Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
195 words
A method for fabricating ink fill slots in thermal ink-jet printheads, comprising: (a) providing a silicon substrate having a <100> or <110> crystallographic orientation and two opposed, substantially parallel major surfaces, defining a primary surface and a secondary surface; (b) forming a passivating dielectric layer on both said major surfaces; (c) exposing a portion of said secondary surface of said silicon substrate underlying said dielectric layer; (d) anisotropically etching said exposed portion through said substrate to expose a portion of said dielectric layer on said primary surface to form said ink fill slot; (e) forming and defining thin film resistor elements and conductive traces on said dielectric layer formed on said primary surface; (f) removing said exposed portion of said dielectric layer on said primary surface overlying said ink fill slot; and (g) forming a layer on the major surface of said dielectric material and defining openings therein to expose said resistor elements to define a drop ejection chamber and to provide an ink feed channel from said resistor elements to a terminus region, said terminus region fluidically communicating with said ink fill slot for introducing ink from a reservoir to said drop ejection chamber.
Claim 2
Independent Claim
195 words
A method for fabricating ink fill slots in thermal ink-jet printheads, comprising: (a) providing a silicon substrate having a <100> or <110> crystallographic orientation and two opposed, substantially parallel major surfaces, defining a primary surface and a secondary surface; (b) forming a passivating dielectric layer on both said major surfaces; (c) exposing a portion of said secondary surface of said silicon substrate underlying said dielectric layer; (d) anisotropically etching said exposed portion through said substrate to expose a portion of said dielectric layer on said primary surface to form said ink fill slot; (e) forming and defining thin film resistor elements and conductive traces on said dielectric layer formed on said primary surface; (f) removing said exposed portion of said dielectric layer on said primary surface overlying said ink fill slot; and (g) forming a layer on the major surface of said dielectric material and defining openings therein to expose said resistor elements to define a drop ejection chamber and to provide an ink feed channel from said resistor elements to a terminus region, said terminus region fluidically communicating with said ink fill slot for introducing ink from a reservoir to said drop ejection chamber.
Claim 3
Dependent Claim
28 words
The method of claim 1 further comprising providing a nozzle plate with nozzle openings, each nozzle opening operatively associated with a resistor element to define a firing element.
Claim 4
Dependent Claim
42 words
The method of claim 2 wherein said terminus region is provided with a pair of opposed projections formed in walls in said layer defining said ink feed channel and separated by a width to cause a constriction in said ink feed channel.
Claim 5
Dependent Claim
30 words
The method of claim 3 wherein each firing element is provided with lead-in lobes disposed between said projections and separating one ink feed channel from a neighboring ink feed channel.
Claim 6
Dependent Claim
15 words
The method of claim 4 wherein said ink fill slot extends to said lead-in lobes.
Claim 7
Dependent Claim
29 words
The method of claim 5 wherein said extended portion of said ink fill slot terminates at a substantially constant distance from the entrance to each said ink feed channel.
Claim 8
Dependent Claim
27 words
The method of claim 1 wherein said exposed portion of said dielectric layer on said primary surface overlying said ink fill slot is removed by chemical etching.
Claim 9
Dependent Claim
41 words
The method of claim 7 wherein a photoresist layer is deposited on said thin film resistor elements and said conductive traces and said exposed portion of said dielectric layer is removed by chemical etching through said openings in said silicon substrate.
Claim 10
Dependent Claim
56 words
The method of claim 7 wherein a photoresist layer is deposited on said thin film resistor resistors and said conductive traces, said photoresist layer is patterned and developed to form openings which uncover said exposed portion of said dielectric layer, and said exposed portion is removed by chemical etching through said openings in said photoresist layer.
Claim 11
Dependent Claim
25 words
The method of claim 1 wherein after forming and defining said thin film resistor elements and conductive traces, a passivating dielectric layer is formed thereover.