words
The process of claim 2 wherein said bake after exposure is done at a temperature in the range 105° to 150° C.
Claim 5
Dependent Claim
22 words
The process of claim 1 wherein said bake after exposure is done at a temperature in the range 105° to 150° C.
Claim 6
Dependent Claim
11 words
The process of claim 1 wherein said protective group comprises t-butoxycarbonyl.
Claim 7
Dependent Claim
12 words
The process of claim 5 wherein said material comprises poly (4-t-butoxycarbonyloxystyrene-co-sulfur dioxide).
Claim 8
Dependent Claim
12 words
The process of claim 1 wherein said material comprises poly (4-t-butoxycarbonyloxystyrene-co-sulfur dioxide).
Claim 9
Dependent Claim
27 words
The process of claim 1 wherein said radiation sensitive material includes a composition separate from said material that generates an acid upon said exposure to said radiation.
References Cited (Backward Citations)
US4415653A
Cited
EP0081633A1
Cited
US4491628A
Cited
EP0211161A1
Cited
US4812542A
Cited
EP0330386A2
Cited
US4996136A
Cited
CA2001384A1
Cited
EP0440374A2
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-11-21 | 1998-05-23 | 1998-11-22 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-11-21 | 2002-05-23 | 2002-11-22 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-11-21 | 2006-05-23 | 2006-11-22 | $7700.00 | Window Closed / Lapsed |