US5355081A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for testing a semiconductor integrated circuit having self testing circuit
Assignee: Panasonic Holdings Corp
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Filing: 1993-05-20
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Granted: 1994-10-11
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Expires: 2013-05-20
Abstract
Abstract A method is provided for testing a semiconductor integrated circuit including a main circuit, a self testing circuit for testing at least one part of the functions of the main circuit, and a test result output circuit having at least one light emitting device for outputting results from the self testing circuit in the form of light. The method includes the steps of inputting a test start to the self testing circuit so as to initiate operation of the self testing circuit; detecting light emitted from the light emitting device with an optical system, the light being emitted based on the test results from the self testing circuit; and obtaining the test results based on the light detection.
Inventors
- 👤 Yoshiro Nakata
- 👤 Atsushi Fujiwara
- 👤 Akinori Shibayama
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-07 18:54
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2884
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
117 words
A method of testing a semiconductor integrated circuit comprising a main circuit, a self testing circuit for testing at least one part of functions of said main circuit, and a test result output circuit having at least one light emitting device for outputting test results from said self testing circuit in the form of light, said method comprising the steps of: inputting a test start signal to said self testing circuit so as to initiate operation of said self testing circuit; detecting light emitted from said light emitting device with an optical system, said light being emitted based on said test results from said self testing circuit; and obtaining said test results based on said light detection.
Claim 2
Independent Claim
117 words
A method of testing a semiconductor integrated circuit comprising a main circuit, a self testing circuit for testing at least one part of functions of said main circuit, and a test result output circuit having at least one light emitting device for outputting test results from said self testing circuit in the form of light, said method comprising the steps of: inputting a test start signal to said self testing circuit so as to initiate operation of said self testing circuit; detecting light emitted from said light emitting device with an optical system, said light being emitted based on said test results from said self testing circuit; and obtaining said test results based on said light detection.
Claim 3
Independent Claim
154 words
A method of testing a plurality of semiconductor integrated circuits formed on a substrate, each of said plurality of semiconductor integrated circuits comprising a main circuit, a self testing circuit for testing at least one part of functions of said main circuit, and a test result output circuit having at least one light emitting device for outputting test results from said self testing circuit in the form of light in a two-dimensional distribution, said method comprising the steps of: inputting a test start signal to said self testing circuit so as to initiate operation of said self testing circuit; detecting a two-dimensional distribution of light emitted from a plurality of said light emitting devices with an optical system, said light being emitted based on said test results from said self testing circuit; and obtaining a two-dimensional map of said test results by an image processing technique, based on said two-dimensional distribution of said light.
Claim 4
Independent Claim
154 words
A method of testing a plurality of semiconductor integrated circuits formed on a substrate, each of said plurality of semiconductor integrated circuits comprising a main circuit, a self testing circuit for testing at least one part of functions of said main circuit, and a test result output circuit having at least one light emitting device for outputting test results from said self testing circuit in the form of light in a two-dimensional distribution, said method comprising the steps of: inputting a test start signal to said self testing circuit so as to initiate operation of said self testing circuit; detecting a two-dimensional distribution of light emitted from a plurality of said light emitting devices with an optical system, said light being emitted based on said test results from said self testing circuit; and obtaining a two-dimensional map of said test results by an image processing technique, based on said two-dimensional distribution of said light.
Claim 5
Dependent Claim
12 words
The method of claim 1, wherein said optical system includes a photomultiplier.
Claim 6
Dependent Claim
43 words
The method of claim 2, wherein said optical system includes a photomultiplier that produces electric signals representative of a two-dimensional image of said two-dimensional distribution of said light, and a two-dimensional map of said test results is obtained based on said electric signals.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-10-10 | 1998-04-11 | 1998-10-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-10-10 | 2002-04-11 | 2002-10-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-10-10 | 2006-04-11 | 2006-10-11 | $7700.00 | Window Closed / Lapsed |