Patent US5362356A successfully refreshed from Google Patents.
US5362356A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Plasma etching process control
Assignee: LSI Corp
•
Filing: 1992-01-14
•
Granted: 1994-11-08
•
Expires: 2012-01-14
Abstract
Abstract A passive, in-line method of monitoring film removal (or deposition) during plasma etching (or deposition) based on interference phenomena is disclosed. Plasma emission intensity is monitored at a selected wavelength, without additional illuminating apparatus, and variations in plasma emission intensity are correlated to remaining film thickness, etch rate and uniformity, and etch selectivity. The method is useful in conjunction with nitride island etch, polysilicon etch, oxide spacer etch, contact etch, etc. The method is also useful in determining a particular remaining film thickness (e.g., just prior to clearing) at which point the etch recipe can be changed from a high-rate, low selectivity etch to a low-rate, high-selectivity etch.
Inventors
- 👤 Philippe Schoenborn
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 12:30
CPC Classifications
H; H10; H10D; H10D64/00; H10D64/01; H10D64/013; H10D64/01302; H10D64/01304; H10P; H10P50/00; H10P50/20; H10P50/26; H10P50/264; H10P50/266; H10P50/267; H10P50/268; H10P50/71
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
99 words
Method of monitoring removal of a film on a product wafer during plasma etching, comprising: removing a film on a wafer, overlying an underlying material, by a plasma etching process with a plasma having an emission intensity, said film having an initial thickness prior to etching and a remaining thickness during etching; while etching the film, monitoring the plasma emission intensity at a selected wavelength, said monitoring occurring non-perpendicularly to the wafer; and correlating variations in the plasma emission intensity, attributable to reflected light interference phenomena, by observing a cyclic pattern in emission intensity, to the remaining film thickness.
Claim 2
Dependent Claim
99 words
Method of monitoring removal of a film on a product wafer during plasma etching, comprising: removing a film on a wafer, overlying an underlying material, by a plasma etching process with a plasma having an emission intensity, said film having an initial thickness prior to etching and a remaining thickness during etching; while etching the film, monitoring the plasma emission intensity at a selected wavelength, said monitoring occurring non-perpendicularly to the wafer; and correlating variations in the plasma emission intensity, attributable to reflected light interference phenomena, by observing a cyclic pattern in emission intensity, to the remaining film thickness.
Claim 3
Dependent Claim
16 words
Method according to claim 1, further comprising: determining the selectivity (film:underlying material) of the etching process.
Claim 4
Dependent Claim
22 words
Method according to claim 1, further comprising: determining etch rate and uniformity based on changes in the plasma emission intensity during etching.
Claim 5
Dependent Claim
10 words
Method according to claim 1, wherein: the film is nitride.
Claim 6
Dependent Claim
10 words
Method according to claim 1, wherein: the film is polysilicon.
Claim 7
Dependent Claim
10 words
Method according to claim 1, wherein: the film is oxide.
Claim 8
Dependent Claim
12 words
Method according to claim 1, wherein: the underlying material includes a contact.
Claim 9
Dependent Claim
44 words
Method according to claim 1, further comprising: etching the wafer with a high-rate, low-selectivity (film:underlying material) etch recipe until a known film thickness remains; and thereafter continuing to etch with a low-rate, high-selectivity (film:underlying material) etch recipe until the film is at least cleared.
Claim 10
Dependent Claim
33 words
Method according to claim 8, further comprising: continuing to etch after the film has been cleared from the underlying material using the low-rate, high-selectivity etch recipe, to ensure that the film is cleared.
Claim 11
Dependent Claim
112 words
Method, according to claim 1, further comprising: determining, prior to etching, an initial thickness "d 0 " for the underlying material; determining, after completion of etching, a minimum final thickness "d m " for the underlying material; etching for a total etch time of "T E ", including any overetch; determining a time "t 1 " whereupon the film begins clearing from the wafer; determining an etch rate "E", averaged across the wafer, for the film being etched; determining a uniformity "u" of the etch rate "E"; and estimating a selectivity "R m " of etch rates between the film and the underlying material, according to the relationship: R.sub.m =E(1-u)(T.sub.E -t.sub.1)/(d.sub.0 -d.sub.m).
Claim 12
Dependent Claim
115 words
Method, according to claim 1, further comprising: determining, prior to etching, an initial thickness "d 0 " for the underlying material; determining, after completion of etching, an average remaining thickness "d a " for the underlying material; determining an endpoint of etching, exclusive of any overetch; determining a time "T" as the etching time required to reach the endpoint of etching; etching for a total time of "T E ", including any overetch; determining an etch rate "E", averaged across the wafer, for the film being etched; and estimating a selectivity "R m " of etch rate between the film and the underlying material, according to the relationship: R=E(T E -T)/(d 0 -d a ).
Claim 13
Dependent Claim
107 words
Method, according to claim 1, further comprising: determining an endpoint of etching, exclusive of any overetch; determining a time "T" as the etching time required to reach the endpoint of etching; and determining a uniformity "u" of the film subsequent to etching, according to the relationship: u=[-δ+{δ.sup.2 +4(1+δU.sub.n)}.sup.1/2 ]/2; wherein: "δ"=2T dS/dT / (S.sub.∞ -S o ); "S" is the plasma emission intensity measured during etching; "S.sub.∞ " is the plasma emission intensity measured after complete clearing of the film; "S o " is the plasma emission intensity measured prior to the endpoint of etching; and "U n " is the initial, pre-etch uniformity of the film.
References Cited (Backward Citations)
US4312732A
Cited
US4357195A
Cited
US4415402A
Cited
US4457820A
Cited
US4454001A
Cited
US4444618A
Cited
US4493745A
Cited
US4680084A
Cited
US4717446A
Cited
US4687539A
Cited
US4936967A
Cited
US4847792A
Cited
US4846928A
Cited
US4861419A
Cited
US5023188A
Cited
US5139904A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-11-07 | 1998-05-09 | 1998-11-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-11-07 | 2002-05-09 | 2002-11-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-11-07 | 2006-05-09 | 2006-11-08 | $7700.00 | Window Closed / Lapsed |