US5328864A
Expired / Lapsed
US
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Method of doping gate electrodes discretely with either P-type or N-type impurities to form discrete semiconductor regions
Assignee: Hitachi Ltd
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Filing: 1991-05-13
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Granted: 1994-07-12
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Expires: 2011-05-13
Abstract
Abstract The present invention relates to a method of manufacturing a semiconductor device. In a semiconductor substrate formed with a first semiconductor region of P-type and a second semiconductor region of N-type and an insulating film formed between and extending into the first and the second semiconductor regions, gate electrodes of a laminate of a polysilicon layer and a silicide layer are formed on the insulating film covering the first and the second semiconductor regions. A gate electrode situated on the first semiconductor region has an end portion facing and spaced from an end portion of a gate electrode situated on the second semiconductor region. A masking layer is formed on the second semiconductor region with an edge of the masking layer falling between the two gate electrodes where the two end portions face each other. The first semiconductor region is doped with an impurity of N-type, thereby forming a third semiconductor region in the first semiconductor region. The masking layer is removed from the second semiconductor region and a masking layer is formed on the first semiconductor region with an edge of the masking layer falling between the two gate electrodes where the two end portions face each other. The second semiconductor region is doped with an impurity of P-type, thereby forming a fourth semiconductor region in the second semiconductor region. By providing a masking layer to fall between the end portions of the gate electrodes, the gate electrodes are discretely doped to form discrete semiconductor regions.
Inventors
- 👤 Keiichi Yoshizumi
- 👤 Satoshi Kudo
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 22:03
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/01; H10D84/0123; H10D84/0126; H10D84/0165; H10D64/00; H10D64/01; H10D64/013; H10D64/01302; H10D64/01304; H10D84/0172; H10D84/0177; H10D84/02; H10D84/03; H10D84/038; H10D84/80; H10D84/82; H10D84/83; H10D84/85; H10P; H10P14/00; H10P14/40; H10P14/412; H10P14/416; H10P76/00; H10P76/40; H10P76/408; H10P76/4085; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/071; H10W20/081; H10W20/089; Y; Y10; Y10S; Y10S148/00; Y10S148/106
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
345 words
A method of manufacturing a semiconductor device on a semiconductor substrate having a first insulating film on a first semiconductor region of P-type and a second semiconductor region of N-type formed on said semiconductor substrate, comprising the steps of: (a) forming a first conductor layer comprising a laminate film including a polysilicon layer and a silicide layer thereon, said first conductive layer extending continuously from said first semiconductor region to said first insulating film, said first conductive layer having first end portion on said first insulating film; (b) forming a second conductive layer comprising a laminate film including a polysilicon layer and a silicide layer thereon, said second conductive layer extending continuously from said second semiconductor region to said first insulating film, said second conductive layer having a first end portion on said first insulating film, wherein said first end portion of said second conductive layer is adjacent to and opposing said first end portion of said first conductive layer; (c) forming a first mask layer over at least a part of said second semiconductor region, with an end portion thereof formed between said first end portion of said first conductive layer and said first end portion of said second conductive layer, said end portion of said first mask layer being formed over said first insulating film; (d) introducing first impurities of the N-type into said first semiconductor region which is not covered with said first mask layer, thereby to form third semiconductor regions as in self-alignment manner with said first conductive layer; (e) forming a second mask layer over at least a portion of said first semiconductor region, with an end portion thereof formed between said first end portion of said first conductive layer and said first end portion of said second conductive layer, said end portion of said second mask layer being formed over said first insulating film; and (f) introducing second impurities of P-type into said second semiconductor region which is not covered with said second mask layer, thereby to form fourth semiconductor regions in self-alignment manner with said second conductive layer.
Claim 2
Independent Claim
345 words
A method of manufacturing a semiconductor device on a semiconductor substrate having a first insulating film on a first semiconductor region of P-type and a second semiconductor region of N-type formed on said semiconductor substrate, comprising the steps of: (a) forming a first conductor layer comprising a laminate film including a polysilicon layer and a silicide layer thereon, said first conductive layer extending continuously from said first semiconductor region to said first insulating film, said first conductive layer having first end portion on said first insulating film; (b) forming a second conductive layer comprising a laminate film including a polysilicon layer and a silicide layer thereon, said second conductive layer extending continuously from said second semiconductor region to said first insulating film, said second conductive layer having a first end portion on said first insulating film, wherein said first end portion of said second conductive layer is adjacent to and opposing said first end portion of said first conductive layer; (c) forming a first mask layer over at least a part of said second semiconductor region, with an end portion thereof formed between said first end portion of said first conductive layer and said first end portion of said second conductive layer, said end portion of said first mask layer being formed over said first insulating film; (d) introducing first impurities of the N-type into said first semiconductor region which is not covered with said first mask layer, thereby to form third semiconductor regions as in self-alignment manner with said first conductive layer; (e) forming a second mask layer over at least a portion of said first semiconductor region, with an end portion thereof formed between said first end portion of said first conductive layer and said first end portion of said second conductive layer, said end portion of said second mask layer being formed over said first insulating film; and (f) introducing second impurities of P-type into said second semiconductor region which is not covered with said second mask layer, thereby to form fourth semiconductor regions in self-alignment manner with said second conductive layer.
Claim 3
Dependent Claim
57 words
A method of manufacturing a semiconductor device according to claim 1, further comprising the steps of: forming a second insulating film over at least said first and second conductor layers and then providing first and second holes over said first insulating film and through said second insulating film to expose said first and second conductive layers respectively.
Claim 4
Dependent Claim
40 words
A method of manufacturing a semiconductor device according to claim 2, wherein the step of providing holes further comprises the step of providing third and fourth holes through said second insulating film to expose third and fourth semiconductor regions respectively.
Claim 5
Dependent Claim
80 words
A method of manufacturing a semiconductor device according to claim 3, further comprising the steps of: forming a third mask layer over said second insulating film, said third mask covering said second and fourth holes; introducing impurity of N-type to the exposed areas of said first and third holes, which are not covered with said third mask layer; and annealing said semiconductor substrate to form fifth semiconductor regions in said exposed areas where said N-type impurity has been further introduced.
Claim 6
Dependent Claim
32 words
A method of manufacturing a semiconductor device according to claim 2, further comprising the step of forming a third conductive layer over said second insulating film and said first and second holes.
Claim 7
Dependent Claim
27 words
A method of manufacturing a semiconductor device according to claim 5, wherein said second mask layer has a pattern inverted to that of said first mask layer.
Claim 8
Dependent Claim
18 words
A method of manufacturing a semiconductor device according to claim 5, wherein said third conductive layer comprises aluminum.
References Cited (Backward Citations)
US4740479A
Cited
US5032537A
Cited
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