US5318925A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of manufacturing a self-aligned interlayer contact in a semiconductor device
Assignee: SK Hynix Inc
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Filing: 1993-07-02
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Granted: 1994-06-07
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Expires: 2013-07-02
Abstract
Abstract Described is a method of manufacturing a self-aligned interlayer contact in a semiconductor device. To carry out the etching process of the conducting material easily and to minimize the space occupied by the contact, the invention uses the following steps: a field oxide layer and a source/drain electrode are formed on a semiconductor substrate; then, a first interlayer insulating layer is formed over the substrate and, over it, a bit line is formed; then, a second interlayer insulating layer and a charge storage electrode contact mask are formed over the entire structure; then, the insulating layer on upper part of the bit line that had been exposed by the charge storage electrode contact mask is completely etched, and, for other parts, an insulating layer having a certain thickness is left on the upper part of the source/drain electrode; then, a charge storage electrode contact is formed on the source electrode and the side wall of the bit line is exposed on the side wall of the charge storage electrode contact; finally, an insulating layer for spacers is formed on the side wall of the bit line to expose the source/drain electrode in order to form a charge storage electrode.
Inventors
- 👤 Jae K. Kim
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 18:21
CPC Classifications
H; H10; H10B; H10B12/00; H10B12/01; H10B12/02; H10B12/03; H10B12/033; H10B12/0335; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/069; H10B12/30; H10B12/48; H10B12/482; H10W20/056; H10W20/071; H10W20/074; H10W20/076; H10W20/081
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
210 words
A method of manufacturing a self-aligned interlayer contact in a semiconductor device, comprising the steps of: forming a field oxide layer and a source/drain electrode on a semiconductor substrate; forming a first interlayer insulating layer on the substrate; forming a bit line on the first interlayer insulating layer; forming and flattening a second interlayer insulating layer on the bit line; forming a charge storage electrode contact mask on the second interlayer insulating layer; etching said second interlayer insulating layer using the charge storage electrode contact mask to expose a portion of the bit line and leaving at least a portion of said second interlayer insulating layer on the upper part of the source/drain electrode; etching the exposed portion of the bit line completely; etching the remaining second interlayer insulating layer and the first interlayer insulating layer to expose the source/drain electrode; forming an insulating layer spacer on a side wall of the exposed bit line; forming a conducting material for a charge storage electrode on the substrate, especially on the exposed source/drain electrode; forming a charge storage electrode mask on said conducting material for a charge storage electrode; and forming a charge storage electrode by etching said conducting material for the charge storage electrode using the charge storage electrode mask.
Claim 2
Independent Claim
210 words
A method of manufacturing a self-aligned interlayer contact in a semiconductor device, comprising the steps of: forming a field oxide layer and a source/drain electrode on a semiconductor substrate; forming a first interlayer insulating layer on the substrate; forming a bit line on the first interlayer insulating layer; forming and flattening a second interlayer insulating layer on the bit line; forming a charge storage electrode contact mask on the second interlayer insulating layer; etching said second interlayer insulating layer using the charge storage electrode contact mask to expose a portion of the bit line and leaving at least a portion of said second interlayer insulating layer on the upper part of the source/drain electrode; etching the exposed portion of the bit line completely; etching the remaining second interlayer insulating layer and the first interlayer insulating layer to expose the source/drain electrode; forming an insulating layer spacer on a side wall of the exposed bit line; forming a conducting material for a charge storage electrode on the substrate, especially on the exposed source/drain electrode; forming a charge storage electrode mask on said conducting material for a charge storage electrode; and forming a charge storage electrode by etching said conducting material for the charge storage electrode using the charge storage electrode mask.
Claim 3
Dependent Claim
16 words
The method according to claim 1 wherein said second interlayer insulating layer has a flattened structure.
Claim 4
Dependent Claim
14 words
The method according to claim 1 wherein said second interlayer insulating layer comprises BPSG.
Claim 5
Dependent Claim
20 words
The method according to claim 1 wherein said second interlayer insulating layer comprises a double structure having USG and BPSG.
Claim 6
Independent Claim
219 words
A method of manufacturing a self-aligned interlayer contact in a semiconductor device, comprising the steps of: forming a field oxide layer and a first conducting line on a semiconductor substrate; forming a first interlayer insulating layer on the substrate; forming a second conducting line on the first interlayer insulating layer; forming and flattening a second interlayer insulating layer on the second conducting line; forming a third conducting line contact mask on the second interlayer insulating layer; etching said second interlayer insulating layer using the third conducting line contact mask to expose a portion of the second conducting line and leaving at least a portion of said second interlayer insulating layer on the upper part of the first conducting line; etching the exposed portion of the second conducting line completely; etching the remaining second interlayer insulating layer and the first interlayer insulating layer to expose the first conducting line; forming an insulating layer spacer on a side wall of the exposed second conducting line; forming a conducting material for a third conducting line on the substrate, especially on the exposed first conducting line electrode; forming a third conducting line mask on said conducting material for a third conducting line; and forming a third conducting line by etching said conducting material for third conducting line using the third conducting line mask.
Claim 7
Independent Claim
219 words
A method of manufacturing a self-aligned interlayer contact in a semiconductor device, comprising the steps of: forming a field oxide layer and a first conducting line on a semiconductor substrate; forming a first interlayer insulating layer on the substrate; forming a second conducting line on the first interlayer insulating layer; forming and flattening a second interlayer insulating layer on the second conducting line; forming a third conducting line contact mask on the second interlayer insulating layer; etching said second interlayer insulating layer using the third conducting line contact mask to expose a portion of the second conducting line and leaving at least a portion of said second interlayer insulating layer on the upper part of the first conducting line; etching the exposed portion of the second conducting line completely; etching the remaining second interlayer insulating layer and the first interlayer insulating layer to expose the first conducting line; forming an insulating layer spacer on a side wall of the exposed second conducting line; forming a conducting material for a third conducting line on the substrate, especially on the exposed first conducting line electrode; forming a third conducting line mask on said conducting material for a third conducting line; and forming a third conducting line by etching said conducting material for third conducting line using the third conducting line mask.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-06-06 | 1997-12-06 | 1998-06-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-06-06 | 2001-12-06 | 2002-06-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-06-06 | 2005-12-06 | 2006-06-07 | $7700.00 | Window Closed / Lapsed |