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Patent US5300915A successfully refreshed from Google Patents.
US5300915A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Thermal sensor
Assignee: Honeywell Inc
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Filing: 1986-07-16
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Granted: 1994-04-05
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Expires: 2006-07-16
Abstract
Abstract A two-level IR detector imaging array of high fill-factor design. The upper microbridge detector level is spaced above and overlies the integrated circuit and bus lines on the substrate surface below.
Inventors
- 👤 Robert E. Higashi
- 👤 James O. Holmen
- 👤 Robert G. Johnson
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 08:31
CPC Classifications
G; G01; G01J; G01J5/00; G01J5/10; G01J5/20; H; H10; H10N; H10N19/00; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49082; Y10T29/49085
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
130 words
A two-level microbridge bolometer imaging array comprising: an array of bolometer pixels on a semiconductor substrate, each one of said pixels having a lower section on the surface of the substrate and a microbridge upper detector plane spaced from and immediately above the lower section; said lower section including a semiconductor diode, x and y bus lines and x and y pads; said microbridge upper detector plane comprising a bridging dielectric layer having embedded throughout a temperature responsive resistive element having first and second terminals, said microbridge upper detector plane being supported above the lower section by dielectric leg portions which are downward extending continuation of the bridging dielectric layer; said first and second terminals being continued down said leg portions to said diode and one of said bus lines.
Claim 2
Dependent Claim
130 words
A two-level microbridge bolometer imaging array comprising: an array of bolometer pixels on a semiconductor substrate, each one of said pixels having a lower section on the surface of the substrate and a microbridge upper detector plane spaced from and immediately above the lower section; said lower section including a semiconductor diode, x and y bus lines and x and y pads; said microbridge upper detector plane comprising a bridging dielectric layer having embedded throughout a temperature responsive resistive element having first and second terminals, said microbridge upper detector plane being supported above the lower section by dielectric leg portions which are downward extending continuation of the bridging dielectric layer; said first and second terminals being continued down said leg portions to said diode and one of said bus lines.
Claim 3
Dependent Claim
15 words
The imaging array according to claim 1 wherein said dielectric layer is of silicon nitride.
Claim 4
Dependent Claim
33 words
The imaging array according to claim 2 wherein said silicon nitride layer comprises a first layer beneath said temperature responsive resistive element and a second layer over said first layer and said element.
Claim 5
Dependent Claim
18 words
The imaging array according to claim 1 wherein said temperature responsive resistive element is of a nickel-iron alloy.
Claim 6
Dependent Claim
22 words
The imaging array according to claim 1 wherein the microbridge upper detector plane is raised about 3 microns above the lower section.
Claim 7
Independent Claim
307 words
The method of fabricating a two-level microbridge bolometer imaging array comprising the steps of: forming on a silicon substrate a lower level of diodes and other components, column and row bus conductors, and x and y contact pads covered by a first dielectric; opening contact areas through the first dielectric to one of said bus conductors and to one of said diodes contact areas in each pixel of the array, and to said x and y contact pads at the ends of the bus lines; coating said first dielectric with a layer of glass; cutting narrow valleys through the glass along the array column conductors and removing the glass from outside the area of the array, and sloping the edges of the remaining glass ridges to accept further coating; coating the glass ridges and edges with a first thin film layer of silicon nitride; opening contact areas through the first layer of silicon nitride to one of said bus conductors, and one of said diodes in each pixel of the array, and to the x and y pads; patterning on the first layer of silicon nitride on each pixel and between the bus line contact area and the diode contact area on each pixel, a separation path of resistive metal which has a substantial temperature coefficient of resistance; adding a second layer of silicon nitride over the first and over the resistive metal path to passify it, said silicon nitride layers forming an elevated plane; cutting a narrow slit through the silicon nitride to the glass between adjoining pixels, and cutting additional narrow slits in each pixel area to provide further access to the glass, and cutting the nitride from the x and y pad areas; and dissolving the glass beneath the silicon nitride layers to leave a cavity between the lower level and the elevated plane.
Claim 8
Independent Claim
307 words
The method of fabricating a two-level microbridge bolometer imaging array comprising the steps of: forming on a silicon substrate a lower level of diodes and other components, column and row bus conductors, and x and y contact pads covered by a first dielectric; opening contact areas through the first dielectric to one of said bus conductors and to one of said diodes contact areas in each pixel of the array, and to said x and y contact pads at the ends of the bus lines; coating said first dielectric with a layer of glass; cutting narrow valleys through the glass along the array column conductors and removing the glass from outside the area of the array, and sloping the edges of the remaining glass ridges to accept further coating; coating the glass ridges and edges with a first thin film layer of silicon nitride; opening contact areas through the first layer of silicon nitride to one of said bus conductors, and one of said diodes in each pixel of the array, and to the x and y pads; patterning on the first layer of silicon nitride on each pixel and between the bus line contact area and the diode contact area on each pixel, a separation path of resistive metal which has a substantial temperature coefficient of resistance; adding a second layer of silicon nitride over the first and over the resistive metal path to passify it, said silicon nitride layers forming an elevated plane; cutting a narrow slit through the silicon nitride to the glass between adjoining pixels, and cutting additional narrow slits in each pixel area to provide further access to the glass, and cutting the nitride from the x and y pad areas; and dissolving the glass beneath the silicon nitride layers to leave a cavity between the lower level and the elevated plane.
Claim 9
Dependent Claim
14 words
The method according to claim 6 wherein said first dielectric is of silicon nitride.
Claim 10
Dependent Claim
15 words
The method according to claim 6 wherein the resistive metal is an alloy of nickel-iron.
Claim 11
Dependent Claim
17 words
The method according to claim 6 wherein the layer thickness of the glass is about three microns.
Claim 12
Dependent Claim
14 words
The method according to claim 6 wherein the cavity is about three microns high.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-04-04 | 1997-10-04 | 1998-04-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-04-04 | 2001-10-04 | 2002-04-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-04-04 | 2005-10-04 | 2006-04-05 | $7700.00 | Window Closed / Lapsed |