US5130645A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Integrated circuit built-in self-test structure
Assignee: Philips Semiconductors Inc
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Filing: 1990-08-13
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Granted: 1992-07-14
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Expires: 2010-08-13
Abstract
Abstract A built-in, self-test structure for the circuit components of an integrated circuit chip is isolated from the chip circuitry and the operating power supply and power supply interconnections of the chip, so that it appears as an open circuit during normal operation of the chip. The self-test structure includes separate power supply leads for connection to a separate test power supply which is employed to both enable and operate the circuit in the test mode. The test input are multiplexed on the test power supply leads while test power is applied thereto. Whenever the test power is removed, the test circuit automatically powers down and disconnects, essentially becoming invisible to the normal operation of the circuit. If short circuits or circuit opens should occur in the test structures, the reliability of the operation of the integrated circuit device itself is unaffected, since the test circuit structures are isolated from the operating circuit components of the integrated circuit chip.
Inventors
- 👤 Paul S. Levy
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 14:51
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/3185; G01R31/318533; G01R31/318575
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
177 words
A built-in, self-test structure for an integrated circuit chip having a plurality of circuit components thereon, said chip having an operating power supply and operating data and control circuit interconnections for the circuit components thereon, said self-test structure including in combination: test power supply circuit means on said chip and interconnected with circuit components of said chip, said test power supply circuit means being separate from, and independent of, the operating power supply and the operating power supply circuit interconnections for the circuit components of said integrated circuit chip; and test point connection means on at least some of the circuit components of said integrated circuit chip and coupled to said test power supply circuit means for enabling such circuit components for circuit test operation of said integrated circuit chip when power is supplied thereto from said test power supply circuit means instead of from said operating power supply, wherein said test power supply circuit means is electrically isolated from the circuit components of said integrated circuit chip in the absence of the application of power thereto.
Claim 2
Dependent Claim
177 words
A built-in, self-test structure for an integrated circuit chip having a plurality of circuit components thereon, said chip having an operating power supply and operating data and control circuit interconnections for the circuit components thereon, said self-test structure including in combination: test power supply circuit means on said chip and interconnected with circuit components of said chip, said test power supply circuit means being separate from, and independent of, the operating power supply and the operating power supply circuit interconnections for the circuit components of said integrated circuit chip; and test point connection means on at least some of the circuit components of said integrated circuit chip and coupled to said test power supply circuit means for enabling such circuit components for circuit test operation of said integrated circuit chip when power is supplied thereto from said test power supply circuit means instead of from said operating power supply, wherein said test power supply circuit means is electrically isolated from the circuit components of said integrated circuit chip in the absence of the application of power thereto.
Claim 3
Dependent Claim
48 words
The combination according to claim 1 wherein said test power supply circuit means comprises separate test power supply leads isolated from the operating power supply and operating circuit interconnections; and said test power supply leads are open circuited in the absence of the application of test power thereto.
Claim 4
Dependent Claim
37 words
The combination according to claim 2 wherein said test power supply circuit means simultaneously enable and operate the components of said integrated circuit in a test mode by multiplexing test input, and said test power supply together.
Claim 5
Dependent Claim
32 words
The combination according to claim 3 further including means for multiplexing test input signals and test operating power on said test power supply circuit means when test operating power is applied thereto.
Claim 6
Dependent Claim
37 words
The combination according to claim 1 wherein said test power supply circuit means simultaneously enable and operate the components of said integrated circuit in a test mode by multiplexing test input, and said test power supply together.
Claim 7
Dependent Claim
34 words
The combination according to claim 1 further including means for multiplexing test input and output signals and test operating power on said test power supply circuit means when test operating power is applied thereto.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-07-14 | 1996-01-13 | 1996-07-14 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-07-14 | 2000-01-13 | 2000-07-14 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-07-14 | 2004-01-13 | 2004-07-14 | $7700.00 | Window Closed / Lapsed |