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US5331590A Expired / Lapsed US ⏱️ 0.0 years remaining

Single poly EE cell with separate read/write paths and reduced product term coupling

Assignee: Lattice Semiconductor Corp
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Filing: 1991-10-15
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Granted: 1994-07-19
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Expires: 2011-10-15
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Abstract

Abstract A single poly EE cell and an array using said cell, with the array being provided electrical connections such that the select gate for the read select transistor and the select gate for the write select transistor may be separately controlled. In the array, first level metal is utilized for connection to the gates of the read and write select transistors and second level metal is utilized for connection to the product term connections of the cell.

Inventors

  • 👤 Gregg R. Josephson
  • 👤 Douglas H. Bower
  • 👤 David L. Tennant

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 17:56
CPC Classifications
G; G11; G11C; G11C16/00; G11C16/02; G11C16/04; G11C16/0408; G11C16/0441; H; H10; H10B; H10B41/00; H10B41/30; H10B41/35; H10B69/00; G11C2216/00; G11C2216/02; G11C2216/10

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 333 words
An electrically erasable and programmable semiconductor memory array in a body of semiconductor material, said array comprising: a plurality of semiconductor memory cells fabricated with a single layer of polycrystalline silicon arranged in rows and columns along a surface of said body, each of said memory cells comprising an electrically programmable and erasable transistor, a read select transistor coupled to said programmable transistor, said read select transistor including a read select gate for controlling the conduction of said read select transistor, a write select transistor coupled to said programmable transistor, said write select transistor including a write select gate for controlling the conduction of said write select transistor; a plurality of first electrically conductive members, each associated with a respective single row of said rows of memory cells and connected to the read select gates of the memory cells in its respective single row; and a plurality of second electrically conductive members, each associated with a respective single row of said rows of memory cells and connected to the write select gates of the memory cells in its respective single row, whereby a first electrical potential is applied to the read select gates of each of said rows of memory cells independently of a second electrical potential applied to the write select gates of each of said rows of memory cells wherein said body of semiconductor material is of a first conductivity type, said read select transistors and write select transistors are defined by regions of a second conductivity type extending into said body from said surface, said array further comprising third electrically conductive members, each having a first level portion for providing electrical connection to said regions of semiconductor material of second conductivity type and a second level portion connected to said first level portion, said second level portion extending substantially parallel to said surface, wherein said first and second electrically conductive members are spaced intermediate said surface of said body and said second level portion of said third electrically conductive members.
Claim 2
Dependent Claim 333 words
An electrically erasable and programmable semiconductor memory array in a body of semiconductor material, said array comprising: a plurality of semiconductor memory cells fabricated with a single layer of polycrystalline silicon arranged in rows and columns along a surface of said body, each of said memory cells comprising an electrically programmable and erasable transistor, a read select transistor coupled to said programmable transistor, said read select transistor including a read select gate for controlling the conduction of said read select transistor, a write select transistor coupled to said programmable transistor, said write select transistor including a write select gate for controlling the conduction of said write select transistor; a plurality of first electrically conductive members, each associated with a respective single row of said rows of memory cells and connected to the read select gates of the memory cells in its respective single row; and a plurality of second electrically conductive members, each associated with a respective single row of said rows of memory cells and connected to the write select gates of the memory cells in its respective single row, whereby a first electrical potential is applied to the read select gates of each of said rows of memory cells independently of a second electrical potential applied to the write select gates of each of said rows of memory cells wherein said body of semiconductor material is of a first conductivity type, said read select transistors and write select transistors are defined by regions of a second conductivity type extending into said body from said surface, said array further comprising third electrically conductive members, each having a first level portion for providing electrical connection to said regions of semiconductor material of second conductivity type and a second level portion connected to said first level portion, said second level portion extending substantially parallel to said surface, wherein said first and second electrically conductive members are spaced intermediate said surface of said body and said second level portion of said third electrically conductive members.
Claim 3
Dependent Claim 19 words
The array according to claim 1, wherein said first and second electrically conductive members are comprised of metallic conductors.
Claim 4
Dependent Claim 21 words
The array according to claim 2, wherein said read select gates and said write select gates are comprised of polycrystalline silicon.
Claim 5
Dependent Claim 116 words
The array according to claim 1, wherein said electrically programmable and erasable transistor is comprised of: first and second semiconductor regions of a second conductivity type extending into said body from said surface, said first and second regions having edges positioned in spaced apart relationship defining a channel therebetween which extends to said surface; a third region of said second conductivity type extending into said body from said surface, said third region being spaced apart from said first region, said second region, and said channel; and a floating gate positioned above and insulated from said surface, said floating gate having a first portion extending above said channel and a second portion extending above said third region.

References Cited (Backward Citations)

US4663740A Cited
US4695979A Cited
US4870615A Cited
US4912534A Cited
US4935648A Cited
US4982377A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-07-18 1998-01-17 1998-07-19 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-07-18 2002-01-17 2002-07-19 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-07-18 2006-01-17 2006-07-19 $7700.00 Window Closed / Lapsed

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