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US5364802A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of making a semiconductor device with buried electrode

Assignee: Canon Inc
•
Filing: 1993-10-01
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Granted: 1994-11-15
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Expires: 2013-10-01
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Abstract

Abstract A semiconductor device including a bipolar transistor, has a collector region including a first semiconductor region of the first conductivity type and a second semiconductor region of the first conductivity type having higher resistance than the first semiconductor region, a base region including a semiconductor region of the second conductivity type, and an emitter region including a semiconductor region of the first conductivity type. The semiconductor device further comprises a metal layer region for connecting the first semiconductor region and the collector electrode on the collector region provided within the second semiconductor region layer of the collector region.

Inventors

  • 👤 Yuzo Kataoka
  • 👤 Toshihiko Ichise
  • 👤 Keiji Ishizuka
  • 👤 Tetsuo Asaba

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 05:11
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/012; H10D84/00; H10D84/40; H10D84/401; H10D10/00; H10D10/01; H10D10/051; H10D62/00; H10D62/10; H10D62/13; H10D62/137; H10D64/00; H10D64/20; H10D64/23; H10D64/231; H10D84/01; H10D84/0107; H10D84/0109; H10P; H10P14/00; H10P14/20; H10P14/24; H10W; H10W10/00; H10W10/01; H10W10/031; H10W10/30; H10W20/00; H10W20/01; H10W20/021

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 201 words
A method for producing a semiconductor device including a bipolar transistor, comprising the steps of: forming a first semiconductor region of a first conductivity type; forming a second semiconductor region of the first conductivity type on the first region so that the first and second regions form a collector region, the second region having a higher resistivity than that of the first region; forming a third semiconductor region of a second conductivity type, for defining a base region, on the second region; forming a fourth region of a first conductivity type semiconductor, for defining an emitter region, on the third region; forming a groove in the second region so as to expose a surface portion of the first region; forming contact holes in the third and fourth regions, the contact holes having depths smaller than a depth of the groove; forming collector, base and emitter electrodes in the groove and in the contact holes in the third and fourth regions, respectively, by means of a selective deposition process having a first process step in which only the groove is filled with a metal material, and a separate and subsequent step in which the contact holes are filled with a metal material.
Claim 2
Independent Claim 201 words
A method for producing a semiconductor device including a bipolar transistor, comprising the steps of: forming a first semiconductor region of a first conductivity type; forming a second semiconductor region of the first conductivity type on the first region so that the first and second regions form a collector region, the second region having a higher resistivity than that of the first region; forming a third semiconductor region of a second conductivity type, for defining a base region, on the second region; forming a fourth region of a first conductivity type semiconductor, for defining an emitter region, on the third region; forming a groove in the second region so as to expose a surface portion of the first region; forming contact holes in the third and fourth regions, the contact holes having depths smaller than a depth of the groove; forming collector, base and emitter electrodes in the groove and in the contact holes in the third and fourth regions, respectively, by means of a selective deposition process having a first process step in which only the groove is filled with a metal material, and a separate and subsequent step in which the contact holes are filled with a metal material.
Claim 3
Dependent Claim 12 words
A method according to claim 1, wherein the metal material is alkylaluminumhydride.
Claim 4
Dependent Claim 35 words
A method according to claim 1, wherein the base and emitter electrodes are formed in a first chamber, and a wiring connected to the base and the emitter electrodes is formed in a second chamber.

References Cited (Backward Citations)

US4086694A Cited
US4780425A Cited
US5270224A Cited
US5213999A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-11-14 1998-05-16 1998-11-15 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-11-14 2002-05-16 2002-11-15 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-11-14 2006-05-16 2006-11-15 $7700.00 Window Closed / Lapsed

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